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Semiconductor MSM56V16800F 2-Bank 1,048,576-Word 8-Bit SYNCHRONOU
Top Searches for this datasheetFEDD56V16800F-01 Semiconductor MSM56V16800F 2-Bank 1,048,576-Word 8-Bit SYNCHRONOUS DYNAMIC This version: November. 2000 Previous version DESCRIPTION MSM56V16800F 2-Bank 1,048,576-word 8-bit Synchronous dynamic fabricated Oki's silicon-gate CMOS technology. device operates 3.3V. inputs outputs LVTTL compatible. FEATURES Silicon gate, quadruple polysilicon CMOS, 1-transistor memory cell 2-Bank 1,048,576-word 8-bit configuration Single 3.3V power supply, ±0.3V tolerance Input LVTTL compatible Output LVTTL compatible Refresh 4096 cycles/64ms Programmable data transfer mode Latency (1,2,3) Burst Length (1,2,4,8,Full Page) Data scramble (sequential, interleave) auto-refresh, Self-refresh capability Packages: 44-pin 400mil plastic TSOP (TypeII) MSM56V16800F-xxTS-K) indicates speed rank. PRODUCT FAMILY Family Max. Frequency 125MHz 100MHz Access Time (Max.) tAC2 tAC3 MSM56V16800F-8A MSM56V16800F-10 1/31 FEDD56V16800F-01 Semiconductor MSM56V16800F CONFIGURATION (TOP VIEW) VSSQ VCCQ VSSQ VCCQ VSSQ VCCQ VSSQ VCCQ 44-Pin Plastic TSOP Type) Name A0-A10 Function System Clock Chip Select Clock Enable Address Bank Select Address Address Strobe Column Address Strobe Write Enable Name VCCQ VSSQ Function Data Input/ Output Musk Data Input/ Output Power Supply (3.3V) Ground (0V) Data Output Power Supply (3.3V) Data Output Ground (0V) Connection Note same power supply voltage must provided every VCCQ pin. same voltage level must provided every VSSQ pin. 2/31 FEDD56V16800F-01 Semiconductor MSM56V16800F DESCRIPTION Fetches inputs edge. Disables enables device operation asserting deactivating inputs except CLK, CKE, DQM. Masks system clock deactivate subsequent operation. deactivated, system clock will masked that subsequent operation deactivated. should asserted least cycle prior command. column multiplexed. address RA10 Column Address Slects bank activated during address latch time selects bank precharge read/write during column address latch time. A11="L" Bank A11="H" Bank Address Functionality depends combination. details, function truth table. Masks read data clocks later when edge clock signal. Masks write data same clock when edge clock signal. Data inputs/outputs multiplexed same pin. 3/31 FEDD56V16800F-01 Semiconductor MSM56V16800F BLOCK DIAGRAM Timing Register Programing Register Latency Burst Controller Controller Bank Controller Internal Col. Address Counter Input Data Register Column Address Buffers Column Decoders Input Buffers Sense Amplifiers Internal Address Counter Read Data Register Output Buffers Decoders Word Drivers Memory Cells Address Buffers Decoders Word Drivers Memory Cells Sense Amplifiers Column Decoders 4/31 FEDD56V16800F-01 Semiconductor MSM56V16800F ELECTRICAL CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS (Voltages referenced VSS) Parameter Voltage Relative Supply Voltage Storage Temperature Power Dissipation Short Circuit Output Current Operating Temperature Symbol VIN, VOUT VCCQ Tstg Topr Value -0.5 VCC+ -0.5 Unit 25°C RECOMMENDED OPERATIING CONDITIONS (Voltages referenced Parameter Power Supply Voltage Input High Voltage Input Voltage Symbol VCC, VCCQ Min. Typ. Max. Unit CAPACITANCE (VBIAS 1.4V, 25°C, MHz) Parameter Input Capacitance (CLK) Input Capacitance (RAS, CAS, CKE, DQM, A11) Input/Output Capacitance (DQ1 DQ8) Symbol CCLK COUT Min. Max. Unit 5/31 FEDD56V16800F-01 Semiconductor MSM56V16800F CHARACTERISTICS MSM56V16800 Condition Parameter Symbol Unit Note F-8A F-10 Min. Max. Bank Output High Voltage Output Voltage Input Leakage Current Output Leakage Current Others -2.0mA 2.0mA