QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Buff

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Buff

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QS54/74FCT827T, 828T, 2827T, 2828T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 10-Bit Buffers
DESCRIPTION
QS54/74FCT827T QS54/74FCT828T QS54/74FCT2827T QS54/74FCT2828T
function compatible 74F827/8 74FCT827/8 74FCT827T/8T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 827T, 828T JEDEC-FCT spec compatible speed grades with 4.4ns 48mA Ind., 32mA Mil. FCT-T 2827T, 2828T Built-in series resistor outputs reduce reflection other system noise speed grades with 4.4ns 12mA Ind.
QSFCT827T/828T QSFCT2827T/2828T 10-bit buffers with three-state outputs that ideal driving high-capacitance loads memory address data buses. 2827/8 resistor output versions useful driving transmission lines reducing system noise. 2827/8 series parts replace 827/8 series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
FCT827 FCT828
(FCT2827 Only)
(FCT2828 Only)
MDSL-00027-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT827T, 828T, 2827T, 2828T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name D9-D0 Y9-Y0 Description Data Inputs Data Outputs Output Enables
Table Function Table
Outputs 827, 2827 828, 2828 Hi-Z Hi-Z Hi-Z Hi-Z
Inputs
Function Enabled Enabled High Impedance High Impedance
QUALITY SEMICONDUCTOR, INC.
MDSL-00027-04 DECEMBER 1998
QS54/74FCT827T, 828T, 2827T, 2828T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-11, 13-23 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 24-pin package.
0.25 Unit
Table Power Supply Characteristics
Symbol Parameter Quiescent Power Supply Current
QCCD
Supply Current Input HIGH
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs open enabled toggling duty cycle Other inputs VCC(3,4)
Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00027-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT827T, 828T, 2827T, 2828T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCTXXX) Current Drive (FCT2XXX) Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX- Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2XXX-
QUALITY SEMICONDUCTOR, INC.
MDSL-00027-04 DECEMBER 1998
QS54/74FCT827T, 828T, 2827T, 2828T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 827B 828B 2827B 2828B
Symbol tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPZH tPZL tPZH tPZL tPZH tPZL tPZH tPZL tPHZ tPLZ tPHZ tPLZ
Description Propagation Delay Propagation Delay(1,2) Propagation Delay 2827 Propagation Delay(1,2) 2827 Propagation Delay Propagation Delay(1,2) Propagation Delay 2828 Propagation Delay(1,2) 2828 Output Enable Time 827/8 Output Enable Time 827/8(1,2) Output Enable Time 2827/8 Output Enable Time 2827/8(1,2) Output Disable Time Yi(1,3) Output Disable Time(1)
827A 828A 2827A 2828A
827C 828C 2827C
Unit
Notes: This parameter guaranteed design tested. CLOAD 300pF. CLOAD 5pF.
MDSL-00027-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Buff

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