50mA, 16-Channel Driv General Description AS1113 designed dr

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50mA, 16-Channel Driv General Description AS1113 designed dr

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AS1113
50mA, 16-Channel Driv
General Description
AS1113 designed drive LEDs through fast serial interface features output constant current drivers on-chip diagnostic read-back function. high clock-frequency 50MHz), adjustable output current, flexible serial interface makes device perfectly suited high-volume transmission applications. Output current adjustable 50mA/channel) using external resistor (REXT). serial interface with Schmitt trigger inputs includes integrated shift register. Additionally, internal data register stores currently displayed data. device features integrated diagnostics overtemperature, open-LED, shorted-LED conditions. Integrated registers store global fault status information during load well detailed temperature/openLED/shorted-LED diagnostics results. AS1113 also features low-current diagnostic mode minimize display flicker during fault testing. AS1113 available 24-pin SSOP 28pin (5x5mm) package. higher output current needed, please AS1110 with 100mA drive capability.
Features
Constant-Current Output Channels Excellent Output Current Accuracy Between Channels: <±3% Between Devices: <±6%
Output Current Channel: 50mA Controlled In-Rush Current Over-Temperature, Open-LED, Shorted-LED Diagnostic Functions Low-Current Test Mode Global Fault Monitoring Shutdown Mode Current: 10µA Fast Serial Interface: 50MHz Cascaded Configuration Extremely Fast Output Drivers Suitable 24-pin SSOP 28-pin (5x5mm) Package
Applications
device ideal fixed- slow-rolling displays using static multiplexed matrix dimming functions, large matrix displays, mixed display switch monitoring, displays elevators, public transports (underground, trains, buses, taxis, airplanes, etc.), large displays stadiums public areas, price indicators retail stores, promotional panels, bar-graph displays, industrial controller displays, white good panels, emergency light indicators, traffic signs.
Figure Main Diagram Assignments
OUTN11
OUTN10
OUTN12
OUTN13
OUTN14
+VLED OUTN3 OUTN4 OUTN5 OUTN6 OUTN7 OUTN8 OUTN0 OUTN1 OUTN2 OUTN9
AS1113
OUTN15
REXT
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AS1113
Data Sheet
Contents
General Description Features Applications Pinout
Assignments Descriptions
Absolute Maximum Ratings Electrical Characteristics
Switching Characteristics
Typical Operating Characteristics Detailed Description
Serial Interface Timing Diagrams Error-Detection Mode Global Error Mode Error Detection Functions Open-LED Detection Shorted-LED Overtemperature Detailed Error Reports Detailed Temperature Warning Report Detailed Open-LED Error Report Detailed Shorted-LED Error Report Low-Current Diagnostic Mode
Shutdown Mode
Application Information
Error Detection Error Detection On-The-Fly Error Detection with Low-Current Diagnosis Mode Cascading Devices Constant Current Adjusting Output Current Package Power Dissipation Delayed Outputs Switching-Noise Reduction Load Supply Voltage
Package Drawings Markings Ordering Information
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AS1113
Data Sheet
Pinout
Assignments
Figure Assignments (Top View)
REXT
OUTN15
OUTN14
OUTN13
OUTN12
OUTN10 OUTN5
OUTN11
OUTN9 OUTN6
REXT
OUTN0 OUTN1 OUTN2 OUTN3 OUTN4 OUTN5 OUTN6 OUTN10 OUTN8 OUTN7 OUTN9
AS1113
28-pin
OUTN15 OUTN14 OUTN13 OUTN12 OUTN11 OUTN0 OUTN1 OUTN2 OUTN3 OUTN4 OUTN7
AS1113
24-pin SSOP
Descriptions
Table Descriptions Number SSOP 5:20 24:27 3:10 12:19 Name OUTN0:15 Ground Serial Data Input Serial Data Clock. rising edge signal used clock data into AS1113 shift register. error mode, rising edge signal used switch error modes. Serial Data Load Output Current Drivers. These pins used drivers input sense diagnostic modes. Data transferred data register rising edge these pins. Output Enable. active-low signal always enable output drivers sink current independent AS1113 mode. Output drivers enabled. Output drivers disabled. Serial Data Output. normal mode latched clock cycles after latched global error detection mode this indicates occurrence global error. Global error mode returned error. errors. External Resistor Connection. This connects through external resistor (REXT) GND, setup load current. Positive Supply Voltage connected Description
REXT
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OUTN8
AS1113
Data Sheet
Absolute Maximum Ratings
Stresses beyond those listed Table cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated Section Electrical Characteristics page implied. Exposure absolute maximum rating conditions extended periods affect device reliability. Table Absolute Maximum Ratings Parameter Input Voltage Output Voltage Current Thermal Resistance Ambient Temperature Storage Temperature Humidity Electrostatic Discharge Digital Outputs Other Pins -0.4 -0.4 +0.4 1000 2000 2000 +100 -100 (INOM 0.5) INOM Units Non-condensing Norm: method 3015 PCB, 24-pin SSOP package PCB, 28-pin (5x5mm) package Comments
Latch-Up Immunity
EIA/JESD78 reflow peak soldering temperature (body temperature) specified accordance with IPC/JEDEC J-STD-020C "Moisture/Reflow Sensitivity Classification Non-Hermetic Solid State Surface Mount Devices". lead finish Pb-free leaded packages matte (100% Sn).
