SCES559B MARCH 2004 REVISED OCTOBER 2007 FEATURES Qualified

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SCES559B MARCH 2004 REVISED OCTOBER 2007 FEATURES Qualified

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SN74LVC2G125-Q1 DUAL BUFFER GATE WITH 3-STATE OUTPUTS
SCES559B MARCH 2004 REVISED OCTOBER 2007
FEATURES
Qualified Automotive Applications Supports Operation Inputs Accept Voltages Power Consumption, 10-A ±24-mA Output Drive Typical VOLP (Output Ground Bounce) <0.8 25°C Typical VOHV (Output Undershoot) 25°C Ioff Supports Partial-Power-Down Mode Operation Latch-Up Performance Exceeds JESD Class Protection Exceeds JESD 2000-V Human-Body Model (A114-A) 200-V Machine Model (A115-A) 1000-V Charged-Device Model (C101)
PACKAGE (TOP VIEW)
DESCRIPTION/ORDERING INFORMATION
SN74LVC2G125-Q1 dual buffer gate designed 1.65-V 5.5-V operation. This device features dual line drivers with 3-state outputs. outputs disabled when associated output-enable (OE) input high. ensure high-impedance state during power power down, should tied through pullup resistor; minimum value resistor determined current-sinking capability driver. This device fully specified partial-power-down applications using Ioff. Ioff circuitry disables outputs, preventing damaging current backflow through device when powered down. ORDERING INFORMATION
-40°C 85°C SSOP VSSOP PACKAGE Tape reel Tape reel ORDERABLE PART NUMBER CLVC2G125IDCTRQ1 CLVC2G125IDCURQ(4)
TOP-SIDE MARKING C25_ C25_
most current package ordering information, Package Option Addendum this document, site www.ti.com. Package drawings, thermal data, symbolization available www.ti.com/packaging. DCT: actual top-side marking three additional characters that designate year, month, assembly/test site. DCU: actual top-side marking additional character that designates assembly/test site. Product preview
FUNCTION TABLE (EACH BUFFER)
INPUTS OUTPUT
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
Copyright 2004-2007, Texas Instruments Incorporated
SN74LVC2G125-Q1 DUAL BUFFER GATE WITH 3-STATE OUTPUTS
SCES559B MARCH 2004 REVISED OCTOBER 2007
LOGIC DIAGRAM (POSITIVE LOGIC)
Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
Supply voltage range Input voltage range Voltage range applied output high-impedance power-off state Voltage range applied output high state Input clamp current Output clamp current Continuous output current Continuous current through Tstg Package thermal impedance Storage temperature range package package -0.5 -0.5 -0.5 -0.5 ±100 UNIT °C/W
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. input output negative-voltage ratings exceeded input output current ratings observed. value provided recommended operating conditions table. package thermal impedance calculated accordance with JESD 51-7.
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Copyright 2004-2007, Texas Instruments Incorporated
Product Folder Link(s): SN74LVC2G125-Q
SN74LVC2G125-Q1 DUAL BUFFER GATE WITH 3-STATE OUTPUTS
SCES559B MARCH 2004 REVISED OCTOBER 2007
Recommended Operating Conditions
Supply voltage Operating Data retention only 1.65 1.95 High-level input voltage 1.65 1.95 Low-level input voltage Input voltage Output voltage High state 3-state 1.65 High-level output current 1.65 Low-level output current 0.15 Input transition rise fall rate Operating free-air temperature 1.65 0.65 0.35 ns/V UNIT
unused inputs device must held ensure proper device operation. Refer application report, Implications Slow Floating CMOS Inputs, literature number SCBA004.
Copyright 2004-2007, Texas Instruments Incorporated
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Product Folder Link(s): SN74LVC2G125-Q
SN74LVC2G125-Q1 DUAL BUFFER GATE WITH 3-STATE OUTPUTS
SCES559B MARCH 2004 REVISED OCTOBER 2007
Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER -100 Ioff Data inputs Control inputs inputs GND, input typical values 25°C. Other inputs TEST CONDITIONS 1.65 1.65 1.65 1.65 1.65 0.45 0.55 0.55 UNIT
Switching Characteristics
over recommended operating free-air temperature range (unless otherwise noted) (see Figure
PARAMETER tdis FROM (INPUT) (OUTPUT) 0.15 11.6 UNIT
Operating Characteristics
PARAMETER Power dissipation capacitance Outputs enabled Outputs disabled TEST CONDITIONS UNIT