Min. Min. Burst Min. Min. tRRD Min. Burst Min. Min. Max. ICC1 Average Power Supply Current (Operating) Bank CKEVIH Active Both ICC1D Banks Active CKEVIH Power Supply Current (Standby) Average Power Supply Current (Clock Suspension) Average Power Supply Current (Active Standby) Power Supply Current (Burst) Power Supply Current (Auto-Refresh) Average Power Supply Current (Self-Refresh) Average Power Supply Current (Power Down) Both ICC2 Banks CKEVIH Precharge Both ICC3S Banks Active CKEVIL Min. ICC3 Bank CKEVIH Active Min. Both ICC4 Banks Active ICC5 CKEVIH Min. Bank CKEVIH Active Min. Min. Both ICC6 Banks Precharge Both CKEVIL ICC7 Banks Precharge Min. Min. Notes: Measured with outputs open. address data changed once left unchanged during cycle. address data changed once left unchanged during cycle. 6/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Mode Address Keys Latency Burst Type Burst Length Reserved Reserved Reserved Reserved Reserved Sequential Interleave Reserved Reserved Reserved Full Page Reserved Reserved Reserved Reserved Notes: should stay during mode cycle. MSM56V16800F support methods Power Sequence. POWER SEQUENCE With inputs state, turn power supply start system clock. After voltage reached specified level, pause 200µs more with input kept state. Issue precharge bank command. Apply auto-refresh eight more times. Enter mode register setting command. POWER SEQUENCE With inputs state, turn power supply start system clock. After voltage reached specified level, pause 200µs more with input kept state. Issue precharge bank command. Enter mode register setting command. Apply auto-refresh eight more times. 7/31 FEDD56V16800F-01 Semiconductor MSM56V16800F CHARACTERISTICS (1/2) Note1,2 Parameter Symbol MSM56V16800 F-8A Min. Max. 100,000 MSM56V16800 F-10 Min. +1CLK Max. 100,000 Unit Note Clock Cycle Time Access Time from Clock Clock High Pulse Time Clock Pulse Time Input Setup Time Input Hold Time Output Impedance Time from Clock Output High Impedance Time from Clock Output Hold from Clock Random Read Write Cycle Time Precharge Time Pulse Width Delay Time Write Recovery Time Bank Active Delay Time Refresh Time Power-down Exit setup Time Input Level Transition Time Delay Time (Min.) Clock Disable Time from Data Output High Impedance Time from Dada Input Mask Time from tCC3 tCC2 tCC1 tAC3 tAC2 tAC1 tOLZ tOHZ tRAS tRCD tRRD tREF tRDE tCCD tCKE tDOZ tDOD +1CLK Cycle Cycle Cycle Cycle 8/31 FEDD56V16800F-01 Semiconductor MSM56V16800F CHARACTERISTICS (2/2) Note1,2 Parameter Symbol MSM56V16800 F-8A Min. Data Input Mask Time from Write Command Data Output High Impedance Time from Precharge Command Active Command Input Time from Mode Register Command Input (Min.) Write Command Input Time from Outpput tDWD tROH Max. MSM56V16800 F-10 Min. Max. Cycle Cycle Unit Note tMRD Cycle tOWD Cycle Notes: measurements assume that 1ns. reference level timing input signals 1.4V. Output load. Z=50 Output 50pF (External Load) access time defined 1.4V. longer than 1ns, then reference level timing input signals VIL. 9/31 FEDD56V16800F-01 Semiconductor MSM56V16800F TIMING CHART Read Write Cycle (Same Bank) @CAS Latency=2, Burst Length=4 tRCD ADDR tOHZ Active Read Command Active Write Command Precharge Command Precharge Command 10/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Single Read-Write-Read Cycle (Same Page) @CAS Latency=2, Burst Length=4 High ADDR ICCD tOHZ tOLZ lOWD Active Read Command Write Command Precharge Command Read Command 11/31 FEDD56V16800F-01 Semiconductor MSM56V16800F *Note: When "High" clock transition from "Low" "High", inputs except invalid. When issuing active, read write command, bank selected A11. Active, read write Bank Bank auto precharge function enabled disabled input when read write command issued. Operation After burst, bank holds idle status. After burst, bank precharged automatically. After burst, bank holds idle status. After burst, bank precharged automatically. When issuing precharge command, bank precharged selected inputs. Operation Bank precharged. Bank precharged. Both banks precharged. input data write command latched same clock (Write latency=0). output forced high impedance (1CLK+ tOHZ after entry. 