ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED. SHEET SHEET STATU

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ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED. SHEET SHEET STATU

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REVISIONS DESCRIPTION Update boilerplate. device types through vendor CAGE 61772 source supply device types through case outline Editorial changes throughout. DATE (YR-MO-DA) 94-09-06 APPROVED Frye
ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED.
SHEET SHEET STATUS SHEETS SHEET
PMIC
PREPARED James Jamison
DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED Charles Reusing
APPROVED Michael Frye
MICROCIRCUITS, DIGITAL, MEMORY, CMOS, STATIC (DUAL PORT), MONOLITHIC SILICON
DRAWING APPROVAL DATE 93-05-04 SIZE REVISION LEVEL CAGE CODE
AMSC
SHEET
67268
5962-87002
DESC FORM DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E371-94
SCOPE Scope. This drawing describes device requirements class microcircuits accordance with 1.2.1 MIL-STD-883, "Provisions MIL-STD-883 conjunction with compliant non-JAN devices". Part Identifying Number (PIN). complete shall shown following example: 5962-87002
Drawing number
Device type (See 1.2.1)
Case outline (See 1.2.2)
Lead finish (See 1.2.3)
1.2.1 Device type(s). device type(s) shall identify circuit function follows: Device type Generic number 7132SA 7132SA 7132SA 7132SA 7132LA 7132LA 7132LA 7132LA 7142SA 7142SA 7142SA 7142SA 7142LA 7142LA 7142LA 7142LA 7132SA 7132LA 7132SA 7132LA 7142SA 7142LA 7142SA 7142LA Circuit function dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, MASTER dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE dual port static RAM, SLAVE Access time
1.2.2 Case outline(s). case outline(s) shall designated MIL-STD-1835 follows: Outline letter Descriptive designator CQCC1-N52 figure GDIP1-T48 CDIP2-T48 figure figure Terminals Package style square leadless chip carrier dual-in-line dual-in-line square leadless chip carrier flat pack
1.2.3 Lead finish. lead finish shall specified MIL-STD-883 (see herein). Finish letter shall marked microcircuit packaging. designation specifications when lead finishes considered acceptable interchangeable without preference. Absolute maximum ratings. Voltage with respect ground Storage temperature range Unless otherwise specified, voltages referenced VSS. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
-0.5 +7.0 -65C +150C
5962-87002
REVISION LEVEL SHEET
Power dissipation (PD) Lead temperature (soldering, seconds) Maximum junction temperature (TJ) Thermal resistance, junction-to-case (JC): Cases Case Case Case Maximum output current Recommended operating conditions. Case operating temperature range (TC) Input voltage (VIL) Input high voltage (VIH) Supply voltage (VCC) APPLICABLE DOCUMENTS
+270C +150C MIL-STD-1835 23C/W 24C/W 20C/W
-55C +125C -0.5 +0.8 +2.2 +0.5 +4.5 +5.5
Government specification, standards, bulletin. Unless otherwise specified, following specification, standards, bulletin issue listed that issue Department Defense Index Specifications Standards specified solicitation, form part this drawing extent specified herein. SPECIFICATION MILITARY MIL-I-38535 STANDARDS MILITARY MIL-STD-883 MIL-STD-1835 BULLETIN MILITARY MIL-STD-103 List Standardized Military Drawings (SMD's). Test Methods Procedures Microelectronics. Microcircuit Case Outlines. Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
(Copies specification, standards, bulletin required manufacturers connection with specific acquisition functions should obtained from contracting activity directed contracting activity.) Order precedence. event conflict between text this drawing references cited herein, text this drawing shall take precedence. REQUIREMENTS Item requirements. individual item requirements shall accordance with 1.2.1 MIL-STD-883, "Provisions MIL-STD-883 conjunction with compliant non-JAN devices" specified herein. Product built this drawing that produced Qualified Manufacturer Listing (QML) certified qualified manufacturer manufacturer