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µPA502T N-CHANNEL (5-PIN CIRCUITS) µPA502T mini-mold device


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FIELD EFFECT TRANSISTOR
µPA502T
N-CHANNEL (5-PIN CIRCUITS)
µPA502T mini-mold device provided with circuits. achieves high-density mounting saves mounting costs.
PACKAGE DIMENSIONS millimeters)
0.32 +0.1 -0.05 0.65+0.1 -0.15 0.16+0.1 -0.06
source common circuits package same size SC-59 Complement µPA503T Automatic mounting supported
±0.2
FEATURES
0.95
0.95
±0.2
CONNECTION (Top view)
ABSOLUTE MAXIMUM RATINGS
PARAMETER Drain Source Voltage Gate Source Voltage Drain Current (DC) Drain Current (pulse) Total Power Dissipation Channel Temperature Storage Temperature SYMBOL VDSS VGSS ID(DC) ID(pulse)* Tstg RATINGS (TOTAL) UNIT
Duty Cycle
Document G11238EJ1V0DS00 (1st edition) Date Published June 1996 Printed Japan
1996
µPA502T
ELECTRICAL CHARACTERISTICS
PARAMETER Drain Cut-off Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain Source On-State Resistance Drain Source On-State Resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time td(off) SYMBOL IDSS IGSS VGS(off) |yfs| RDS(on)1 RDS(on)2 Ciss Coss Crss td(on) VGS(on) TEST CONDITIONS MIN. TYP. MAX. ±1.0 UNIT
Marking:
SWITCHING TIME MEASUREMENT CIRCUIT MEASUREMENT CONDITIONS (RESISTANCE LOADED)
Gate Voltage Waveform
VGS(on)
Drain Current Waveform
Duty Cycle
td(on)
td(off) toff
µPA502T
TYPICAL CHARACTERISTICS
DERATING FACTOR FORWARD BIAS SAFE OPERATING AREA Free
Total Power Dissipation
TOTAL POWER DISSIPATION AMBIENT TEMPERATURE
Derating factor
Case Temperature DRAIN CURRENT DRAIN SOURCE VOLTAGE
Drain Current
Ambient Temperature
TRANSFER CHARACTERISTICS 1000 Pulsed measurement
Pulsed measurement
Drain Current
Drain Source Voltage GATE SOURCE CUT-OFF VOLTAGE CHANNEL TEMPERATURE
VGS(off) Gate Cut-off Voltage
Gate Source Voltage FORWARD TRANSFER ADMITTANCE DRAIN CURRENT
|yfs| Forward Transfer Admittance
1000 Channel Temperature Drain Current
µPA502T
RDS(on) Drain Source On-State Resistance
DRAIN SOURCE ON-STATE RESISTANCE GATE SOURCE VOLTAGE
RDS(on) Drain Source On-State Resistance
DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT 1000 Pulsed measurement
Pulsed measurement
1000
Gate Source Voltage
Drain Current
RDS(on) Drain Source On-State Resistance
DRAIN SOURCE ON-STATE RESISTANCE CHANNEL TEMPERATURE Pulsed measurement
CAPACITANCE DRAIN SOURCE VOLTAGE
Ciss, Coss, Crss Capacitance
Ciss Coss Crss
Channel Temperature
Drain Source Voltage SOURCE DRAIN DIODE FORWARD VOLTAGE
SWITCHING CHARACTERISTICS
td(on), td(off), Switching Time
td(off)
Drain Current
td(on)
Drain Current
Source Drain Voltage
µPA502T
REFERENCE
Document Name semiconductor device reliability/quality control system Quality grade semiconductor devices Semiconductor device mounting technology manual Guide quality assurance semiconductor devices Semiconductor selection guide Document TEI-1202 IEI-1209 C10535E MEI-1202 X10679E
µPA502T
part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customer must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact Sales Representative advance. Anti-radioactive design implemented this product.
94.11

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