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2SK3299 DESCRIPTION 2SK3299 N-Channel device that features g
Top Searches for this datasheetFIELD EFFECT TRANSISTOR 2SK3299 DESCRIPTION 2SK3299 N-Channel device that features gate charge excellent switching characteristics, designed high voltage applications such switching power supply, adapter. ORDERING INFORMATION PART NUMBER 2SK3299 2SK3299-S 2SK3299-ZJ PACKAGE TO-220AB TO-262 TO-263 FEATURES gate charge TYP. (VDD voltage rating on-state resistance RDS(on) 0.75 MAX. (VGS capability ratings mount package available ABSOLUTE MAXIMUM RATINGS 25°C) Drain Source Voltage (VGS Gate Source Voltage (VDS Drain Current (DC) 25°C) Drain Current (Pulse) Note1 VDSS VGSS ID(DC) ID(pulse) Tstg +150 66.7 Total Power Dissipation 25°C) Total Power Dissipation 25°C) Channel Temperature Storage Temperature Single Avalanche Current Single Avalanche Energy Note2 Note2 Notes Duty Cycle Starting 25°C, information this document subject change without notice. Before using this document, please confirm that this latest version. devices/types available every country. Please check with local representative availability additional information. Document D14060EJ1V0DS00 (1st edition) Date Published April 2000 CP(K) Printed Japan mark shows major revised points. 1999,2000 2SK3299 ELECTRICAL CHARACTERISTICS(TA 25°C) CHARACTERISTICS Drain Leakage Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain Source On-state Resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate Source Charge Gate Drain Charge Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge SYMBOL IDSS IGSS VGS(off) RDS(on) Ciss Coss Crss td(on) td(off) VF(S-D) di/dt A/µs TEST CONDITIONS VGS(on) 0.68 1580 12.3 0.75 MIN. TYP. MAX. ±100 UNIT TEST CIRCUIT AVALANCHE CAPABILITY D.U.T. BVDSS TEST CIRCUIT SWITCHING TIME D.U.T. Wave Form VGS(on) Wave Form Duty Cycle td(on) td(off) toff Starting TEST CIRCUIT GATE CHARGE D.U.T. Data Sheet D14060EJ1V0DS00 2SK3299 TYPICAL CHARACTERISTICS DRAIN CURRENT DRAIN SOURCE VOLTAGE Pulsed FORWARD TRANSFER CHARACTERISTICS Drain Current Drain Source Voltage Drain Current Pulsed 0.01 Gate Source Voltage GATE SOURCE CUTOFF VOLTAGE CHANNEL TEMPERATURE FORWARD TRANSFER ADMITTANCE DRAIN CURRENT VGS(off) Gate Source Cutoff Voltage Forward Transfer Admittance Pulsed Channel Temperature Drain Current (on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE GATE SOURCE VOLTAGE Pulsed RDS(on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT Pulsed Drain Current Gate Source Voltage Data Sheet D14060EJ1V0DS00 2SK3299 (on) Drain Source On-state Resistance DRAIN SOURCE ON-STATE RESISTANCE CHANNEL TEMPERATURE SOURCE DRAIN DIODE FORWARD VOLTAGE Diode Forward Current Pulsed Channel Temperature 0.01 Pulsed Source Drain Voltage CAPACITANCE DRAIN SOURCE VOLTAGE 10000 td(on), td(off), Switching Time SWITCHING CHARACTERISTICS td(off) td(on) Ciss, Coss, Crss Capacitance Ciss 1000 Coss Crss VGS= 1000 Drain Source Voltage Drain Current REVERSE RECOVERY TIME DRAIN CURRENT Reverse Recovery Time Drain Source Voltage 0.01 Drain Current Gate Charge Data Sheet D14060EJ1V0DS00 Gate Source Voltage di/dt A/µs DYNAMIC INPUT/OUTPUT CHARACTERISTICS 2SK3299 DERATING FACTOR FORWARD BIAS SAFE OPERATING AREA TOTAL POWER DISSIPATION CASE TEMPERATURE Percentage Rated Power Total Power Dissipation Channel Temperature Case Temperature FORWARD BIAS SAFE OPERATING AREA ID(pulse) Drain Current ID(DC) 25°C Single Pulse Drain Source Voltage TRANSIENT THERMAL RESISTANCE PULSE WIDTH Rth(t) Transient Thermal Resistance °C/W Rth(CH-A) 83.3 °C/W Rth(CH-C) 1.67 °C/W 0.01 100m Pulse Width Data Sheet D14060EJ1V0DS00 2SK3299 SINGLE AVALANCHE ENERGY INDUCTIVE LOAD SINGLE AVALANCHE ENERGY DERATING FACTOR Single Avalanche Energy Energy Defrating Factor Starting Inductive Load Starting Starting Channel Temperature Data Sheet D14060EJ1V0DS00 2SK3299 PACKAGE DRAWINGS (Unit 1)TO-220AB (MP-25) 3.0±0.3 10.6 MAX. 10.0 MIN. 15.5 MAX. MAX. 2)TO-262 (MP-25 Cut) 1.0±0.5 3.6±0.2 MAX. 1.3±0.2 1.3±0.2 (10) MAX. 1.3±0.2 1.3±0.2 12.7 MIN. 12.7 MIN. 8.5±0.2 0.75±0.3 2.54 TYP. 0.5±0.2 2.54 TYP. 1.Gate 2.Drain 3.Source 4.Fin (Drain) 2.8±0.2 0.75±0.1 2.54 TYP. 0.5±0.2 2.54 TYP. 1.Gate 2.Drain 3.Source 4.Fin (Drain) 2.8±0.2 3)TO-263 (MP-25ZJ) (10) 1.0±0.5 8.5±0.2 MAX. 1.3±0.2 EQUIVALENT CIRCUIT Drain 5.7±0.4 1.4±0.2 0.7±0.2 2.54 TYP. 2.54 TYP. 0.5±0.2 Gate Body Diode Remark Strong electric field, when exposed this device, cause destruction gate oxide ultimately degrade device operation. Steps must taken stop generation static electricity much possible, quickly dissipate once, when occurred. 2.8±0.2 1.Gate 2.Drain 3.Source 4.Fin (Drain) Source Data Sheet D14060EJ1V0DS00 2SK3299 information this document subject change without notice. Before using this document, please confirm that this latest version. part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. Descriptions circuits, software, other related information this document provided illustrative purposes semiconductor product operation application examples. incorporation these circuits, software, information design customer's equipment shall done under full responsibility customer. Corporation assumes responsibility losses incurred customer third parties arising from these circuits, software, information. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customers must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact sales representative advance. 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