Package Body Temperature
+260
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Data Sheet
Electrical Characteristics
+3.0 +5.5V, TAMB (unless otherwise specified). Table Electrical Characteristics Symbol IOUT Input Voltage IDS(OFF) IAV(LC1) IAV(LC1) IAV(LC2) IAV(LC2) %/VDS %/VDD RIN(UP) RIN(DOWN) VTHL VTHH TOV1 IDD(OFF)0 IDD(OFF)1 IDD(OFF)2 IDD(ON)1 IDD(ON)2 Supply Current Level Output Leakage Current Output Voltage 15.0V +1.0mA -1.0mA 0.5V, Const., REXT IOUT 25.26mA, 0.5V, Const., REXT 0.6V, 3.3V, REXT IOUT 50.52mA, 0.6V, Const., REXT 0.8V, 5.0V 0.8V, 5.0V, REXT 372, OUTN0:15 within 3.0V within 5.0V 0.25 3.0V 5.0V 0.4V 25.25 ±1.5 50.5 ±1.5 ±0.1 REXT Open, OUTN0:15 REXT 744, OUTN0:15 REXT 372, OUTN0:15 REXT 744, OUTN0:15 REXT 372, OUTN0:15 10.5 0.45 High Level CLK, OEN, Output Current Parameter Supply Voltage Output Voltage OUTN0:15 OUTN0:15 -0.3 Condition 15.0 -1.0 Unit
Device-to-Device Average Output Current from OUTN0 OUTN15 Current Skew (Between Channels) Device-to-Device Average Output Current from OUTN0 OUTN15 Current Skew (Between Channels) Low-Current Diagnosis Mode Power Down Supply Current Output Current Output Voltage Regulation Output Current Supply Voltage Regulation Pullup Resistance Pulldown Resistance Error Detection Threshold Voltage Error Detection Threshold Voltage Overtemperature Threshold Flag
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AS1113
Data Sheet
Switching Characteristics
5.5V, 0.8V, VDD, GND, REXT 372, VLOAD 4.0V, RLOAD CLOAD 10pF; guaranteed design. Table Switching Characteristics Symbol tW(CLK) tW(L) tW(OE)
Parameter Propagation Delay Time (Without Staggered Output Delay) Propagation Delay Time Pulse Width Rise Time Fall Time Output Rise Time VOUT (Turn Off) Output Fall Time VOUT (Turn Setup Time Hold Time Setup Time Hold Time Time Error Detection Staggered Output Delay Output Enable Setup Time Global Error Switching Setup Time Global Error Detection Setup Time Propagation Delay Global Error Flag Switching Time Global Error Flag Maximum Clock Frequency (Cascade Operation) Low-Current Test Mode Propagation Delay Time External Resistor Reaction Time External Resistor Reaction Time
Conditions OUTNn OUTNn (@IOUT 60mA)
Unit
2000 0.05
tSU(D) tH(D) tSU(L) tH(L) tTESTING tSTAG tSU(OE) tGSW(ERROR) tSU(ERROR) tP(I/O) tSW(ERROR) fCLK tP3,ON tP3,OFF tREXT2,1 tREXT2,1
Turn Turn Change from REXT1 372, IOUT1 50.52mA REXT2 37.2k, IOUT2 Change from REXT1 37.2k, IOUT1 0.5mA REXT2 372, IOUT2 25mA
multiple AS1113 devices cascaded large, critical achieve timing required data transfer between cascaded drivers.
