S-93C46B/56B/66B S-93C46B/56B/66B high speed, current consumption

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S-93C46B/56B/66B S-93C46B/56B/66B high speed, current consumption

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CMOS SERIAL E2PROM
S-93C46B/56B/66B
S-93C46B/56B/66B high speed, current consumption, 1/2/4 K-bit serial E2PROM with wide operating voltage range. organized 64-word 16bit, 128-word 16-bit, 256-word 16-bit, respectively. Each capable sequential read, which time addresses automatically incremented 16-bit blocks. instruction code compatible with NM93CS46/56/66.
Features
current consumption Wide operating voltage range Standby: Max. (VCC Operating: Max. (VCC Max. (VCC Read: +85°C) Write: +85°C)
Sequential read capable Write disable function when power supply voltage Function protect against write erroneous instruction recognition Endurance: cycles/word*1 +25°C) write capable, cycles/word*1 +85°C) cycles/word*1 +105°C) each address (Word: bits) Data retention: years (after rewriting cycles/word +85°C) S-93C46B: K-bit NM93CS46 instruction code compatible S-93C56B: K-bit NM93CS56 instruction code compatible S-93C66B: K-bit NM93CS66 instruction code compatible High-temperature operation: +105°C Max. supported (Only S-93Cx6BD0H-J8T2G, S-93Cx6BD0H-T8T2G) Lead-free products
Packages
Package name 8-Pin 8-Pin SOP(JEDEC) 8-Pin TSSOP SNT-8A Drawing code Package DP008-F FJ008-A FT008-A PH008-A Tape FJ008-D FT008-E PH008-A Reel FJ008-D FT008-E PH008-A Land
PH008-A
Caution This product intended general electronic devices such consumer electronics, office equipment, communications devices. Before using product medical equipment automobile equipment including audio, keyless entry engine control unit, contact indispensable.
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Configurations
8-Pin view
TEST
Table Symbol Description Chip select input Serial clock input Serial data input Serial data output Ground TEST*1 Test connection Power supply Connect VCC. Even this connected, performance affected long absolute maximum rating exceeded. Remark Dimensions details package drawings.
Figure S-93C46BD0I-D8S1G S-93C56BD0I-D8S1G S-93C66BD0I-D8S1G
8-Pin SOP(JEDEC) view
TEST
Table Symbol Description Chip select input Serial clock input Serial data input Serial data output Ground TEST*1 Test connection Power supply Connect VCC. Even this connected, performance affected long absolute maximum rating exceeded. Remark Dimensions details package drawings.
Figure
S-93C46BD0I-J8T1G S-93C46BD0H-J8T2G S-93C56BD0I-J8T1G S-93C56BD0H-J8T2G S-93C66BD0I-J8T1G S-93C66BD0H-J8T2G
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
8-Pin SOP(JEDEC) (Rotated) view
TEST
Table Symbol Description connection Power supply Chip select input Serial clock input Serial data input Serial data output Ground TEST*1 Test Connect VCC. Even this connected, performance affected long absolute maximum rating exceeded. Remark Dimensions details package drawings.
Figure S-93C46BR0I-J8T1G S-93C56BR0I-J8T1G S-93C66BR0I-J8T1G
8-Pin TSSOP view
TEST
Table Symbol Description Chip select input Serial clock input Serial data input Serial data output Ground TEST*1 Test connection Power supply Connect VCC. Even this connected, performance affected long absolute maximum rating exceeded. Remark Dimensions details package drawings.
Figure S-93C46BD0I-T8T1G S-93C46BD0H-T8T2G S-93C56BD0I-T8T1G S-93C56BD0H-T8T2G S-93C66BD0I-T8T1G S-93C66BD0H-T8T2G
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
SNT-8A view
TEST
Table Symbol Description Chip select input Serial clock input Serial data input Serial data output Ground TEST*1 Test connection Power supply Connect VCC. Even this connected, performance affected long absolute maximum rating exceeded. Remark Dimensions details package drawings.
Figure S-93C46BD0I-I8T1G S-93C56BD0I-I8T1G S-93C66BD0I-I8T1G
Seiko Instruments Inc.