been granted transitional certification MIL-I-38535 processed product accordance with manufacturers approved program plan qualifying activity approval accordance with MIL-I-38535. This flow documented Quality Management (QM) plan make modifications requirements herein. These modifications shall affect form, fit, function device. These modifications shall affect described herein. "QML" certification mark accordance with MIL-I-38535 required identify when flow option used. Maximum junction temperature shall exceeded except allowable short duration burn-in screening conditions accordance with method 5004 MIL-STD-883. When thermal resistance value this case outline included MIL-STD-1835, that value shall supersede value specified herein. Unless otherwise specified, voltages referenced ground.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics. Test
Symbol VOL1 ISB1 ISB2 Conditions -55C +125C unless otherwise specified -4.0 VIL, outputs open Active port outputs open Group subgroups 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 Device type 19,23 17,21 20,24 01,04,09, 12,18,22 03,11 02,10 05,08, 13,16 07,15 06,14 17,19, 21,23 01-04 09-12 18,20, 22,24 05,07,08, 13,15,16 06,14 19,23 17,21 20,24 18,22 01,03,04, 09,11,12 02,10 05,07,08, 13,15,16 06,14
Limits
Output high voltage level Output voltage level
Open drain output voltage (BUSY output) Input high voltage level Input voltage level Input leakage current
Dynamic operating current, both ports active
Standby current, both ports inactive, level inputs
Standby current, port active, level inputs
Unit
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol ISB3 ISB4 ICCDR tCDR COUT Conditions -55C +125C unless otherwise specified -0.2 -0.2 -0.2 -0.2 Active port outputs open VOUT VOUT -0.2 -0.2 -0.2 -0.2 -0.2 -0.2 4.3.1d 25C, MHz, 4.3.1c 25C, VOUT MHz, 4.3.1c Group subgroups 1,2,3 1,2,3 1,2,3 1,2,3 1,2,3 9,10,11 9,10,11 7,8A,8B Device type 01-04, 09-12, 17,19, 21,23 05-08, 13-16, 18,20, 22,24 19,23 17,21 20,24 18,22 01,03,04, 09,11,12 02,05,10, 06,07,08, 14,15,16 05-08, 13-16, 18,20, 22,24 05-08, 13-16, 18,20, 22,24 05-08, 13-16, 18,20, 22,24 05-08, 13-16, 18,20, 22,24 Limits 4000 tAVAV
Unit
Full standby current, both ports inactive, CMOS level inputs
Full standby current, port active, CMOS level inputs
Output leakage current
data retention
Data retention current
Chip deselect data retention time
Operation recovery time
Functional tests Input capacitance Output capacitance footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tAVAV tAVQV tELQV tOLQV Conditions -55C +125C unless otherwise specified figure Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 Device type 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23, 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23, 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23, 02,03,06, 07,10,11, 14,15 04,08,12, 01,05,09, 17,18,21, 19,20,23,
Limits
Read/write cycle time
Address access time
Chip enable access time
Output enable access time
Unit
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tAVQX tOLQZ tOHQZ tELPU tEHPD tAVAV Conditions -55C +125C unless otherwise specified figure Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 Device type 02,06,10, 01,03-05, 07-09, 11-13, 15-24 01-16,17, 18,21,22 19,20,23, 02,06,10, 03,07,11, 04,08,12, 01,05,09, 17,18,21, 19,20,23, 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23,
Limits
Output hold from address change
Output time
Output high time
Chip enable power-up time Chip disable powerdown time Write cycle time
Unit
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tELWH tAVWH tAVWL tWLWH tEHOL Conditions -55C +125C unless otherwise specified figure Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 Device type 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23, 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23, 01,05,09, 02,06,10, 03,07,11, 04,08,12, 17,18,21, 19,20,23,
Limits
Chip enable write
Address valid write
Address setup time Write pulse width
Write recovery time footnotes table.