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Data Sheet
Typical Operating Characteristics
Figure Output Current REXT, 0.8V, TAMB 25°C
Figure Relative Output Current Error VDD, Iout/Iout@VDD=5V TAMB 25°C
Relative Output Current Error
REXT 744; 0.5V
IOUT (mA)
-0.5
REXT 372; 0.6V
-1.5
REXT
1000
10000
Figure Output Current VDS; TAMB 25°C
Figure Output Current VDS; TAMB 25°C
REXT
REXT REXT REXT
IOUT (mA)
IOUT (mA)
REXT REXT
REXT
REXT
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Detailed Description
AS1113 designed drive LEDs through fast serial interface constant-current output drivers. Furthermore, AS1113 provides diagnostics detecting open- shorted-LEDs, well over-temperature conditions display systems, especially traffic sign applications. AS1113 contains 16-bit shift register 16-bit data register, which convert serial input data into parallel output format. AS1113 output stages, sixteen regulated current sinks designed provide uniform constant current with excellent matching between ports driving LEDs within wide range forward voltage variations. External output current adjustable from 50mA using external resistor flexibility controlling brightness intensity LEDs. AS1113 guarantees endure maximum outputs. serial interface capable operating minimum MHz, satisfying requirements high-volume data transmission. Using multiplexed input/output technique, AS1113 adds additional functionality pins SDO, OEN. These pins provide highly useful functions (open- shorted-LED detection, over-temperature detection), thus reducing count. Over-temperature detection will work on-the-run, whereas open- shorted-LED detection used on-the-run low-current diagnostic mode (see page 15). Figure Block Diagram
+VLED OUTN10 OUTN12 OUTN13 OUTN14 OUTN15 Global Error Detection OUTN11 OUTN0 OUTN1 OUTN2 OUTN3 OUTN4 OUTN5 OUTN6 OUTN7 OUTN8 OUTN9
REXT Current Generators
Temperature Detection
16-Bit Open Detection Error Register
16-Bit Short Detection Error Register
AS1113
16-Bit Data Register
Detailed Error Detection
16-Bit Shift Register Control Logic
Indicates Path
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Data Sheet
Serial Interface
Data accesses made serially pins SDO. each rising edge, signal present shifted into first internal shift register other bits shifted ahead first bit. first clocked error-detection mode shift register will latch-in corresponding error data temperature-, open-, short-error register with each falling edge 16-bit data register will latch data shift register each rising edge This data then used drive current generator output drivers switch corresponding LEDs goes low.
Timing Diagrams
This section contains timing diagrams referenced other sections this data sheet. Figure Normal Mode Timing Diagram
tW(CLK)
tSU(D)
tH(D)
tW(L) tSU(L) tH(L)
Output Enabled OUTNx High Output OUTNx Output
OUTNx
Figure Output Delay Timing Diagram
tW(OE) OUTN0 tSTAG OUTN1 tSTAG
14XtSTAG OUTN15
14XtSTAG
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Figure Data Input Timing Diagram
tSU(L) tSU(OE)
tW(OE)
Pulses
tW(L)
tSU(D) SDI0 Data Data Data Data Data Data Data Data tH(D) SDO0 Data Data Data Data Data Data Data Data Don't Care Don't Care
Figure Data Input Example Timing Diagram
Time OUTN0 OUTN1 OUTN2 OUTN3 OUTN4 OUTN5 OUTN6 OUTN7 OUTN8 OUTN9 OUTN10 OUTN11 OUTN12 OUTN13 OUTN14 OUTN15
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Figure Switching Global Error Mode Timing Diagram
tTESTING tGSW(ERROR) tSU(ERROR) tP(I/O) tP(I/O) tP(I/O) tGSW(ERROR)
tGSW(ERROR)
TFLAG(IN)
OFLAG(IN)
SFLAG(IN)
Don't Care
TFLAG
Don't Care
OFLAG
Don't Care
SFLAG
Acquisition Error Status
tSW(ERROR)
tSW(ERROR)
Error-Detection Mode
Acquisition error status occurs rising edge OEN. Error-detection mode started rising edge when high. signal must when entering error detection mode. Error detection open- shorted-LEDs only performed LEDs that switched during test time. switch between error-detection modes clock pulses needed (see Table Note: test LEDs, test pattern that turns LEDs must input AS1113.
