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PARALLEL REGISTER WITH ENABLE F378 6-bit register with buffered c


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MILITARY DATA SHEET MN54F378-X
PARALLEL REGISTER WITH ENABLE
F378 6-bit register with buffered common Enable. This device similar F174, with common Enable rather than common Master Reset. Original Creation Date: 04/29/96 Last Update Date: 07/30/96 Last Major Revision Date: 04/29/96
Industry Part Number
54F378
Part Numbers
54F378DM 54F378DMQB 54F378FMQB 54F378LMQB
Prime
M378
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F378-X
MILITARY DATA SHEET
Features
6-Bit High-Speed Parallel Register Positive Edge-Triggered D-Type Inputs Fully Buffered Common Clock Enable Inputs Input Clamp Diodes Limit High-Speed Termination Effects Full CMOS Compatible
MN54F378-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note -30mA +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) -0.5V -0.5V +5.5V twice rated Iol(mA) Note Note Absolute Maximum ratings those values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs.
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F378-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, Temp range: SYMBOL IBVI ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V VCC=5.5V, VM=7.0V VCC=5.5V, VM=0.5V, VINH=5.5V, VINL=0.0V VCC=4.5V, VIL=0.8V, IOL=20mA, VIH=2.0V, VINL=0.0V VCC= 4.5V, VIH=2.0V, IOH=-1.0mA, VINH=5.5V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA VCC=5.5V, VINH=5.5V, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
MN54F378-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL tpLH PARAMETER Propagation Delay CONDITIONS VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C NOTES PINNAME 10.5 10.5 UNIT SUBGROUPS
tpHL
Propagation Delay
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(H/L)(1)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
th(H/L)(1)
Hold Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C
ts(H)(2)
Setup Time
VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns VCC=5.0V @25C, VCC=4.5V 5.5V @-55/125C TR/TF=1.0ns
10.0 13.0
ts(L)(2)
Setup Time
th(H/L)(2) tw(H)
Hold Time Pulse Width
tw(L)
Pulse Width
fMAX
Maximum Clock Frequency Note Note Note Note Note Note
Screen tested 100% each device +25C, +125C -55C temperature, subgroups Screen tested 100% each device +25C temperature only, subgroup Sample tested (Method 5005, Table each MFG. +25C, +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG. +25C subgroup +125C -55C temperature, subgroups Sample tested (Method 5005, Table each MFG.lot +125C, +25C -55C temperature, subgroups GUARANTEED TESTED. (Design Characterization Data)

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