12/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Page Read Write Cycle (Same Bank) @CAS Latency=2, Burst Length=4 High Bank Active ICCD ADDR lOWD Note Note Read Command Read Command Write Command Precharge Command Write Command *Note: write data before burst read ends, should asserted three cycles prior write command avoid contention. assert precharge before burst write ends, wait after last write data input. Input data during precharge input cycle will masked internally. 13/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Read Write Cycle with Auto Precharge Burst Length=4 High tRRD ADDR Latency=1 A-Bank Precharge Start Latency=2 A-Bank Precharge Start Latency=3 A-Bank Precharge Start Active (A-Bank) Active (B-Bank) Bank Write with Auto Precharge Bank Precharge Start Point Bank Read with Auto Precharge 14/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Random Read Cycle @CAS Latency=2, Burst Length=4 High tRRD ADDR QAa0 QAa1 QAa2 QAa3 QBb1 QBb2 QBb3 QBb4 QAc0 QAc1 QAc2 QAc3 Active Read Command Read Command Active (A-Bank) (A-Bank) (B-Bank) (B-Bank) Active Read Command Precharge Command (A-Bank) Precharge Command (A-Bank) (A-Bank) (B-Bank) 15/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Random Write Cycle @CAS Latency=2, Burst Length=4 High ADDR DAa0 DAa1 DAa2 DAa3 DBb0 DBb1 DBb2 DBb3 DAc0 DAc1 Active (A-Bank) Active (B-Bank) Write Command (A-Bank) Write Command (B-Bank) Precharge Command (A-Bank) Write Command (A-Bank) Precharge Command (A-Bank) Precharge Command (B-Bank) Active (A-Bank) 16/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Page Read Cycle @CAS Latency=2, Burst Length=4 Note High ADDR QAa0 QAa1 QAa2 QAa3 QBb0 QBb1 QBb2 QBb3 QAc0 QAc1 QBd0 QBd1 QAe0 QAe1 IROH Active (A-Bank) Active (B-Bank) Read Command (B-Bank) Read Command (B-Bank) Read Command (A-Bank) Precharge Command (A-Bank) Read Command (A-Bank) Read Command (A-Bank) *Note: ignored when RAS, high same cycle. 17/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Page Write Cycle @CAS Latency=2, Burst Length=4 High ADDR DAa0 DAa1 DAa2 DAa3 DBb0 DBb1 DBb2 DBb3 DAc0 DAc1 DBd0 Active (A-Bank) Active (B-Bank) Write Command (B-Bank) Write Command (B-Bank) Precharge Command (Both Bank) Write Command (A-Bank) Write Command (A-Bank) 18/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Random Read/Write Cycle @CAS Latency=2, Burst Length=4 High ADDR QAa0 QAa1 QAa2 QAa3 QBb0 QBb1 QBb2 QBb3 QAc0 QAc1 QAc2 QAc3 Active (A-Bank) Read Command (A-Bank) Active (B-Bank) Write Command (B-Bank) Read Command (A-Bank) Precharge Command (A-Bank) Active (A-Bank) 19/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Bank Interleave Page Read/Write Cycle @CAS Latency=2, Burst Length=4 High ADDR CAa0 CBb0 CAc0 QAa0 QAa1 QAa2 QAa3 DBb0 DBb1 DBb2 DBb3 QAc0 QAc1 QAc2 QAc3 Read Command (A-Bank) Write Command (B-Bank) Read Command (A-Bank) 20/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Clock Suspension Operation Cycle @CAS Latency=2, Burst Length=4 Note Note ADDR Note tOHZ tOHZ Note Active Read Command Read CLOCK Suspension Read Command Read Write Write Command Write CLOCK Suspension *Note: When Clock Suspension asserted, next clock cycle ignored. When asserted, read data after clock cycles masked. When asserted, write data same clock cycle masked. 