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2SJ495 SWITCHING P-CHANNEL POWER INDUSTRIAL DESCRIPTION
Top Searches for this datasheetFIELD EFFECT POWER TRANSISTORS 2SJ495 SWITCHING P-CHANNEL POWER INDUSTRIAL DESCRIPTION This product P-Channel Field Effect Transistor designed high current switching applications. PACKAGE DIMENSIONS millimeter) 10.0 FEATURES Super On-State Resistance RDS(on)2 MAX. (VGS Ciss Ciss 4120 TYP. Built-in Gate Protection Diode ABSOLUTE MAXIMUM RATINGS 25°C) Drain Source Voltage Gate Source Voltage* Gate Source Voltage Drain Current (DC) Drain Current (pulse)** Total Power Dissipation 25°C) Total Power Dissipation 25°C) Channel Temperature Storage Temperature kHz, Duty Cycle (+Side) **PW Duty Cycle VDSS VGSS(AC) VGSS(DC) ID(DC) ID(pulse) Tstg -20, m120 +150 2.54 13.5 MIN. 0.65 Gate Drain Source Drain Body Diode Source 2.54 THERMAL RESISTANCE Channel Case Channel Ambient Rth(ch-c) Rth(ch-A) 3.57 62.5 °C/W °C/W MP-45F (ISOLATED TO-220) Gate Gate Protection Diode diode connected between gate source transistor serves protector against ESD. When this deveice acutally used, addtional protection circiut externally required voltage exceeding rated voltage applied this device. Document D11267EJ2V0DS00 (2nd edition) Date Published November 1997 Printed Japan 12.0 RDS(on)1 MAX. (VGS 15.0 1997 2SJ495 ELECTRICAL CHARACTERISTICS 25°C) CHARACTERISTICS Drain Source On-state Resistance SYMBOL RDS(on)1 RDS(on)2 Gate Source Cutoff Voltage Forward Transfer Admittance Drain Leakage Current Gate Source Leakage Current Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate Source Charge Gate Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS(off) IDSS IGSS Ciss COSS Crss td(on) td(off) VF(S-D) TEST CONDITIONS VGS(on) di/dt A/µs 4120 1750 -1.0 MIN. TYP. -1.5 MAX. -2.0 UNIT Test Circuit Switching Time Test Circuit Gate Charge D.U.T. Wave Form VGS(on) D.U.T. Duty Cycle Wave Form td(on) toff td(off) 2SJ495 DERATING FACTOR FORWARD BIAS SAFE OPERATING AREA Percentage Rated Power Total Power Dissipation TOTAL POWER DISSIPATION CASE TEMPERATURE Case Temperature Case Temperature DRAIN CURRENT DRAIN SOURCE VOLTAGE Pulsed -125 FORWARD BIAS SAFE OPERATING AREA -1000 ID(pulse) Drain Current Drain Current -100 -100 ID(DC) -0.1 25°C Single Pulse -100 Drain Source Voltage Drain Source Voltage FORWARD TRANSFER CHARACTERISTICS -1000 Pulsed -25°C 25°C 125°C Drain Current -100 Gate Source Voltage 2SJ495 TRANSIENT THERMAL RESISTANCE PULSE WIDTH rth(t) Transient Thermal Resistance °C/W Rth(ch-a) 62.5°C/W Rth(ch-c) 3.57°C/W 0.01 Single Pulse 0.001 Pulse Width RDS(on) Drain Source On-State Resistance FORWARD TRANSFER ADMITTANCE DRAIN CURRENT Forward Transfer Admittance 1000 Pulsed DRAIN SOURCE ON-STATE RESISTANCE GATE SOURCE VOLTAGE Pulsed Tch=-25°C 25°C 75°C 125°C -100 -1000 Drain Current RDS(on) Drain Source On-State Resistance Gate Source Voltage GATE SOURCE CUTOFF VOLTAGE CHANNEL TEMPERATURE DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT VGS(off) Gate Source Cutoff Voltage Pulsed -2.0 -1.5 -1.0 -0.5 Channel Temperature Drain Current -100 2SJ495 RDS(on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE CHANNEL TEMPERATURE VGS=-10 -1000 SOURCE DRAIN DIODE FORWARD VOLTAGE Pulsed Diode Forward Current -100 -1.0 -2.0 -3.0 Channel Temperature Source Drain Voltage CAPACITANCE DRAIN SOURCE VOLTAGE 100000 Ciss, Coss, Crss Capacitance td(on), td(off), Switching Time SWITCHING CHARACTERISTICS 10000 Ciss td(off) 1000 Coss Crss -100 td(on) -0.1 -0.1 -100 Drain Source Voltage Drain Current REVERSE RECOVERY TIME DRAIN CURRENT 1000 Reverse Recovery Time di/dt Drain Source Voltage VDD=-48 -0.1 -100 Diode Current Gate Charge Gate Source Voltage DYNAMIC INPUT/OUTPUT CHARACTERISTICS -30A 2SJ495 Document Name semicondacter device reliabilty/quality control system Power features application switching power supply Application circuits using Power Safe operating area Power Guide prevent damage semiconductor devices electrostatic discharge (EDS) Document C11745E D12971E TEA-1035 TEA-1037 C11892E 2SJ495 [MEMO] 2SJ495 part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customers must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact sales representative advance. 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