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Copyright 2004-2007, Texas Instruments Incorporated
Product Folder Link(s): SN74LVC2G125-Q
SN74LVC2G125-Q1 DUAL BUFFER GATE WITH 3-STATE OUTPUTS
SCES559B MARCH 2004 REVISED OCTOBER 2007
PARAMETER MEASUREMENT INFORMATION
VLOAD From Output Under Test (see Note Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open VLOAD
LOAD CIRCUIT INPUTS 0.15 tr/tf VCC/2 VCC/2 VCC/2 VLOAD 0.15 0.15 Timing Input Input VOLTAGE WAVEFORMS PULSE DURATION Input tPLH Output tPHL tPHL tPLH Output VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS Output Waveform (see Note Output Control tPZL Output Waveform VLOAD (see Note tPZH VOLTAGE WAVEFORMS SETUP HOLD TIMES tPLZ VLOAD/2 tPHZ Data Input
VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING
NOTES: includes probe capacitance. Waveform output with internal conditions such that output low, except when disabled output control. Waveform output with internal conditions such that output high, except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time, with transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. parameters waveforms applicable devices.
Figure Load Circuit Voltage Waveforms
Copyright 2004-2007, Texas Instruments Incorporated
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Product Folder Link(s): SN74LVC2G125-Q
PACKAGE OPTION ADDENDUM
2-Oct-2007
PACKAGING INFORMATION
Orderable Device CLVC2G125IDCTRQ(1)
Status ACTIVE
Package Type
Package Drawing
Pins Package Plan 3000
Lead/Ball Finish
Peak Temp Level-1-220C-UNLIM
marketing status values defined follows: ACTIVE: Product device recommended designs. LIFEBUY: announced that device will discontinued, lifetime-buy period effect. NRND: recommended designs. Device production support existing customers, does recommend using this part design. PREVIEW: Device been announced production. Samples available. OBSOLETE: discontinued production device.
Plan planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), Green (RoHS Sb/Br) please check latest availability information additional product content details. TBD: Pb-Free/Green conversion plan been defined. Pb-Free (RoHS): TI's terms "Lead-Free" "Pb-Free" mean semiconductor products that compatible with current RoHS requirements substances, including requirement that lead exceed 0.1% weight homogeneous materials. Where designed soldered high temperatures, Pb-Free products suitable specified lead-free processes. Pb-Free (RoHS Exempt): This component RoHS exemption either lead-based flip-chip solder bumps used between package, lead-based adhesive used between leadframe. component otherwise considered Pb-Free (RoHS compatible) defined above. Green (RoHS Sb/Br): defines "Green" mean Pb-Free (RoHS compatible), free Bromine (Br) Antimony (Sb) based flame retardants exceed 0.1% weight homogeneous material)
MSL, Peak Temp. Moisture Sensitivity Level rating according JEDEC industry standard classifications, peak solder temperature. Important Information Disclaimer:The information provided this page represents TI's knowledge belief date that provided. bases knowledge belief information provided third parties, makes representation warranty accuracy such information. Efforts underway better integrate information from third parties. taken continues take reasonable steps provide representative accurate information have conducted destructive testing chemical analysis incoming materials chemicals. suppliers consider certain information proprietary, thus numbers other limited information available release. event shall TI's liability arising such information exceed total purchase price part(s) issue this document sold Customer annual basis.
Addendum-Page
MECHANICAL DATA
MPDS049B 1999 REVISED OCTOBER 2002
(R-PDSO-G8)
0,30 0,15
PLASTIC SMALL-OUTLINE PACKAGE
0,65
0,13
0,15 2,90 2,70 4,25 3,75
INDEX AREA
0,10 0,00 NOTES: linear dimensions millimeters. This drawing subject change without notice. Body dimensions include mold flash protrusion Falls within JEDEC MO-187 variation
3,15 2,75
Gage Plane 0,25 0,60 0,20
1,30
Seating Plane 0,10 4188781/C 09/02
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DALLAS, TEXAS 75265
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SCES559B MARCH 2004 REVISED OCTOBER 2007 FEATURES Qualified

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