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4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER F194 high-speed 4-bi


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MILITARY DATA SHEET MN54F194-X
4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER
F194 high-speed 4-bit bidirectional universal shift register. high-speed, multifunctional, sequential building block, useful wide variety applications. used serial-serial, shift left, shift right, serial-parallel, parallel-serial, parallel-parallel data register transfers. F194 similar operation F195 universal shift register, with added features shift left without external connections hold nothing) modes operation.
Industry Part Number
54F194
Part Numbers
54F194DMQB 54F194FMQB 54F194LMQB
Prime
M194
Processing
MIL-STD-883, Method 5004
Subgrp Description
Static tests Static tests Static tests Dynamic tests Dynamic tests Dynamic tests Functional tests Functional tests Functional tests Switching tests Switching tests Switching tests
Temp
+125 +125 +125 +125
Quality Conformance Inspection
MIL-STD-883, Method 5005
MN54F194-X
MILITARY DATA SHEET
Features
Typical Shift Frequency Asynchronous Master Reset Hold Nothing) Mode Fully Synchronous Serial Parallel Data Transfers
MN54F194-X
MILITARY DATA SHEET
(Absolute Maximum Ratings)
(Note Storage Temperature +150 Ambient Temperature under Bias +125 Junction Temperature under Bias +175 Potential Ground -0.5V +7.0V Input Voltage (Note -0.5V +7.0V Input Current (Note +5.0mA Voltage Applied Output HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied Output State (Max) -0.5V -0.5V +5.5V twice rated Iol(mA) Note Note Absolute maximum ratings values beyond which device damaged have useful life impaired. Functional operation under these conditions implied. Either voltage limit current limit sufficient protect inputs.
Recommended Operating Conditions
Free Ambient Temperature Commercial Military Supply Voltage Military Commercial +125 +4.5V +5.5V +4.5V +5.5V
MN54F194-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) 4.5V 5.5V, SYMBOL IBVI ICEX PARAMETER Input High Current Input High Current Input Current Output Voltage Output HIGH Voltage Short-Circuit Current Input Clamp Diode Voltage Supply Current Output HIGH Leakage Current CONDITIONS VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V VCC=5.5V, VM=0.5V, VINL=0.0V, VINH=5.5V VCC=4.5V, VIL=0.8V, VIH=2.0V, IOL=20mA, VINH=5.5V, VINL=0.0V VCC=4.5V, VIL=0.8V, VINH=5.5V, VIH=2.0V, IOH=-1.0mA, VINL=0.0V VCC=5.5V, VINH=5.5V, VINL=0.0V, VM=0.0V VCC=4.5V, IM=-18mA, VINH=5.5V, VINH=4.5V VCC=5.5V, VINL=0.0V, VINH=5.5V VCC=5.5V, VINL=0.0V, VINH=5.5V, VM=5.5V NOTES PINNAME -0.6 UNIT -150 -1.2 SUBGROUPS
INPUTS INPUTS INPUTS OUTPUTS OUTPUTS OUTPUTS INPUTS OUTPUTS
PARAMETERS
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS tpLH Propagation Delay VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C tpHL Propagation Delay tpHL Propagation Delay th(H) Hold Time (High) P,DSR P,DSR P,DSR P,DSR 12.0 14.5
th(L)
Hold Time (Low)
VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C
MN54F194-X
MILITARY DATA SHEET
Electrical Characteristics
PARAMETERS(Continued)
(The following conditions apply following parameters, unless otherwise specified.) CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns FIGS SYMBOL ts(H) PARAMETER Setup Time (High) CONDITIONS VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C NOTES PINNAME P,DSR P,DSR UNIT SUBGROUPS
VCC=5.5V @25C VCC=4.5V 5.5V -55/125C ts(L) Setup Time (Low) VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C th(H/L) Setup Time (High Low) Pulse Width (Low) VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C VCC=5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns tREC Recovery Time VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C
10.5 P,DSR
fMAX
Maximum Clock Frequency Note Note Note Note Note
VCC= 5.5V @25C, VCC=4.5V 5.5V -55/125C TR/TF=1.0ns
Screen tested 100% each device +125 temperature, Subgroups Screen tested 100% each device temperature only, Subgroup Sample tested (Method 5005, Table each MFG. +125 temp., Subgroups Sample Tested (Method 5005, Table each MFG. Subgroup periodically +125 temp., Subgroups Guaranteed tested. (DESIGN CHARACTERIZATION DATA)

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