Global Error Mode
Global error mode entered when error-detection mode started. Clock pulses during this period used select between temperature, open-LED, shorted-LED tests, well low-current diagnostic mode shutdown mode (see Table global error mode, error flag (TFLAG, OFLAG, SFLAG) delivered errors encountered. Table Global Error Mode Selections Clock Pulses Output Port Don't Care Enabled Enabled Don't Care Don't Care Error-Detection Mode Over-Temperature Detection Open-LED Detection Shorted-LED Detection Low-Current Diagnostic Mode Shutdown Mode Wakeup Shutdown Global Error Flag/Shutdown Condition TFLAG over-temperature warning. TFLAG Over-temperature warning. OFLAG open-LED error. OFLAG Open-LED error. SFLAG shorted-LED error. SFLAG Shorted-LED error.
Note: valid result must first device.
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there multiple AS1113s chain, error flag will gated through devices. valid result chain, logic must applied input first device chain. device produces error this error will show after n*tP(I/O) tSW(ERROR) last device chain. This means possible identify which device chain produced error. Therefore, global error occurs, detailed error report identify which AS1113, produced error. Note: When error occurred, detailed error report skipped, setting subsequently low.
Error Detection Functions
Open-LED Detection
AS1113 open-LED detection based comparison between VTHL. open status aquired rising edge stored internally. While detecting open-LEDs output port must turned Open detection started with clock pulse during error detection mode while output port turned Note: LEDs which turned test time cannot tested will shown logic detailed error report. Table Open Detection Modes Output Port State Effective Output Point Conditions VTHL VTHL Detected Open-LED Error Status Code Meaning Open Circuit Normal
Shorted-LED
AS1113 shorted-LED detection based comparison between VTHH. shortened status aquired rising edge stored internally. While detecting shorted-LEDs output port must turned Shorted-LED detection started with clock pulses during error detection mode while output port turned valid results, voltage OUTN0:OUTN15 must lower then VTHH under low-current diagnostic mode operating conditions. This achieved reducing VLED voltage adding additional diodes, resistors LED's. Note: LEDs which turned test time cannot tested will shown logic detailed error report. Table Shorted Detection Modes Output Port State Effective Output Point Conditions VTHH VTHH Detected Shorted-LED Error Status Code Meaning Short Circuit Normal
Overtemperature
Thermal protection AS1113 provided continuously monitoring device's core temperature. overtemperature status aquired rising edge stored internally. Table Overtemperature Modes Output Port State Don't Care Don't Care Effective Output Point Conditions Temperature TOV1 Temperature TOV1 Detected Overtemperature Status Code Meaning Overtemperature Condition Normal
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Detailed Error Reports
detailed error report read after global error mode been run. falling edge detailed error report selected test latched into shift register clocked with n*16 clock cycles number AS1113s chain) SDO. same time data written into shift register, which loaded next rising edge This pattern shown output drivers, falling edge OEN.
Detailed Temperature Warning Report
detailed temperature warning report read immediately after global error mode been run. must first device. Bit0 16bit data word represents temperature flag chip. Figure Detailed Temperature Warning Report Timing Diagram
Global Flag Readout tGSW(ERROR) t(SU)ERROR tH(L) Detailed Error Report Readout
DBit15
DBit14 DBit13 DBit12
DBitn
DBit2
DBit1
DBit0
Don't Care Don't Care
Data Input detailed timing information Timing Diagrams page TFLAG Undefined Temperature Error Report Output
TBit0
Detailed Temperature Warning Report Example Consider case where four AS1113s cascaded chain. detailed error report lists temperatures each device chain: IC1:[70°] IC2:[85°] IC3:[170°] IC4:[60°] this case, overheated will generate global error, therefore 4*16 clock cycles needed write detailed temperature warning report, optionally read data. detailed temperature warning report would look like this: XXXXXXXXXXXXXXX1 XXXXXXXXXXXXXXX1 XXXXXXXXXXXXXXX0 XXXXXXXXXXXXXXX1 detailed temperature warning report indicates that device with over-temperature condition. Note: actual report there spaces output.
