Reflective Surface Mount Optical Encoder Reliability Data Sheet

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Reflective Surface Mount Optical Encoder Reliability Data Sheet

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Reflective Surface Mount Optical Encoder
Reliability Data Sheet
following cumulative test results have been obtained from testing performed Avago Technologies Malaysia accordance with latest revisions JEDEC Standard. Avago tests parts absolute maximum rated conditions recommended device. actual performance obtain from Avago parts depends electrical environmental characteristics your application will probably better than performance outlined Table
Failure Rate Prediction
failure rate semiconductor devices determined junction temperature device. relationship between ambient given following: TJ(°C) TA(°C) qJAPAVG Where, ambient temperature thermal resistance junction-to-ambient Watt PAVG average power dissipated Watt estimated MTTF failure rate temperatures lower than actual stress temperature determined using Arrhenius model temperature acceleration. Results such calculations shown table below using activation energy 0.43eV (reference MIL-HDBK-217).
Table Life Tests Demonstrated Performance
Point Typical Performance Test Name High Temperature Operating Life Stress Test Conditions VCC=3.0V, TA=85°C, 1500hours Total Device Hours 45,000 Units Tested Total Failed MTTF 49,180 Failure Rate Hours) 2.03
Table
Ambient Temperature (°C) Junction Temperature (°C) 89.7 79.7 69.7 59.7 49.7 39.7 29.7 Point Typical Performance Time MTTF 49,180 72,640 109,800 170,000 270,700 443,800 751,900 Failure Rate Hours) 2.03 1.38 0.91 0.59 0.37 0.23 0.13 Performance Time (90% Confidence) MTTF 19,520 28,840 43,580 67,500 107,400 176,200 298,500 Failure Rate Hours) 5.12 3.47 2.29 1.48 0.93 0.57 0.34
Notes: point typical MTTF (which represents confidence level) total device hours divided number failures. case zero failures, failure assumed this calculation. Confidence MTTF represents minimum level reliability performance which expected from samples. This confidence interval based statistics distribution failures. assumed distribution failures exponential. This particular distribution commonly used describing useful life failures. Failures catastrophic parametric. Catastrophic failures open, short, logic output, dynamic parameters while parametric failures failures meet electrical characteristic specified product catalog such output voltage, duty state errors.
Example Failure Rate Calculation
Assume device operating hours/day, days/week. utilization factor, given hours/week hours/day) days/week) (168 hours/week) 0.25 point failure rate year (8760 hours) 55°C ambient temperature (0.59% hours) 0.25 (8760 hours/year) 1.29% year Similarly, confidence level failure rate year 55°C: (1.48% hours) 0.25 (8760 hours/year) 3.24% year
Table Environmental Tests
Test Name Temperature Cycle High Temperature Storage life Test Conditions -40°C 85°C, 15min dwell time, transfer, 1000 cycles TA=85°C, RH=85%, 1000 hours Units Tested Units Failed
Table Electrical Tests
Test Name ESD- Human Body Model ESD- Machine Model Reference HBM-JESD22-A114D MM-JESD22-A115-A Test Conditions applied pins versus ground 300V applied pins versus ground Units Tested Units Failed
Table Mechanical Vibration shock
Test Name Mechanical Shock Vibration Shock Test Conditions 15,20,30g 11ms, successive shocks each direction perpendicular axes units 15,25,30g 20-2kHz, cycles level. Units Tested Units Failed Pass Pass
product information complete list distributors, please site:
www.avagotech.com
Avago, Avago Technologies, logo trademarks Avago Technologies, Limited United States other countries. Data subject change. Copyright 2007 Avago Technologies Limited. rights reserved. AV02-0370EN April 2007

Reflective Surface Mount Optical Encoder Reliability Data Sheet

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