Unit
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tDVWH tOHQZ tWHDX tWLQZ tWHQX Conditions -55C +125C unless otherwise specified Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 Device type 02,06,10, 03,07,11, 01,04,05, 08,09,12, 13,16-18, 21,22 19,20,23, 02,06,10, 03,07,11, 04,08,12, 01,05,09, 17,18,21, 19,20,23, 02,06,10, 03,07,11, 04,08,12, 01,05,09, 17,18,21, 19,20,23, 09-16, 21-24 09-16,21, 23,24
Limits
Data valid write
Output high time
Data hold time Write enabled output high
Output active from write Write Write hold after
Unit
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tBAA tBDA tBAC tBDC tWDD Conditions -55C +125C unless otherwise specified figure Group subgroups 9,10,11 9,10,11 9,10,11 9,10,11 9,10,11 Device type 01,05, 17,18 02,03,04, 06,07,08 19,20 01,05 02,06 03,04, 07,08 17,18 19,20 01,05, 17,18 02,06 03,04, 07,08 19,20 01,05, 17,18 02,06 03,04, 07,08 19,20 01,05, 09,13 02,06, 10,14 03,07, 11,15 04,08, 12,16 17,18 19,20 Limits
Unit
access time
address
disable time
address
access time
chip enable
disable time
chip enable
Write pulse data delay
footnotes table.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical performance characteristics Continued. Test
Symbol tDDD tBDD tAPS Conditions -55C +125C unless otherwise specified figure Group subgroups 9,10,11 9,10,11 9,10,11
Device type
Write data valid read data delay
01,05, 09,13 02,06, 10,14 03,07, 11,15 04,08, 12,16 17-20 01-08, 17-20 01-08, 17-20
BUSY disable valid data Arbitration priority setup time
Limits
Unit
This parameter required tested shall guaranteed limits specified table Read Cycle Time tAVAV. Transition measured ±500 from high impedance voltage with load. 1250 ohms, picofarads. master/slave combination, tAVAV tBAA tWLWH. Specified high. slave device only. ensure that write cycle completed after contention. ensure that write cycle completed after contention. Port-to-port delay through cells from writing port reading port. tBDD calculated parameter greater tWDD tWLWH (actual) tDDD tDVWH (actual). ensure that earlier ports wins.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
Case outline
FIGURE Package dimensions.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
Inches .006 .010 .015 .025 .033 .037 .043 .045 .047
0.15 0.25 0.38 0.64 0.84 0.94 1.09 1.14 1.19
Inches .055 .077 .090 .093 .125 .434 .446 .554 .572
1.40 1.96 2.29 2.36 3.18 11.02 11.33 14.07 15.53
NOTES: Dimensions inches. Metric equivalents given general information only. Unless otherwise specified, tolerance ±.005 (0.13 mm).
FIGURE Package dimensions Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
Case outline
Symbol
Inches .089 .079 .058 .018 .008
.108 .096 .073 .022 .010 .750 .100 .550 .630 .050 .750 .100 .550 .630 .450 .350
Millimeters 2.74 2.26 2.44 2.01 1.85 1.47 0.56 0.46 0.25 0.20 19.05 2.54 13.97 16.00 1.27 19.05 2.54 13.97 16.00 11.43 8.89
FIGURE Case outline Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
Case outlines Terminal number
Device types
Terminal symbol
A10L I/O0L I/O1L I/O2L I/O3L I/O4L I/O5L I/O6L I/O7L I/O0R I/O1R
A10L
I/O0L I/O1L I/O2L I/O3L I/O4L I/O5L I/O6L I/O7L
Device types Case outlines Terminal number
Terminal symbol I/O0R I/O2R I/O1R I/O3R I/O2R I/O4R I/O3R I/O5R I/O4R I/O6R I/O5R I/O7R I/O6R I/O7R A10R A10R
FIGURE Terminal connections.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
Noncontention read/write control
Left right port (see note
D0-7 Data Data
Function
Port disabled power-down mode ISB2 ISB4 power-down mode ISB1 ISB3 Data port written into memory Data memory output port High impedance outputs
High, Low, Don't care, High impedance. NOTES: A10L A10R. data written. data valid. tWDD tDDD timing.