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Detailed Open-LED Error Report
detailed open-LED error report read immediately after global error mode been run. must first device. Figure Detailed Open-LED Error Report Timing Diagram
Global Flag Readout tTESTING tSU(ERROR) tGSW(ERROR) tGSW(ERROR)
Acquisition Error Status
Detailed Error Report Readout
tH(L)
tGSW(ERROR)
tSW(ERROR)
DBit15
DBit14 DBit13 DBit12 DBitn
DBit2
DBit1
DBit0
Don't Care
Data Input TFlag OFlag
OBit15 OBit14 OBit13 OBit12 OBitn OBit2 OBit1 OBit0
Don't Care
Open Error Report Output
detailed timing information Timing Diagrams page
Detailed Open-LED Error Report Example Consider case where three AS1113s cascaded chain. indicates indicates off, indicates open LED. open-LED test only applied LEDs that turned This test used with test pattern where LEDs test time. IC1:[1111111111111111] IC2:[111XX11111111X11] IC3:[1111111111111111] three open LEDs switched input. 3*16 clock cycles needed write entire error code out. detailed error report would look like this: Input Data: Status: Failure Code: 1111111111111111 1110011111111011 1111111111111111 1111111111111111 1111111111111111
Comparing this report with input data indicates that device with open LEDs position open position such test recommended enter low-current diagnostic mode first (see LowCurrent Diagnostic Mode page reduce screen flickering. This test used also on-the-fly without using test pattern (see Figure page 17). Note: actual report there spaces output. LEDs turned during test time cannot tested will show logic detailed error report.
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Detailed Shorted-LED Error Report
detailed shorted-LED error report read immediately after global error mode been (see Global Error Mode page 11). must first device. Figure Detailed Shorted-LED Error Report Timing Diagram
Global Flag Readout tTESTING tSU(ERROR) tGSW(ERROR) tGSW(ERROR)
Acquisition Error Status
Detailed Error Report Readout
tH(L) tGSW(ERROR)
DBit15
DBit14 DBit13 DBit12
DBitn
DBit2
DBit1
DBit0
Don't Care
tSW(ERROR)
Data Input
SBit15 SBit14 SBit13 SBit12 SBitn SBit2 SBit1 SBit0
TFLAG OFLAG TFLAG
SFLAG
Don't Care
detailed timing information Timing Diagrams page
Shorted-LED Error Report Output
Detailed Shorted-LED Error Report Example Consider case where three AS1113s cascaded chain. indicates indicates off, indicates shorted LED. This test used on-the-fly. IC1:[11111XX111111111] IC2:[1111111111111111] IC3:[X100011111111111] shorted LEDs which switched shorted switched input. 3*16 clock cycles needed write entire error code out. detailed error report would look like this: Input Data: Status: Failure Code: 1111111111111111 1111111111111111 1111111111111111 0100011111111111 1111111111111111
Showing device with shorted LEDs position with shorted position shorted position cannot detected, since LEDs turned test time tested will show logic detailed error report. test LEDs this test should with test pattern. test with test pattern, low-current diagnostic mode should entered first reduce on-screen flickering. Note: actual report there spaces output. LEDs turned during test time cannot tested will show logic detailed error report.
Low-Current Diagnostic Mode
open- shorted-LED test, test pattern must used that will turn each tested. This test pattern will cause short flicker screen while test being performed. low-current diagnostic mode initiated prior running detailed error report reduce this on-screen flickering. Note: Normally, displays using such diagnostic mode require additional cables, resistors, other components reduce current. AS1113 this current-reduction capability built-in, thereby minimizing number external components required. Low-current diagnostic mode initiated clock pulses during error-detection mode. After falling edge test pattern displaying written shift register which will used next error-detection test.
