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µPA1753 SWITCHING DUAL N-CHANNEL POWER INDUSTRIAL DESCRIPTIO
Top Searches for this datasheetFIELD EFFECT POWER TRANSISTORS µPA1753 SWITCHING DUAL N-CHANNEL POWER INDUSTRIAL DESCRIPTION This product Dual N-Channel Field Effect Transistor designed power management application notebook computers, Li-ion battery application. PACKAGE DIMENSIONS (in: millimeter) Source Gate Drain Source Gate Drain 1.44 FEATURES Dual MOSFET chips small package Gate Drive Type On-Resistance RDS(on)1 Max. (VGS RDS(on)2 Max. (VGS Max. 5.37 Max. +0.10 -0.05 ±0.3 Ciss Ciss Typ. Built-in Protection Diode Small Surface Mount Package (Power SOP8) 0.15 0.05 Min. ±0.2 0.10 1.27 0.40 0.78 Max. 0.12 +0.10 -0.05 ABSOLUTE MAXIMUM RATINGS terminals connected) Drain Source Voltage Gate Source Voltage Drain Current (DC) Drain Current (pulse)Note Total Power Dissipation unit)Note Total Power Dissipation unit)Note Channel Temperature Storage Temperature VDSS VGSS ID(DC) ID(pulse) Tstg ±8.0 ±6.0 +150 Gate Protection Diode Gate Drain Body Diode Source Notes Duty Cycle Mounted ceramic substrate 2000 diode connected between gate source transistor serves protector against ESD. When this device acutally used, additional protection circuit externally required voltage exceeding rated voltage applied this device. information this document subject change without notice. Document D11496EJ2V0DS00 (2nd edition) Date Published October 1996 Printed Japan 1996 µPA1753 ELECTRICAL CHARACTERISTICS terminals connected) Characteristics Drain Source On-state Resistance Symbol RDS(on)1 RDS(on)2 Gate Source Cutoff Voltage Forward Transfer Admittance Drain Leakage Current Gate Source Leakage Current Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate Source Charge Gate Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS(off) |yfs| IDSS IGSS Ciss Coss Crss td(on) td(off) VF(S-D) di/dt A/µs Test Conditions ±8.0 VGS(on) 18.6 Min. Typ. 0.76 Max. Unit Test Circuit Switching Time Test Circuit Gate Charge D.U.T. Wave Form D.U.T. VGS(on) Wave Form Duty Cycle td(on) td(off) toff µPA1753 DERATING FACTOR FORWARD BIAS SAFE OPERATING AREA TOTAL POWER DISSIPATION AMBIENT TEMPERATURE Total Power Dissipation W/package unit unit Mounted ceramic substrate 2000 Percentage Rated Power Ambient Temperature Ambient Temperature DRAIN CURRENT DRAIN SOURCE VOLTAGE Pulsed FORWARD BIAS SAFE OPERATING AREA Mounted ceramic substrate 2000 unit Drain Current ID(pulse) ID(DC) Drain Current Single Pulse 0.25 0.75 Drain Source Voltage Drain Source Voltage FORWARD TRANSFER CHARACTERISTICS Pulsed Drain Current Gate Source Voltage µPA1753 TRANSIENT THERMAL RESISTANCE PULSE WIDTH rth(t) Transient Thermal Resistance °C/W 0.01 0.001 Mounted ceramic substrate 2000 Single Pulse unit Pulse Width FORWARD TRANSFER ADMITTANCE DRAIN CURRENT |yfs| Forward Transfer Admittance Pulsed RDS(on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE GATE SOURCE VOLTAGE Pulsed Drain Current RDS(on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE DRAIN CURRENT Gate Source Voltage GATE SOURCE CUTOFF VOLTAGE CHANNEL TEMPERATURE VGS(off) Gate Source Cutoff Voltage Pulsed Channel Temperature Drain Current µPA1753 RDS(on) Drain Source On-State Resistance DRAIN SOURCE ON-STATE RESISTANCE CHANNEL TEMPERATURE SOURCE DRAIN DIODE FORWARD VOLTAGE Pulsed Diode Forward Current Channel Temperature CAPACITANCE DRAIN SOURCE VOLTAGE Source Drain Voltage SWITCHING CHARACTERISTICS 10000 td(on), td(off), Switching Time Ciss, Coss, Crss Capacitance td(off) 1000 Ciss Coss Crss td(on) VGS(on) Drain Source Voltage Drain Current REVERSE RECOVERY TIME DRAIN CURRENT di/dt =100 Reverse Recovery Time Drain Source Voltage Diode Current Gate Charge Gate Source Voltage DYNAMIC INPUT/OUTPUT CHARACTERISTICS µPA1753 REFERENCE Document Name semiconductor device reliability/quality control system Quality grade semiconductor devices Semiconductor device mounting technology manual Semiconductor device package manual Guide quality assurance semiconductor devices Semiconductor selection guide Power features application switching power supply Application circuits using Power Safe operating area Power Document TEI-1202 C11531E C10535E C10943X MEI-1202 X10679E TEA-1034 TEA-1035 TEA-1037 µPA1753 [MEMO] µPA1753 part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customers must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact sales representative advance. 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