FIGURE Truth tables.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
arbitration (see notes)
Left port Right port A10L A10R A10R A10L Address arbitration with before address match LV5R LV5R RV5L RV5L Same Same Same Same arbitration with address match before LL5R A10R LL5R A10L RL5L A10L RL5L A10R LW5R A10R LW5R A10L LW5R A10L LW5R A10R
Flags
Function
contention contention contention contention
Left-port wins Right-port wins Arbitration resolved Arbitration resolved
Left-port wins Right-port wins Arbitration resolved Arbitration resolved
NOTES: Don't care, Low, High. LV5R Left address valid before right address. RV5L Right address valid before left address. Same Left right addresses match within each other. LL5R Left before right RL5L Right before left LW5R Left right within each other.
FIGURE Truth tables Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
NOTE: device types 01-08, 17-20: BUSY open drain requires pull-up resistor. device types 09-16, 21-24: BUSY input. names
Left port A10L I/O0L-I/O7L
Right port A10R I/O0R-I/O7R
Names Chip enable Read/write enable Output enable Busy flag Address Data input/output Power Ground
FIGURE Functional block diagram.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
16-bit master/slave dual-port memory system
NOTE: arbitration 7142 (slave). inhibits write 7142 (slave).
FIGURE Functional block diagram Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
FIGURE Timing diagrams test conditions.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
FIGURE Timing diagrams test conditions Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
FIGURE Timing diagrams test conditions Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
FIGURE Timing diagrams test conditions Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
NOTES: high read cycles. Device continuously enabled, VIL. Addresses valid prior coincident with transition low. transition occurs simultaneously with after transition, outputs remain high impedance state. VIL. VIL. during address transition. ensure that earlier ports wins. Write cycle parameters should adhered order ensure proper writing. Device continuously enabled both ports. reading port. write occurs during overlap (tELWH tWLWH) tEHOL measured from earlier going high write cycle. during controlled write cycle, write pulse width must larger tWLWH (tWLQZ tDVWH) allow drivers turn data placed required tDVWH. high during controlled write cycle, this requirement does apply write pulse short specified tWLWH. During this period, pins output state input signals must applied. FIGURE Timing diagrams test conditions Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
NOTES: Includes probe capacitance. output load legend.
Output load legend
Devices/conditions 02-04, 06-08, 10-12, 14-16; parameters except indicated 17-24; parameters except indicated devices; parameters (tOHQZ, tOLQZ, tWLQZ, tWHOX) only 01-08; 17-20;
1250$
1250$
1250$
270$ 270$
775$
775$
775$
used used
test conditions
Input pulse levels Input rise fall times Input timing reference levels Output reference levels Output load
above
FIGURE Timing diagrams test conditions Continued.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
TABLE Electrical test requirements.
MIL-STD-883 test requirements
Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group test requirements (method 5005) Groups end-point electrical parameters (method 5005) applies subgroups 4.3.1d.