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AS1113
Data Sheet
next falling edge OEN, current reduced ILC. With next rising edge current will immediately increase normal levels detailed error report read entering error-detection mode. Figure Switching into Low-Current Diagnostic Mode Timing Diagram
Low-Current Diagnosis Mode tTESTING tSU(ERROR) Load Internal Test Pattern (optional) tH(L)
tGSW(ERROR) tGSW(ERROR) tSW(ERROR)
TFLAG OFLAG SFLAG
Don't Care
Re-entering Error Detection Mode (see Figure (see Figure Normal Operation Current
detailed timing information Timing Diagrams page
Shutdown Mode
AS1113 features shutdown mode which entered clock pulses during error-detection mode. enable shutdown mode must placed after rising edge clock pulse. disable shutdown mode must placed after clock pulse. shutdown/wakeup information will latched through multiple AS1113 devices chain. rising edge clock pulse shutdown will read AS1113 will shutdown wakeup. Note: shutdown mode supply current drops down <10µA. Figure Shutdown Mode Timing Diagram
tSU(ERROR)
Wakeup Shutdown
Wakeup TFLAG OFLAG SFLAG Shutdown tSU(D)
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Application Information
Error Detection
AS1113 features types error detection. error detection used on-the-fly, active LEDs, without delay, entering into low-current diagnosis mode.
Error Detection On-The-Fly
Error detection on-the-fly will output status active LEDs during operation. Without choosing error mode this will output temperature flag every input/output cycle. Triggering clock pulse open clock pulses short detection during error detection mode outputs detailed open- short-error report with next input/output cycle (see Figure 18). LEDs turned test time tested will show logic detailed error report. Figure Normal Operation with Error Detection During Operation Cascaded AS1113s
Display Data1 Data2 Data3
Data2 Error Code Data0
Data3
Data4
Clock Error Mode 0x/1x/2x
Error Code Data1
Clock Error Mode 0x/1x/2x
Error Code Data2
1024x Rising Edge Acquisition Error Status
1024x Rising Edge Acquisition Error Status Falling Edge Error Register copied into Shift Register 50mA
1024x
Falling Edge Error Register copied into Shift Register
Current
Global Error Flag
Error Detection with Low-Current Diagnosis Mode
This unique feature AS1113 uses internal test pattern flicker free diagnosis LEDs. This error detection mode started each input cycle (see Figure 19). Figure Low-Current Diagnosis Mode with Internal Test Pattern Cascaded AS1113s
Low-Current Diagnosis Mode Display Data0 Data1 Data2
Data1 Error Code Data0
Data2 Error Code from Test Pattern
Data3
Clocks Low- Clock Error Current Mode Mode 1x/2x
Temperature Error Code
1024x Rising Edge Acquisition Error Status
1024x
1024x
Internal Falling Edge Error Register copied into Shift Register Test Pattern 50mA 0.8mA 50mA Global Error Flag
Current
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AS1113
Data Sheet
last pattern written into shift register will saved before starting low-current diagnosis mode displayed immediately after test been performed. Low-current diagnostic mode started with clock pulses during error detection mode. Then should enabled testing. With rising edge test stopped, while high desired error mode selected with corresponding clock pulses. After again previously saved pattern displayed outputs. With next data input detailed error code will clocked SDO. Note: Figure external test pattern. Figure Low-Current Diagnosis Mode with External Test Pattern Cascaded AS1113s
Low-Current Diagnosis Mode Display Data1 External Test Pattern Error Code Data0
Clocks Low-Current Mode Clock Error Mode 1x/2x
Data2
Data2 Error Code from Test Pattern
Data3
Temperature Error Code
1024x
1024x Rising Edge Acquisition Error Status Falling Edge Error Register copied into Shift Register
1024x
Current
50mA 0.8mA
50mA
Global Error Flag
Cascading Devices
cascade multiple AS1113 devices, must connected next AS1113 (see Figure 21). each rising edge shift register will written into shift register next AS1113 chain. Note: When n*AS1113 devices chain, n*16 clock pulses needed latch-in input data. Figure Cascading AS1113 Devices
AS1113
AS1113
AS1113 #n-1
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Constant Current
display applications, AS1113 provides virtually current variations from channel-to-channel from AS1113-to-AS1113. This mostly factors:
While IOUT 10mA, maximum current skew less than between channels less than between AS1113 devices. saturation region, characteristic curve output stage flat (see Figure page Thus, output current kept constant regardless variations forward voltages (VF).
