QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffers/Line Dr

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffers/Line Dr

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QS54/74FCT240T, 244T, 2240T, 2244T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 8-Bit Buffers/Line Drivers
DESCRIPTION
QS54/74FCT240T QS54/74FCT244T QS54/74FCT2240T QS54/74FCT2244T
function compatible 74F240/4 74FCT240/4 74ABT240/4 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 240T, 244T JEDEC-FCT spec compatible Std. thru speed grades with 3.8ns 64mA Ind., 48mA Mil. FCT-T 2240T, 2244T Built-in series resistor outputs reduce reflection other system noise Std. thru speed grades with 4.1ns 12mA Ind.
FCT240T FCT244T 8-bit buffers/line drivers with three-state outputs that ideal driving high-capacitance loads memory address data buses. FCT2240T FCT2244T resistor output versions useful driving transmission lines reducing system noise. 2240 2244 series parts replace 240/244 series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
FCT240 FCT2240
1G(1) 1A1(2) 1A2(4) 1A3(6) 1A4(8)
FCT244 FCT2244
1Y1(18) 1Y2(16) 1Y3(14) 1Y4(12)
1G(1) 1A1(2) 1A2(4) 1A3(6) 1A4(8) 1Y1(18) 1Y2(16) 1Y3(14) 1Y4(12)
2G(19) 2A1(11) 2A2(13) 2A3(15) 2A4(17) 2Y1(9) 2Y2(7) 2Y3(5) 2Y4(3)
2G(19) 2A1(11) 2A2(13) 2A3(15) 2A4(17) 2Y1(9) 2Y2(7) 2Y3(5) 2Y4(3)
Note: FCT244.
MDSL-00011-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT240T, 244T, 2240T, 2244T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name xA4-xA0 xY4-xY0 1G/2G Description Data Inputs Data Outputs Three State Output Enables
Table Function Tables
FCT240/FCT2240
1G/2G Input Output
FCT244/FCT2244
1G/2G Input Output
QUALITY SEMICONDUCTOR, INC.
MDSL-00011-04 DECEMBER 1998
QS54/74FCT240T, 244T, 2240T, 2244T Table Absolute Maxuimum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 2-9,11-18 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
Table Power Supply Characteristics
Symbol
Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled BitToggling Duty Cycle Other Inputs VCC(3,4)
0.25
Unit
QCCD
Supply Current Input HIGH Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00011-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT240T, 244T, 2240T, 2244T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCTXXX) Current Drive (FCT2XXX Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 48mA (MIL) 64mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.55 0.55 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2XXX
QUALITY SEMICONDUCTOR, INC.
MDSL-00011-04 DECEMBER 1998
QS54/74FCT240T, 244T, 2240T, 2244T Table FCT240T, FCT2240T Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
2240 Symbol tPHL tPLH tPHL tPLH tPZH tPZL tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay (FCT240) Propagation Delay (FCT2240) Output Enable Time (FCT240) Output Enable Time (FCT2240) Output Disable Time IND(2) MIL(2) 10.5 10.5
240A 2240A
240C 2240C
240D
Unit
Table FCT244T, FCT2244T Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 2244 IND(2) MIL(2) 244A 2244A 244C 2244C
244D
Symbol tPHL tPLH tPHL tPLH tPZH tPZL tPZH tPZL tPHZ tPLZ
Description
Unit
Propagation Delay (FCT244) Propagation Delay (FCT2244) Output Enable Time (FCT244) Output Enable Time (FCT2244) Output Disable Time
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00011-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffers/Line Dr

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