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4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER F194 high-speed 4-bi
Top Searches for this datasheetMILITARY DATA SHEET MN54F194-X 4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER F194 high-speed 4-bit bidirectional universal shift register. high-speed, multifunctional, sequential building block, useful wide variety applications. used serial-serial, shift left, shift right, serial-parallel, parallel-serial, parallel-parallel data register transfers. F194 similar operation F195 universal shift register, with added features shift left without external connections hold nothing) modes operation. Industry Part Number 54F194 Part Numbers 54F194DMQB 54F194FMQB 54F194LMQB Prime M194 Processing MIL-STD-883, Method 5004 Subgrp Description Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests Temp +125 +125 +125 +125 Quality Conformance Inspection MIL-STD-883, Method 5005 MN54F194-X MILITARY DATA SHEET Features Typical Shift Frequency Asynchronous Master Reset Hold Nothing) Mode Fully Synchronous Serial Parallel Data Transfers MN54F194-X MILITARY DATA SHEET (Absolute Maximum Ratings) (Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) -0.5V -0.5V +5.5V twice rated Iol(mA) Note Note Absolute maximum ratings values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs. Recommended Operating Conditions Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V MN54F194-X MILITARY DATA SHEET Electrical Characteristics PARAMETERS (The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, SYMBOL IBVI ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short-Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINL=0.0V, VINH=5.5V VCC=4.5V, VIL=0.8V, VIH=2.0V, IOL=20mA, VINH=5.5V, VINL=0.0V VCC=4.5V, VIL=0.8V, VINH=5.5V, VIH=2.0V, IOH=-1.0mA, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V, VINH=4.5V VCC=5.5V, VINL=0.0V, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS PARAMETERS (The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS tpLH Propagation Delay VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C tpHL Propagation Delay tpHL Propagation Delay th(H) Hold Time (High) P,DSR P,DSR P,DSR P,DSR 12.0 14.5 th(L) Hold Time (Low) VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C MN54F194-X MILITARY DATA SHEET Electrical Characteristics PARAMETERS(Continued) (The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL ts(H) PARAMETER Setup Time (High) CONDITIONS VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C NOTES PINNAME P,DSR P,DSR UNIT SUBGROUPS VCC=5.5V @25C VCC=4.5V 5.5V -55/125C ts(L) Setup Time (Low) VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C th(H/L) Setup Time (High Low) Pulse Width (Low) VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns tREC Recovery Time VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C 10.5 P,DSR fMAX Maximum Clock Frequency Note Note Note Note Note VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns Screen tested 100% each device +125 temperature, Subgroups Screen tested 100% each device temperature only, Subgroup Sample tested (Method 5005, Table each MFG. +125 temp., Subgroups Sample Tested (Method 5005, Table each MFG. Subgroup periodically +125 temp., Subgroups Guaranteed tested. (DESIGN CHARACTERIZATION DATA) Other recent searchesTDS7000B - TDS7000B TDS7000B Datasheet SHD119536 - SHD119536 SHD119536 Datasheet SHD119536P - SHD119536P SHD119536P Datasheet SD2943 - SD2943 SD2943 Datasheet OV7740 - OV7740 OV7740 Datasheet IXTH260N055T2 - IXTH260N055T2 IXTH260N055T2 Datasheet ISL4485E - ISL4485E ISL4485E Datasheet HV101 - HV101 HV101 Datasheet 74HC123 - 74HC123 74HC123 Datasheet 74HCT123 - 74HCT123 74HCT123 Datasheet
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