Rev.4.3_00 Block Diagram
Memory array Address decoder
CMOS SERIAL E2PROM S-93C46B/56B/66B
Data register Mode decode logic Clock pulse monitoring circuit
Output buffer
Voltage detector
Clock generator
Figure
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Instruction Sets
S-93C46B Table Instruction input clock READ (Read data) WRITE (Write data) ERASE (Erase data) WRAL (Write all) ERAL (Erase all) EWEN (Write enable) Start Operation Code Address
Data Output*1 Input Input
EWDS (Write disable) When 16-bit data specified address been output, data next address output. Remark Don't care S-93C56B Table Instruction input clock READ (Read data) WRITE (Write data) ERASE (Erase data) WRAL (Write all) ERAL (Erase all) EWEN (Write enable) Start Operation Code Address Data Output*1 Input Input
EWDS (Write disable) When 16-bit data specified address been output, data next address output. Remark Don't care
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
S-93C66B Table Instruction input clock READ (Read data) WRITE (Write data) ERASE (Erase data) WRAL (Write all) ERAL (Erase all) EWEN (Write enable) Start Operation Address Code Data Output*1 Input Input
EWDS (Write disable) When 16-bit data specified address been output, data next address output. Remark Don't care
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Absolute Maximum Ratings
Table Item Power supply voltage Input voltage Output voltage Operating ambient temperature Storage temperature VOUT Topr Tstg Symbol Ratings -0.3 +7.0 -0.3 +0.3 -0.3 +105 +150
Unit
Caution absolute maximum ratings rated values exceeding which product could suffer physical damage. These values must therefore exceeded under conditions.
Recommended Operating Conditions
Table Item Symbol Conditions READ/EWDS WRITE/ERASE/ WRAL/ERAL/EWEN High level input voltage level input voltage +85°C Min. Typ. Max. 0.15 +105°C Unit Min. Typ. Max.
Power supply voltage
Capacitance
Table Item Input Capacitance Output Capacitance Symbol COUT Conditions VOUT 25°C, MHz, Min. Typ. Max. Unit
Endurance
Table Item Endurance Symbol Operating Temperature +85°C +105°C Min.
Typ.
Max.
Unit cycles/word*1
each address (Word: bits) Seiko Instruments Inc.
Rev.4.3_00 Electrical Characteristics
Table +85°C Item Symbol Conditions
CMOS SERIAL E2PROM S-93C46B/56B/66B
+105°C Unit
Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max.
Current consumption ICC1 (READ)
load
Table +85°C Item Symbol Conditions Min. Typ. Max. Min. Typ. Max. +105°C Min. Typ. Max. Unit
Current consumption ICC2 (WRITE)
load
Table +85°C Item Symbol Conditions GND, Open, Other inputs VOUT -400 High level output voltage -100 Write enable latch data hold voltage Only when write disable mode +105°C Unit Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max.
Standby current consumption Input leakage current Output leakage current level output voltage
VCC- VCC-
VCC- VCC-
VCC- VCC-
VCC-
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Electrical Characteristics
Table Measurement Conditions Input pulse voltage Output reference voltage Output load
Table +85°C Item setup time hold time deselect time Data setup time Data hold time Output delay time Clock frequency*1 clock time clock time Output disable time Output enable time Symbol Min. Typ. Max. tCSS tCSH tCDS tSKL tSKH tHZ1, tHZ2 0.15 0.15 Min. Typ. Max. Min. Typ. Max. 0.25 +105°C Unit Min. Typ. Max. 0.25 0.25 0.15 0.15
clock cycle clock (frequency: fSK) 1/fSK This clock cycle determined combination several characteristics, aware that even clock cycle time minimized, clock cycle (1/fSK) cannot made equal tSKL(Min.) tSKH(Min.). Table +85°C Item Write time Symbol Min. Typ. Max. +105°C Min. Typ. Max. Unit
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
tCSS tSKH Hi-Z
1/fSK
tCDS tSKL tCSH
Valid data
Valid data
Hi-Z
(READ)
Hi-Z
tHZ2
tHZ1
Hi-Z
(VERIFY)
Indicates high impedance. 1/fSK clock cycle. This clock cycle determined combination several characteristics, aware that even clock cycle time minimized, clock cycle (1/fSK) cannot made equal tSKL(Min.) tSKH(Min.). Figure Timing Chart
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Operation
instructions executed inputting synchronization with rising edge after goes high. instruction input order start bit, instruction, address, data. Instruction input finishes when goes low. level must input between commands during tCDS. While level being input S-93C46B/56B/66B standby mode, inputs invalid instructions allowed.
