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REVISIONS DESCRIPTION Redrawn with changes. device type Changes accordance with N.O.R. 5962-R089-96. Redrawn with changes table device type radiation hardened information. Make changes 3.1, 3.5.1, 6.6.3. radiation hardness assurance level devices. DATE (YR-MO-DA) 95-10-31 96-03-28 97-10-14 99-05-25 00-02-15 00-08-08 01-05-03 APPROVED Frye Frye Raymond Monnin Raymond Monnin Monnin Monnin Monnin
case outline
ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED. CURRENT CAGE CODE 67268
SHEET SHEET STATUS SHEETS PMIC SHEET
PREPARED Monica Poelking CHECKED Charles Besore
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216
APPROVED Michael Frye
MICROCIRCUIT, LINEAR, QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
DRAWING APPROVAL DATE 79-01-26 REVISION LEVEL
SIZE SHEET CAGE CODE
AMSC
14933
78020
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E375-01
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following example: 5962 Federal stock class designator designator (see 1.2.1) Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number 26LS32 26LS33 26LS32A 26LS33A 26F32 26LS32 Circuit function Quad, differential line receiver Quad, differential line receiver Quad, differential line receiver Quad, differential line receiver Quad, differential line receiver Quad, differential line receiver 78020 Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5)
1.2.3 Device class designator. device class designator single letter identifying product assurance level follows: Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP1-T16 CDIP2-T16 GDFP2-F16 CDFP3-F16 GDFP1-G16 CQCC1-N20 Terminals Package style Dual-in-line Flat package Flat pack with gullwing leads Square leadless chip carrier
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class Input voltage range (differential common mode) Input sensitivity Input voltage range (differential common mode) Input sensitivity
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
Absolute maximum ratings. Power supply voltage (VCC) Common mode range. Differential input voltage Enable voltage. Output sink current Storage temperature range Power dissipation (PD) Lead temperature (soldering, seconds). Junction temperature (TJ). Thermal resistance, junction-to-ambient (JA): -65°C +150°C +300°C +150°C Device type 100°C/W 142°C/W 87°C/W
Thermal resistance, junction-to-case (JC) MIL-STD-1835 Device types Case outline 100°C/W Case outlines 140°C/W Case outline 130°C/W Recommended operating conditions. Supply voltage range (VCC) +4.5 +5.5 Minimum high level input voltage (VIH) Maximum level input voltage (VIL) Input hysteresis HYST) typical Ambient operating temperature range -55°C +125°C Radiation features. Maximum total dose available(Dose rate rads (Si)/s) Krads(Si) APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-1835 Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines.
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. Must withstand added short circuit test, e.g., IOS. These parts dose rate sensitive space environment demonstrate enhanced dose rate effects. Radiation point limits noted parameters guaranteed only conditions specified MIL-STD-883, method 1019, condition
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings. Standard Microcircuit Drawings.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. This drawing been modified allow manufacturer alternate die/fabrication requirements paragraph A.3.2.2 MIL-PRF-38535 other alternative approved Qualifying Activity. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outline(s). case outline(s) shall accordance with 1.2.4 herein. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Test circuit switching waveforms. test circuit switching waveforms shall specified figure 3.2.4 Radiation exposure circuit. radiation exposure circuit shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full ambient operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table IIA. electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix class product built accordance with A.3.2.2 MIL-PRF-38535, "QD" certification mark shall used place "QML" certification mark. Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-PRF-38535, appendix Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix 3.11 supersession information. supersession information shall specified appendix. QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4).