Subgroups (per method 5005, table -1*,2,3,7*, 8A,8B,9 1,2,3,4**,7*, 8A,8B,9,10,11 2,3,7,8A,8B
Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-STD-883 (see herein) herein. 3.2.1 Terminal connections. terminal connections shall specified figure 3.2.2 Truth tables. truth tables shall specified figure 3.2.3 Functional block diagram. functional block diagram shall specified figure 3.2.4 Case outlines. case outlines shall accordance with 1.2.2 herein figure Electrical performance characteristics. Unless otherwise specified herein, electrical performance characteristics specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking. Marking shall accordance with MIL-STD-883 (see herein). part shall marked with listed herein. addition, manufacturer's also marked listed MIL-BUL-103 (see herein). Certificate compliance. certificate compliance shall required from manufacturer order listed approved source supply MIL-BUL-103 (see herein). certificate compliance submitted DESC-EC prior listing approved source supply shall affirm that manufacturer's product meets requirements MIL-STD-883 (see herein) requirements herein. Certificate conformance. certificate conformance required MIL-STD-883 (see herein) shall provided with each microcircuits delivered this drawing. Notification change. Notification change DESC-EC shall required accordance with MIL-STD-883 (see herein). Verification review. DESC, DESC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. QUALITY ASSURANCE PROVISIONS Sampling inspection. Sampling inspection procedures shall accordance with MIL-STD-883 (see herein). Screening. Screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. following additional criteria shall apply: Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
+125C, minimum.
Interim final electrical test parameters shall specified table herein, except interim electrical parameter tests prior burn-in optional discretion manufacturer.
Quality conformance inspection. Quality conformance inspection shall accordance with method 5005 MIL-STD-883 including groups inspections. following additional criteria shall apply. 4.3.1 Group inspection. Tests shall specified table herein. Subgroups table method 5005 MIL-STD-883 shall omitted. Subgroup (CIN COUT measurements) shall measured only initial test after process design changes which affect capacitance. Sample size fifteen devices with failures, input output terminals tested. Subgroups shall include verification truth table.
4.3.2 Groups inspections. End-point electrical parameters shall specified table herein. Steady-state life test conditions, method 1005 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. +125C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-STD-883 (see herein). NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor-prepared specification drawing. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished accordance with MIL-STD-973 using Form 1692, Engineering Change Proposal Record users. Military industrial users shall inform Defense Electronics Supply Center when system application requires configuration control applicable SMD. DESC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronics devices (FSC 5962) should contact DESC-EC, telephone (513) 296-6047. Comments. Comments this drawing should directed DESC-EC, Dayton, Ohio 45444-5270, telephone (513) 296-5377. Approved sources supply. Approved sources supply listed MIL-BUL-103. vendors listed MIL-BUL-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DESC-EC.
SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444
DESC FORM 193A
5962-87002
REVISION LEVEL SHEET
STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN DATE: 94-09-06 Approved sources supply 5962-87002 listed below immediate acquisition only shall added MIL-BUL-103 during next revision. MIL-BUL-103 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DESC-EC. This bulletin superseded next dated revision MIL-BUL-103.
Military drawing part number 5962-8700201XX 5962-8700201YX
5962-8700201ZX 5962-8700201UX 5962-8700201TX 5962-8700202XX 5962-8700202YX
5962-8700202ZX 5962-8700202UX 5962-8700202TX 5962-8700203XX 5962-8700203YX
5962-8700203ZX 5962-8700203UX 5962-8700203TX 5962-8700204XX 5962-8700204YX
5962-8700204ZX 5962-8700204UX 5962-8700204TX
Vendor CAGE number
Vendor similar part number
61772 61772 61772
IDT7132SA45CB IDT7132SA45L48B IDT7132SA45FB
61772 61772 61772
IDT7132SA90CB IDT7132SA90L48B IDT7132SA90FB
61772 61772 61772
IDT7132SA70CB IDT7132SA70L48B IDT7132SA70FB
61772 61772 61772
IDT7132SA55CB IDT7132SA55L48B IDT7132SA55FB
footnotes table.