Adjusting Output Current
AS1113 scales reference current (IREF) external resistor (REXT) sink current (IOUT) each output port. shown Figure page output current saturation region extremely flat that possible define target current (IOUT TARGET). IOUT TARGET calculated VREXT 1.253V IREF VREXT/REXT other REXT connected ground) IOUT TARGET IREF*15 (1.253V/REXT)*15 Where: REXT resistance external resistor connected REXT. VREXT voltage REXT. magnitude current function REXT) around 50.52mA 25.26mA 744. Figure page shows relationship curve between IOUT TARGET each channel corresponding external resistor (REXT).
Package Power Dissipation
maximum allowable package power dissipation (PD) determined PD(MAX) (TJ-TAMB)/RTH(J-A) When output channels turned simultaneously, actual package power dissipation PD(ACT) (IDD*VDD) (IOUT*Duty*VDS*16) Therefore, keep PD(ACT) PD(MAX), maximum allowed output current function duty cycle IOUT Where:
Delayed Outputs
AS1113 graduated delay circuits between outputs. These delay circuits found between OUTNn constant current block. fixed delay time (typ) where OUTN0 delay, OUTN1 20ns delay, OUTN2 40ns delay OUTN15 300ns delay. This delay prevents large inrush currents, which reduce power supply bypass capacitor requirements when outputs turn (see Figure page
Switching-Noise Reduction
drivers frequently used switch-mode applications which normally exhibit switching noise parasitic inductance PCB.
Load Supply Voltage
Considering package power dissipation limits (see 4:6), AS1113 should operated within range 1.0V. example, VLED higher than high that PD(ACT) PD(MAX) where VLED this case, lowest possible supply voltage voltage reducer (VDROP) should used. voltage reducer allows (VLED -VF) VDROP. Note: Resistors zener diodes used voltage reducer shown Figure
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Figure Voltage Reducer using Resistor (Left) Zener Diode (Right)
Voltage Supply Voltage Supply
VLED
VDROP
VDROP
VLED
AS1113
AS1113
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Package Drawings Markings
AS1113 available 28-pin (5x5mm) package 24-pin SSOP package. Figure 28-pin (5x5mm) Packagee
INDEX AREA (D/2 xE/2)
D2/2
E2/2
-BSEE DETAIL
DETAIL
VIEW
INDEX AREA (D/2 xE/2)
Datum
BVIEW
0.08
Terminal TERMINAL SIDE
Symbol
0.70 0.00 0.45 0.03
0.75 0.02 0.20 0.55 0.15 0.10 0.10 0.05 0.08 0.10
0.80 0.05 0.65 0.15
Notes
Symbol
3.00 3.00 0.20 0.18
5.00 5.00 3.15 3.15 0.25 0.50
SIDE VIEW
SEATING PLANE
3.25 3.25 0.30
Notes
Notes:Unilateral coplanarity zone applies exposed heat sink slug well terminals. Dimensioning tolerancing conform ASME Y14.5M-1994. dimensions millimeters; angles degrees. total number terminals. terminal identifier terminal numbering convention shall conform JEDEC SPP-012. Details terminal identifier optional must located within zone indicated. terminal identifier either mold marked feature. Dimension applies metallized terminal measured between 0.15 0.30mm from terminal tip. terminal optional radius, dimension should measured that radius area. Dimensions refer number terminals each side, respectively.
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Data Sheet
Figure 24-pin SSOP Package
Symbol
1.35 1.75 0.10 0.25 1.37 1.57 0.20 0.30 0.19 0.25 8.55 8.74 5.79 6.20 3.81 3.99 0.635 0.22 0.49 0.40 1.27
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Ordering Information
device available standard products shown Table Table Ordering Information Type AS1113-BSSU AS1113-BSST AS1113-BQFR AS1113-BQFT Description 50mA, 16-Channel Driver with Diagnostics 50mA, 16-Channel Driver with Diagnostics 50mA, 16-Channel Driver with Diagnostics 50mA, 16-Channel Driver with Diagnostics Delivery Form Tubes Tape Reel Tray Tape Reel Package 24-pin SSOP 24-pin SSOP 28-pin (5x5mm) 28-pin (5x5mm)
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Data Sheet
Copyrights
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50mA, 16-Channel Driv General Description AS1113 designed dr

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