DALLAS (Oct. 1996) industry's first 3.3V IEEE 1149.1 (JTAG) boundary s

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DALLAS (Oct. 1996) industry's first 3.3V IEEE 1149.1 (JTAG) boundary s

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Industry's First 3.3-Volt IEEE 1149.1 Boundary Scan Test Controller Simplifies Embedded Test
DALLAS (Oct. 1996) industry's first 3.3V IEEE 1149.1 (JTAG) boundary scan embedded test controller (eTBC) available sample quantities from Texas Instruments (TI). Because smaller size, lower power simpler software interface eTBC, system designers will able implement system-level built test (BIT) much faster wider range systems, such servers, hubs, routers, bridges other internetworking products, telecommunications switches repeaters, faulttolerant computers high-end mass storage systems. TI's LVT8980 eTBC percent smaller than previous generation test controller, making boundary scan test easier design into compact, space-sensitive applications, including hand-held test devices. eTBC also features easy-to-program 8-bit interface microprocessor digital signal processor (DSP). embedded application, tests developed high-level programming language such C/C++ would initiated system's processor converted boundary scan's serial protocol eTBC. eTBC would then drive test vectors over boundary scan test path linking many integrated circuits on-board. addition, eTBCs TI's Addressable Scan Port (ASP) device placed multiple boards backplane perform system-level tests. "Since eTBC uses much less silicon able take advantage very efficient fabrication processes, believe eTBC will price/performance leader market," said Pradeep Bardia, TI's marketing manager JTAG/Boundary Scan Logic Products. "The smaller size, lower power simpler programming eTBC suddenly makes built test much more feasible systems where been considered past. This should open door another wave boundary scan applications, which will make many today's electronic systems more reliable maintainable." Boundary scan self-test capabilities becoming much more prevalent computer communications industries reliability maintainability become increasingly critical. Internetworking, telecommunications, fault-tolerant computers other high-availability systems have included boundary scan test some time, personal computers (PCs) other business systems also featuring this technology assuring reliability these systems. fact, specification requires that five IEEE 1149.1 (JTAG) test signals provisioned edge connectors motherboards. Computers communication equipment with boundary scan able monitor ongoing operation system, identify functional problem before adversely affects operation system notify human operators that malfunction corrected. Additionally, diagnostics from this uplinked service depot such that field service
personnel dispatched immediately with required replacement modules hand. Replacing malfunctioning device module will rapidly return system operation. TI's LVT8980 eTBC latest addition broadest family boundary scan integrated circuits industry. military version this device expected available first half 1997.
Pricing Availability
Production samples LVT8980 available from Texas Instruments authorized distributors. Suggested resale pricing quantities 1,000 anticipated under $10.
NOTES: JTAG/IEEE 1149.1-1990 standard, adopted February 1990, origins work Joint Test Action Group (JTAG). After forming organization Europe 1985, JTAG members began working develop economical test methodologies systems designed around complex assembled with surfacemount technologies. JTAG grew become international body members included representatives computer semiconductor manufacturers, universities U.S. Department Defense. After JTAG conferees developed specification four-wire serial scan test bus, IEEE 1149 Test Standards Committee adopted specification, prepared 1149.1 proposal managed process that standard. Texas Instruments supported specification since joined JTAG 1986, company taken leading role providing hardware, software design tools that back IEEE standard. JTAG/IEEE 1149.1-1990 standard also standard American National Standards Institute (ANSI).

DALLAS (Oct. 1996) industry's first 3.3V IEEE 1149.1 (JTAG) boundary s

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