Military drawing part number 5962-8700205XX 5962-8700205YX 5962-8700205ZX 5962-8700205UX 5962-8700205TX 5962-8700206XX 5962-8700206YX 5962-8700206ZX 5962-8700206UX 5962-8700206TX 5962-8700207XX 5962-8700207YX 5962-8700207ZX 5962-8700207UX 5962-8700207TX 5962-8700208XX 5962-8700208YX 5962-8700208ZX 5962-8700208UX 5962-8700208TX 5962-8700209XX 5962-8700209YX 5962-8700209ZX 5962-8700209UX 5962-8700209TX
Vendor CAGE number 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772
Vendor similar part number
IDT7132LA45CB IDT7132LA45L48B IDT7132LA45FB
IDT7132LA90CB IDT7132LA90L48B IDT7132LA90FB
IDT7132LA70CB IDT7132LA70L48B IDT7132LA70FB
IDT7132LA55CB IDT7132LA55L48B IDT7132LA55FB
IDT7142SA45CB IDT7142SA45L48B IDT7142SA45FB
footnotes table.
Military drawing part number
5962-8700210XX 5962-8700210YX
5962-8700210ZX 5962-8700210UX 5962-8700210TX 5962-8700211XX 5962-8700211YX
5962-8700211ZX 5962-8700211UX 5962-8700211TX 5962-8700212XX 5962-8700212YX
5962-8700212ZX 5962-8700212UX 5962-8700212TX 5962-8700213XX 5962-8700213YX
5962-8700213ZX 5962-8700213UX 5962-8700213TX 5962-8700214XX 5962-8700214YX
5962-8700214ZX 5962-8700214UX
Vendor CAGE number
Vendor similar part number
61772 61772 61772
IDT7142SA90CB IDT7142SA90L48B IDT7142SA90FB
61772 61772 61772
IDT7142SA70CB IDT7142SA70L48B IDT7142SA70FB
61772 61772 61772
IDT7142SA55CB IDT7142SA55L48B IDT7142SA55FB
61772 61772 61772
IDT7142LA45CB IDT7142LA45L48B IDT7142LA45FB
61772 61772
IDT7142LA90CB IDT7142LA90L48B
footnotes table.
Military drawing part number 5962-8700214TX 5962-8700215XX 5962-8700215YX 5962-8700215ZX 5962-8700215UX 5962-8700215TX 5962-8700216XX 5962-8700216YX 5962-8700216ZX 5962-8700216UX 5962-8700216TX 5962-8700217ZX 5962-8700217UX 5962-8700217TX 5962-8700218ZX 5962-8700218UX 5962-8700218TX 5962-8700219ZX 5962-8700219UX 5962-8700219TX 5962-8700220ZX 5962-8700220UX 5962-8700220TX 5962-8700221ZX 5962-8700221UX 5962-8700221TX
Vendor CAGE number 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772 61772
Vendor similar part number IDT7142LA90FB
IDT7142LA70CB IDT7142LA70L48B IDT7142LA70FB
IDT7142LA55CB IDT7142LA55L48B IDT7142LA55FB IDT7132SA35CB IDT7132SA35L48B IDT7132SA35FB IDT7132LA35CB IDT7132LA35L48B IDT7132LA35FB IDT7132SA25CB IDT7132SA25L48B IDT7132SA25FB IDT7132LA25CB IDT7132LA25L48B IDT7132LA25FB IDT7142SA35CB IDT7142SA35L48B IDT7142SA35FB
footnotes table.
Military drawing part number
5962-8700222ZX 5962-8700222UX 5962-8700222TX 5962-8700223ZX 5962-8700223UX 5962-8700223TX 5962-8700224ZX 5962-8700224UX 5962-8700224TX
Vendor CAGE number 61772 61772 61772 61772 61772 61772 61772 61772 61772
IDT7142LA35CB IDT7142LA35L48B IDT7142LA35FB IDT7142SA25CB IDT7142SA25L48B IDT7142SA25FB IDT7142LA25CB IDT7142LA25L48B IDT7142LA25FB
Vendor similar part number
Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from approved source supply.
Vendor CAGE number 61772
Vendor name address Integrated Device Technology, Incorporated 2975 Stender Santa Clara, 95054-8015
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies this information bulletin.

ORIGINAL FIRST PAGE THIS DRAWING BEEN REPLACED. SHEET SHEET STATU

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