Start
start recognized when goes high rise after goes high. After goes high, start recognized even pulse input long low. Dummy clock clocks input while before start input called dummy clocks. Dummy clocks effective when aligning number instruction sets (clocks) sent with those required serial memory operation. example, when instruction bits, number instruction clocks adjusted inserting 7-bit dummy clock S-93C46B 5-bit dummy clock S-93C56B/66B. Start input failure When output status high during verify period after write operation, high level input rising edge S-93C46B/56B/66B recognizes that start been input. prevent this failure, input level during verify operation period (refer "4.1 Verify operation"). When 3-wire interface configured connecting input output pin, period which data output from serial memory collide generated, preventing successful input start bit. Take measures described 3-Wire Interface (Direct Connection between DO)".
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Reading (READ) READ instruction reads data from specified address. After gone high, input instruction order start bit, read instruction, address. Since last input address (A0) been latched, output status changes from high impedance (Hi-Z) low, which held until next rise 16-bit data starts output synchronization with next rise Sequential read After 16-bit data specified address been output, inputting while high automatically increments address, causes 16-bit data next address output sequentially. above method makes possible read data whole memory space. last address rolls over address
Hi-Z
Hi-Z
ADRINC
ADRINC
Figure Read Timing (S-93C46B)
S-93C56B
Hi-Z
S-93C66B
ADRINC
ADRINC
Figure Read Timing (S-93C56B, S-93C66B)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Writing (WRITE, ERASE, WRAL, ERAL)
write operation includes four write instructions: data write (WRITE), data erase (ERASE), chip write (WRAL), chip erase (ERAL). write instruction (WRITE, ERASE, WRAL, ERAL) starts write operation memory cell when level input after specified number clocks have been input. inputs invalid during write period, input instruction. Input instruction while output status high high impedance (Hi-Z). write operation valid only program enable mode (refer Write enable (EWEN) write disable (EWDS)").
Verify operation
write operation executed instruction completed within (write time tPR: typically ms), completion write operation recognized, write cycle minimized. sequential operation confirm status write operation called verify operation.
Operation After write operation started low), status write operation verified confirming output status inputting high level again. This sequence called verify operation, period that high level input after write operation started called verify operation period. relationship between output status write operation during verify operation period follows. low: Writing progress (busy) high: Writing completed (ready) Operation example There methods perform verify operation: Waiting change output status while keeping high, suspending verify operation low) once then performing again verify output status pin. latter method allows perform other processing during wait period, allowing efficient system designed. Caution Input level during verify operation. high level input rise when output status high, S-93C46B/56B/66B latches instruction assuming that start been input. this case, note that immediately enters high-impedance (Hi-Z) state.
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Writing data (WRITE)
write 16-bit data specified address, change high then input WRITE instruction, address, 16-bit data following start bit. write operation starts when goes low. There need data before writing. clocks more than specified number have been input, clock pulse monitoring circuit cancels WRITE instruction. details clock pulse monitoring circuit, refer Function Protect Against Write Erroneous Instruction Recognition".
tCDS
Verify
Standby
Hi-Z
Busy Ready
tHZ1 Hi-Z
Figure Data Write Timing (S-93C46B)
tCDS
Standby
Hi-Z S-93C56B S-93C66B
Verify
Busy eady
tHZ1 Hi-Z
Figure Data Write Timing (S-93C56B, S-93C66B)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Erasing data (ERASE)
erase 16-bit data specified address, bits data change high, then input ERASE instruction address following start bit. There need input data. data erase operation starts when goes low. clocks more than specified number have been input, clock pulse monitoring circuit cancels ERASE instruction. details clock pulse monitoring circuit, refer Function Protect Against Write Erroneous Instruction Recognition".
tCDS
Standby
Hi-Z
Verify
Busy
tHZ1
Ready
Hi-Z
Figure Data Erase Timing (S-93C46B)
tCDS
Standby
Hi-Z S-93C56B S-93C66B
Verify
Busy Ready
tHZ1 Hi-Z
Figure Data Erase Timing (S-93C56B, S-93C66B)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Writing chip (WRAL)
write same 16-bit data entire memory address space, change high, then input WRAL instruction, address, 16-bit data following start bit. address input. write operation starts when goes low. There need data before writing. clocks more than specified number have been input, clock pulse monitoring circuit cancels WRAL instruction. details clock pulse monitoring circuit, refer Function Protect Against Write Erroneous Instruction Recognition".
tCDS
Standby
Hi-Z
Verify
Busy Ready
tHZ1 Hi-Z
Figure Chip Write Timing (S-93C46B)
tCDS
Hi-Z
Verify
Standby
Busy Ready
tHZ1 Hi-Z
Figure Chip Write Timing (S-93C56B, S-93C66B)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Erasing chip (ERAL)
erase data entire memory address space, data change high, then input ERAL instruction address following start bit. address input. There need input data. chips erase operation starts when goes low. clocks more than specified number have been input, clock pulse monitoring circuit cancels ERAL instruction. details clock pulse monitoring circuit, refer Function Protect Against Write Erroneous Instruction Recognition".
