µPA572T N-CHANNEL (5-PIN CIRCUITS) SWITCHING µPA572T super-m

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µPA572T N-CHANNEL (5-PIN CIRCUITS) SWITCHING µPA572T super-m

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FIELD EFFECT TRANSISTOR
µPA572T
N-CHANNEL (5-PIN CIRCUITS) SWITCHING
µPA572T super-mini-mold device provided with circuits. achieves high-density mounting saves mounting costs.
PACKAGE DIMENSIONS millimeters)
+0.1 0.15
+0.1 -0.05
FEATURES
source common circuits package same size SC-70 Directly driven power supply Automatic mounting supported
0.65 ±0.2 0.65
1.25 ±0.1
±0.1
±0.1
EQUIVALENT CIRCUIT
CONNECTION Gate (G1) Source (common) Gate (G2) Drain (D2) Drain (D1) Marking:
ABSOLUTE MAXIMUM RATINGS
PARAMETER Drain Source Voltage Gate Source Voltage Drain Current (DC) Drain Current (pulse) Total Power Dissipation Channel Temperature Operating Temperature Storage Temperature SYMBOL VDSS VGSS ID(DC) ID(pulse) Topt Tstg Duty Cycle TEST CONDITIONS RATINGS ±100 ±200 (Total) +150 UNIT
Document G11244EJ1V0DS00 (1st edition) Date Published June 1996 Printed Japan
1996
µPA572T
ELECTRICAL CHARACTERISTICS
PARAMETER Drain Cut-off Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain Source On-State Resistance Drain Source On-State Resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time SYMBOL IDSS IGSS VGS(off) |yfs| RDS(on)1 RDS(on)2 Ciss Coss Crss td(on) td(off) VGS(on) TEST CONDITIONS MIN. TYP. MAX. ±3.0 UNIT
SWITCHING TIME MEASUREMENT CIRCUIT CONDITIONS (RESISTANCE LOADED)
Gate voltage waveform VGS(on)
Drain current waveform Duty Cycle
td(on)
td(off) toff
µPA572T
TYPICAL CHARACTERISTICS
DERATING FACTOR FORWARD BIAS SAFE OPERATING AREA TOTAL POWER DISSIPATION AMBIENT TEMPERATURE Total power dissipation
Total Power Dissipation
Derating Factor
Case Temperature
Ambient Temperature
TRANSFER CHARACTERISTICS Pulsed measurement
GATE SOURCE CUTOFF VOLTAGE CHANNEL TEMPERATURE
VGS(off) Gate Cut-off Voltage
Drain Current
0.01
0.001
Gate Source Voltage
Channel Temperature
|yfs| Forward Transfer Admittance
Pulsed measurement Drain Current
RDS(on) Drain Source On-State Resistance
FORWARD TRANSFER ADMITTANCE DRAIN CURRENT
DRAIN SOURCE ON-STATE RESISTANCE GATE SOURCE VOLTAGE Pulsed measurement
Gate Source Voltage
µPA572T
DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT Pulsed measurement DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT Pulsed measurement
RDS(on) Drain Source On-State Resistance
RDS(on) Drain Source On-State Resistance
Drain Current
Drain Current
CAPACITANCE DRAIN SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
td(on), td(off), Switching Time
Ciss, Coss, Crss Capacitance
td(off)
Ciss Coss
td(on)
Crss
Drain Current
Drain Source Voltage
SOURCE DRAIN DIODE FORWARD VOLTAGE Pulsed measurement
DRAIN CURRENT DRAIN SOURCE VOLTAGE
Source Drain Current
Drain Current
Source Drain Voltage
Drain Source Voltage
µPA572T
REFERENCE
Document Name semiconductor device reliability/quality control system Quality grade semiconductor devices Semiconductor device mounting technology manual Guide quality assurance semiconductor devices Semiconductor selection guide Document TEI-1202 IEI-1209 C10535E MEI-1202 X10679E
µPA572T
part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customer must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact Sales Representative advance. Anti-radioactive design implemented this product.
94.11

µPA572T N-CHANNEL (5-PIN CIRCUITS) SWITCHING µPA572T super-m

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