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE Electrical performance characteristics. Test Symbol Conditions -55°C +125°C unless otherwise specified VOUT VOH, VOUT VOH, Input resistance (one input ground) 01,02 03,04 Input current (under test) (other input M,D,P,L,R (other input M,D,P,L,R (other input (other input Output high voltage (3006) ENABLE -440 M,D,P,L,R Output voltage (3007) ENABLE -1.0 M,D,P,L,R ENABLE -1.0 M,D,P,L,R 0.45 0.45 -2.8 01,02, 05,06 03,04 -2.8 -2.8 12.0 14.0 M,D,P,L,R Group subgroups Device type 01,03, 05,06 02,04 Unit Limits -0.2 -0.2 -0.5 +0.2 +0.2 +0.5
Differential input voltage sensitivity
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE Electrical performance characteristics. Continued. Test Symbol Conditions -55°C +125°C unless otherwise specified M,D,P,L,R M,D,P,L,R Enable current (3009) Enable high current sensitivity (3010) Output short circuit current (3011) Supply current (3005) data inputs GND, outputs disabled 01-04, M,D,P,L,R Enable input high current 01-04, Propagation delay, input output (3003) tPLH figure 03,04 01,02 -0.36 Group subgroups Device type -1.5 Unit Limits
Enable voltage Enable high voltage Enable clamp voltage (3022) Off-state (high impedance) output output current (3021)
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE Electrical performance characteristics Continued. Test Symbol Conditions -55°C +125°C unless otherwise specified figure Group subgroups tPHL Output disable time, ENABLE output (3003) tPLZ figure 03,04 01,02 03,04 01,02 Device type Unit Limits
Propagation delay, input output (3003)
tPLH
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE Electrical performance characteristics Continued. Test Symbol Conditions -55°C +125°C unless otherwise specified figure Group subgroups Output enable time, ENABLE output (3003) tPZL figure 03,04 01,02 03,04 Device type 01,02 Unit Limits
Output disable time, ENABLE output (3003)
tPHZ
footnotes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE Electrical performance characteristics Continued. Test Symbol Conditions -55°C +125°C unless otherwise specified figure Group subgroups 9,11 03,04 Device type 01,02 Unit Limits
Output enable time, ENABLE output (3003)
tPZH
Devices supplied this drawing will meet levels irradiation. However, this device only tested level. post irradiation values identical unless otherwise specified table When performing post irradiation electrical measurements level, +25°C. These parts dose rate sensitive space environment demonstrate enhanced dose rate effects. Radiation point limits noted parameters guaranteed only conditions specified MIL-STD-883, method 1019, condition Guaranteed design. tests required shall applied forcing functions tests. These limits tested. limits specified input current represent numerical range which this parameter will pass: -0.36 +0.10. more than output should shorted time duration short circuit condition should exceed second. This parameter guaranteed correlation testing
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
Case outlines Device types Terminal number
Terminal symbol INPUT AINPUT OUTPUT ENABLE OUTPUT INPUT INPUT CGND INPUT DINPUT OUTPUT ENABLE OUTPUT INPUT INPUT BVCC
INPUT AINPUT OUTPUT ENABLE OUTPUT INPUT INPUT CGND INPUT DINPUT OUTPUT ENABLE OUTPUT INPUT INPUT BVCC
FIGURE Terminal connections.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
Parameter tPLH tPHL tPZL tPZH tPLZ tPHZ
Switch matrix Closed Closed Closed Open Closed Closed
Closed Closed Open Closed Closed Closed
NOTES: Pulse generator, rate MHz, diodes, 1N916 1N3064
FIGURE Test circuit timing waveforms.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
FIGURE Test circuit timing waveforms continued.
FIGURE Radiation exposure circuit.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
TABLE IIA. Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) 1,2,3,9 1,2,3,4,5,6, 9,10,11 1,2,3 1,2,3 Subgroups accordance with MIL-PRF-38535, table III) Device class 1,2,3,9 1,2,3,4,5,6, 9,10,11 1,2,3 1,2,3 Device class 1,2,3,9 1,2,3,4,5,6, 9,10,11 1,2,3 1,2,3
applies subgroup applies subgroups delta limits. Delta limits shall accordance with table shall computed with reference previous interim electrical parameters. Subgroups tested, shall guaranteed specified limits table
TABLE IIB. Delta limits +25°C. Parameter Device type Limit 0.28