Verify Standby
tCDS
Ready Hi-Z tHZ1
Figure Chip Erase Timing (S-93C46B)
tCDS
Verify
Standby
Ready
tHZ1 Hi-Z
Figure Chip Erase Timing (S-93C56B, S-93C66B)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Write enable (EWEN) write disable (EWDS)
EWEN instruction instruction that enables write operation. status which write operation enabled called program enable mode. EWDS instruction instruction that disables write operation. status which write operation disabled called program disable mode. After goes high, input instruction order start bit, EWEN EWDS instruction, address (optional). Each mode becomes valid inputting level after last address (optional) been input.
Standby
EWEN EWDS
Figure Write Enable/Disable Timing (S-93C46B)
Standby
EWEN EWDS
Figure Write Enable/Disable Timing (S-93C56B, S-93C66B) Recommendation write operation disable instruction recommended implement design that prevents incorrect write operation when write instruction erroneously recognized executing write operation disable instruction when executing instructions other than write instruction, immediately after power-on before power off.
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B Write Disable Function when Power Supply Voltage
S-93C46B/56B/66B provides built-in detector detect power supply voltage disable writing. When power supply voltage power application, write instructions (WRITE, ERASE, WRAL, ERAL) cancelled, write disable state (EWDS) automatically set. detection voltage 1.75 typ., release voltage 2.05 typ., there hysteresis about (refer Figure 20). Therefore, when write operation performed after power supply voltage dropped then risen again level which writing possible, write enable instruction (EWEN) must sent before write instruction (WRITE, ERASE, WRAL, ERAL) executed. When power supply voltage drops during write operation, data being written address that time guaranteed.
Hysteresis About Release voltage (+VDET) 2.05 Typ.
Power supply voltage Detection voltage (-VDET) 1.75 Typ.
Write instruction cancelled Write disable state (EWDS) automatically
Figure Operation when Power Supply Voltage
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Function Protect Against Write Erroneous Instruction Recognition
S-93C46B/56B/66B provides built-in clock pulse monitoring circuit which used prevent erroneous write operation canceling write instructions (WRITE, ERASE, WRAL, ERAL) recognized erroneously erroneous clock count caused application noise pulses double counting clocks. Instructions cancelled clock pulse more less than specified number decided each write operation (WRITE, ERASE, WRAL, ERAL) detected. <Example> Erroneous recognition program disable instruction (EWDS) erase instruction (ERASE)
Example S-93C46B Input EWDS instruction Erroneous recognition ERASE instruction noise pulse Noise pulse
products that include clock pulse monitoring circuit, FFFF mistakenly written address 00h. However S-93C46B detects overcount cancels instruction without performing write operation.
Figure Example Clock Pulse Monitoring Circuit Operation
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B 3-Wire Interface (Direct Connection between
There types serial interface configurations: 4-wire interface configured using pins, 3-wire interface that connects input output pin. When 3-wire interface employed, period which data output from data output from serial memory collide occur, causing malfunction. prevent such malfunction, connect pins S-93C46B/56B/66B resistor that data output from takes precedence being input (refer "Figure Connection 3-Wire Interface").
S-93C46B/56B/66B
Figure Connection 3-Wire Interface
Pins
Connection input pins
input pins S-93C46B/56B/66B employ CMOS structure, design equipment that high impedance will input while S-93C46B/56B/66B operating. Especially, deselect input level) when turning on/off power during standby. When deselected level), incorrect data writing will occur. Connect resistor pulldown resistor). prevent malfunction, recommended equivalent pull-down resistors pins other than pin.
Input output equivalent circuits
following shows equivalent circuits input pins S-93C46B/56B/66B. None input pins incorporate pull-up pull-down elements, special care must taken when designing prevent floating status. Output pins tri-state outputs. TEST disconnected from internal circuit switching transistor during normal operation. long absolute maximum rating satisfied, TEST internal circuit will never connected.
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Input
Figure
Figure
TEST
Figure TEST
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Output
Figure Input noise elimination time
S-93C46B/56B/66B include built-in low-pass filter eliminate noise pins. This means that supply voltage room temperature), noise with pulse width less eliminated. Note, therefore, noise with pulse width more than will recognized pulse voltage exceeds VIH/VIL.
Precaution
apply electrostatic discharge this that exceeds performance ratings built-in electrostatic protection circuit. claims responsibility disputes arising connection with infringement products including this patents owned third party.
Seiko Instruments Inc.
Rev.4.3_00 Characteristics (Typical Data)
Characteristics Current consumption (READ) ICC1 ambient temperature
DATA 0101 ICC1 (mA)
ICC1 (mA)
CMOS SERIAL E2PROM S-93C46B/56B/66B
Current consumption (READ) ICC1 ambient temperature
DATA 0101
(°C)
(°C)
Current consumption (READ) ICC1 ambient temperature
DATA 0101 ICC1 (mA)
Current consumption (READ) ICC1 power supply voltage
25°C MHz, DATA 0101 ICC1 (mA)
(°C)
Current consumption (READ) ICC1 power supply voltage
25°C kHz, DATA 0101
Current consumption (READ) ICC1 Clock frequency
25°C ICC1 (mA)
ICC1 (mA)
(Hz)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Current consumption (WRITE) ICC2 ambient temperature
ICC2 (mA)
Current consumption (WRITE) ICC2 ambient temperature
ICC2 (mA)
(°C)
(°C)
Current consumption (WRITE) ICC2 ambient temperature
ICC2 (mA)
Current consumption (WRITE) ICC2 power supply voltage
25°C ICC2 (mA)
(°C)
Current consumption standby mode ambient temperature
(µA)
Current consumption standby mode power supply voltage
25°C (µA)
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Input leakage current ambient temperature
VCC=5.5 TEST=0 (µA)
Input leakage current ambient temperature
TEST (µA)
(°C)
(°C)
Output leakage current ambient temperature
(µA)
Output leakage current ambient temperature
(µA)
(°C)
(°C)
High-level output voltage ambient temperature
-400
High-level output voltage ambient temperature
-100
(°C)
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
High-level output voltage ambient temperature
-100
High-level output voltage ambient temperature
(°C)
(°C)
Low-level output voltage ambient temperature
Low-level output voltage ambient temperature
0.03 0.02 0.01
(°C)
(°C)
High-level output current ambient temperature
-20.0 (mA) -10.0
High-level output current ambient temperature
(mA)
(°C)
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
High-level output current ambient temperature
(mA)
High-level output current ambient temperature
-1.0 (mA) -0.5
(°C)
(°C)
Low-level output current ambient temperature
(mA)
Low-level output current ambient temperature
(mA)
(°C)
(°C)
Input inverted voltage VINV power supply voltage
25°C VINV
Input inverted voltage VINV ambient temperature
VINV
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
supply voltage detection voltage -VDET ambient temperature
supply voltage release voltage +VDET ambient temperature
-VDET
+VDET
(°C)
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Characteristics Maximum operating frequency fMAX. power supply voltage
25°C 100k (ms)
Write time power supply voltage
25°C
fMAX. (Hz)
Write time ambient temperature
(ms)
Write time ambient temperature
(ms)
(°C)
(°C)
Write time ambient temperature
(ms)
Data output delay time ambient temperature
(µs)
(°C)
(°C)
Seiko Instruments Inc.
CMOS SERIAL E2PROM S-93C46B/56B/66B
Data output delay time ambient temperature
(µs)
Data output delay time ambient temperature
(µs)
(°C)
(°C)
Seiko Instruments Inc.
Rev.4.3_00 Product Name Structure
S-93CxxB xxxx
CMOS SERIAL E2PROM S-93C46B/56B/66B
Package name (abbreviation) packing specifications D8S1: J8T1: J8T2: T8T1: T8T2: I8T1: 8-Pin DIP, Tube 8-Pin SOP(JEDEC), Tape 8-Pin SOP(JEDEC), Tape, +105°C Max.supported 8-Pin TSSOP, Tape 8-Pin TSSOP, Tape, +105°C Max. supported SNT-8A, Tape
Operation temperature +85°C +105°C (Only 8-Pin SOP(JEDEC) 8-Pin TSSOP) Fixed assignment 8-Pin 8-Pin SOP(JEDEC) 8-Pin TSSOP SNT-8A 8-Pin SOP(JEDEC) (Rotated) Product name S-93C46B K-bit S-93C56B K-bit S-93C66B K-bit
Seiko Instruments Inc.