These parameters shall read recorded +25°C before after each burn-in shall change more than limits indicated. delta rejects shall included calculation. Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection. Tests shall specified table herein. Subgroups table method 5005 MIL-STD-883 shall omitted.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). levels device classes shall specified MIL-PRF-38535. End-point electrical parameters shall specified table herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall performed accordance with MIL-STD-883 method 1019, condition specified herein. 4.4.4.1.1 Accelerated aging test. Accelerated aging tests shall performed devices requiring level greater than rads(Si). post-anneal end-point electrical parameter limits shall specified table herein shall pre-irradiation end-point electrical parameter limit 25°C ±5°C. Testing shall performed initial qualification after design process changes which affect response device. PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor prepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
Comments. Comments this drawing should directed DSCC-VA Columbus, Ohio 43216-5000, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA. 6.6.3 Caution designers. Device type (26LS32) previously supplied vendor 27014 (National Semiconductor) manufactured without failsafe input/output design (output always high when inputs open) which common device type supplied vendors 34335 (Advanced Micro Devices, Inc.) 01295 (Texas Instruments). This difference require variations system circuit design when substitution between vendors made. Vendor 0C7V7 (Qualified Parts Laboratory, Inc.) supplying device type with failsafe input/output design.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
APPENDIX SCOPE 10.1 Scope. This appendix contains supersession information support part part number system. system designs, after date this document shall used lieu PIN. existing system designs prior date this document used lieu PIN. This mandatory part specification. information contained herein intended compliance. supersession data shall specified APPLICABLE DOCUMENTS. This section applicable this appendix. SUPERSESSION DATA 5962-7802001MEX 5962-7802001MFX 5962-7802001M2X 5962-7802002MEX 5962-7802002MFX 5962-7802002M2X 5962-7802003MEX 5962-7802003MFX 5962-7802003M2X 5962-7802004MEX 5962-7802004MFX 5962-7802004M2X 7802001EX 7802001FX 78020012X 7802002EX 7802002FX 78020022X 7802003EX 7802003FX 78020032X 7802004EX 7802004FX 78020042X
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
78020
SHEE
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 01-05-03 Approved sources supply 78020 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535. Standard microcircuit drawing 5962-7802001MEA 5962-7802001MFA 5962-7802001M2A 5962-7802002MEA 5962-7802002MFA 5962-7802002M2A 5962-7802003MEA 5962-7802003MFA 5962-7802003M2A 5962-7802004MEA 5962-7802004MFA 5962-7802004M2A 5962-7802005MEA 5962-7802005MFA 5962-7802005MZA 5962-7802005M2A Vendor CAGE number 0C7V7 Vendor similar 26LS32/BEA
0C7V7
26LS32/BFA
0C7V7
26LS32/B2A
0C7V7 0C7V7 0C7V7 01295 01295 01295 01295 01295 01295 27014 27014 27014 27014
26LS33/BEA 26LS33/BFA 26LS33/B2A AM26LS32AMJB AM26LS32AMWB AM26LS32AMFKB AM26LS33AMJB AM26LS33AMWB AM26LS33AMFKB DS26F32MJ/883 DS26F32MW/883 DS26F32MWG/883 DS26F32ME/883
STANDARD MICROCIRCUIT DRAWING BULLETIN continued.
Standard microcircuit drawing 5962-7802006QEA 5962-7802006QFA 5962-7802006Q2A 5962F7802005Q2A 5962F7802005QEA 5962F7802005QFA 5962F7802005VEA 5962F7802005VFA 5962R7802005Q2A 5962R7802005QEA 5962R7802005QFA 5962R7802005VEA 5962R7802005VFA 5962R7802005VZA 5962-7802005VEA 5962-7802005VFA
Vendor CAGE number 27014 27014 27014 27014 27014 27014 27014 27014 27014 27014 27014
Vendor similar DS26LS32MJ/883 DS26LS32MW/883 DS26LS32ME/883 DS26F32MEF-QML DS26F32MJF-QML DS26F32MWF-QML DS26F32MJFQMLV DS26F32MWFQMLV DS26F32MER-QML DS26F32MJR-QML DS26F32MWR-QML DS26F32MJRQMLV DS26F32MWRQMLV DS26F32MWGRQMLV DS26F32MJ-QMLV DS26F32MW-QMLV
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. Caution. device type previously supplied vendor 27014 (National Semiconductor) manufactured without failsafe input/output design (output always high when inputs open) which common device type supplied vendors 34335 (Advanced Micro Devices, Inc.) 01295 (Texas Instruments). This difference require variations system circuit design when substitution between vendors made. Vendor 0C7V7 (Qualified Parts Laboratory, Inc.) supplying device type with failsafe input/output design. available from approved source supply.
STANDARD MICROCIRCUIT DRAWING BULLETIN continued.
Vendor CAGE number 0C7V7
Vendor name address Qualified Parts Laboratory 3605 Kifer Road Santa Clara, 95051 National Semiconductor 2900 Semiconductor Drive P.O. 58090 Santa Clara, 95052-8090 Texas Instruments, Inc. Semiconductor Group 8505 Forest Lane P.O. 660199 Dallas, 75243 Point contact: 6412 Highway South Sherman, 75090-9493
27014
01295
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.

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