9.6(10.6max.)
0.89
7.62
2.54
0.48±0.1
0.25 -0.05
+0.11
DP008-F-P-SD-3.0
TITLE SCALE UNIT
DIP8-F-PKG Dimensions DP008-F-P-SD-3.0
Seiko Instruments Inc.
5.02±0.2
0.20±0.05
1.27
0.4±0.05
FJ008-A-P-SD-2.1
TITLE SCALE UNIT
SOP8J-D-PKG Dimensions FJ008-A-P-SD-2.1
Seiko Instruments Inc.
2.0±0.05
4.0±0.1(10 pitches:40.0±0.2) 0.3±0.05
5°max.
8.0±0.1
2.1±0.1
6.7±0.1
Feed direction
FJ008-D-C-SD-1.1
TITLE SCALE UNIT
SOP8J-D-Carrier Tape FJ008-D-C-SD-1.1
Seiko Instruments Inc.
2±0.5 Enlarged drawing central part 2±0.5 13.5±0.5
FJ008-D-R-SD-1.1
TITLE SCALE UNIT
SOP8J-D-Reel FJ008-D-R-SD-1.1
QTY. 2,000
Seiko Instruments Inc.
3.00 -0.2
+0.3
0.17±0.05
0.2±0.1 0.65
FT008-A-P-SD-1.1
TITLE SCALE UNIT
TSSOP8-E-PKG Dimensions FT008-A-P-SD-1.1
Seiko Instruments Inc.
4.0±0.1 2.0±0.05 0.3±0.05
8.0±0.1
-0.05
+0.1
(4.4)
-0.2
+0.4
Feed direction
FT008-E-C-SD-1.0
TITLE SCALE UNIT
TSSOP8-E-Carrier Tape FT008-E-C-SD-1.0
Seiko Instruments Inc.
13.4±1.0 Enlarged drawing central part 2±0.5 17.5±1.0
FT008-E-R-SD-1.0
TITLE SCALE UNIT
TSSOP8-E-Reel FT008-E-R-SD-1.0
QTY. 3,000
Seiko Instruments Inc.
1.97±0.03
0.08 -0.02
+0.05
0.48±0.02
0.2±0.05
PH008-A-P-SD-2.0
TITLE SCALE UNIT
SNT-8A-A-PKG Dimensions PH008-A-P-SD-2.0
Seiko Instruments Inc.
+0.1
2.0±0.05
4.0±0.1
0.25±0.05
2.25±0.05
4.0±0.1
0.65±0.05
Feed direction
PH008-A-C-SD-1.0
TITLE SCALE UNIT
SNT-8A-A-Carrier Tape PH008-A-C-SD-1.0
Seiko Instruments Inc.
12.5max.
Enlarged drawing central part
9.0±0.3
(60°)
(60°)
PH008-A-R-SD-1.0
TITLE SCALE UNIT
SNT-8A-A-Reel PH008-A-R-SD-1.0
QTY. 5,000
Seiko Instruments Inc.
0.52
2.01
0.52
Caution Making wire pattern under package possible. However, note that package upraised thickness made silk screen printing solder resist pattern because this package does have standoff.
PH008-A-L-SD-3.0
TITLE SCALE UNIT
SNT-8A-A-Land Recommendation
PH008-A-L-SD-3.0
Seiko Instruments Inc.
information described herein subject change without notice. Seiko Instruments Inc. responsible problems caused circuits diagrams described herein whose related industrial properties, patents, other rights belong third parties. application circuit examples explain typical applications products, guarantee success specific mass-production design. When products described herein regulated products subject Wassenaar Arrangement other agreements, they exported without authorization from appropriate governmental authority. information described herein other purposes and/or reproduction copying without express permission Seiko Instruments Inc. strictly prohibited. products described herein cannot used part device equipment affecting human body, such exercise equipment, medical equipment, security systems, equipment, apparatus installed airplanes other vehicles, without prior written permission Seiko Instruments Inc. Although Seiko Instruments Inc. exerts greatest possible effort ensure high quality reliability, failure malfunction semiconductor products occur. user these products should therefore give thorough consideration safety design, including redundancy, fire-prevention measures, malfunction prevention, prevent accidents, fires, community damage that ensue.

S-93C46B/56B/66B S-93C46B/56B/66B high speed, current consumption

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