21/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Read Write Cycle (Same Bank) @CAS Latency=2, Burst Length=4 Note tRCD ADDR Active Read Command Write Command Precharge Command *Note: Case latency READ interrupted WRITE. minimum command interval [burst length cycles. must high least clocks prior write command. 22/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Read Interruption Precharge Command @Burst Length=8 High ADDR Latency=1 Note lROH Latency=2 Note lROH Latency=3 Note lROH Active Read Command Precharge Command *Note: precharge asserted before burst read ends, then read data will output after lROH equals latency. 23/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Burst Stop Command @Burst Length=8 High ADDR Latency=1 Latency=2 Latency=3 Read Command Burst Stop Command Write Command Burst Stop Command 24/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Power Down Mode @CAS Latency=2, Burst Length=4 tREF (min.) Note tPDE Note ADDR Power-down Entry Active Clock Power-down Suspension Exit Entry Read Command Clock Suspension Exit Precharge Command *Note: When both banks precharge state, low, then MSM56V16800F enters power-down mode maintains mode while low. release circuit from power-down mode, high longer than tPDE (tSI 1CLK). 25/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Self Refresh Cycle ADDR Hi-Z Self Refresh Entry Self Refresh Exit Active 26/31 FEDD56V16800F-01 Semiconductor MSM56V16800F Mode Register Cycle Auto Refresh Cycle High High lMRD ADDR Command Auto Refresh Auto Refresh 27/31 FEDD56V16800F-01 Semiconductor MSM56V16800F FUNCTION TRUTH TABLE (Table (1/2) Current State1 Idle ADDR Code ILLEGAL ILLEGAL Active Action Auto-Refresh Self-Refresh Mode Register Write Read Write ILLEGAL Precharge ILLEGAL (Continue Active after Burst ends) (Continue Active after Burst ends) Term Burst Active Term Burst, start Burst Read Term Burst, start Burst Write ILLEGAL Term Burst, execute Precharge ILLEGAL (Continue Active after Burst ends) (Continue Active after Burst ends) Term Burst Active Term Burst, start Burst Read Term Burst, start Burst Write ILLEGAL Term Burst, execute Precharge ILLEGAL (Continue Burst enter Precharge) (Continue Burst enter Precharge) ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL (Continue Burst enter Precharge) (Continue Burst enter Precharge) ILLEGAL ILLEGAL Active Read Write Read with Auto Precharge Write with Auto Precharge 28/31 FEDD56V16800F-01 Semiconductor MSM56V16800F FUNCTION TRUTH TABLE (Table (2/2) Current State1 Write with Auto Precharge Precharge ADDR ILLEGAL ILLEGAL ILLEGAL Idle after Idle after ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Action Write Recovery Active ILLEGAL Active after tRCD Active after tRCD ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Idle after Idle after ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Refresh Mode Register Access ABBREVIATIONS Address Bank Address OPeration command Column Address Auto Precharge Notes inputs enabled when high least cycle prior inputs. Illegal bank specified state, legal some cases depending state bank selection. Satisfy timing lCCD prevent contention. bank precharging idle state. Precharges activated bank A10. Illegal bank idle. 29/31 FEDD56V16800F-01 Semiconductor MSM56V16800F FUNCTION TRUTH TABLE (Table Current State CKEn-1 Self Refresh Power Down Banks Idle (ABI) CKEn ADDR Action INVALID Exit Self Refresh Exit Self Refresh ILLEGAL ILLEGAL ILLEGAL (Maintain Self Refresh) INVALID Exit Power Down Exit Power Down ILLEGAL ILLEGAL ILLEGAL (Continue power down mode) Refer Table Enter Power Down Enter Power Down ILLEGAL ILLEGAL ILLEGAL Enter Self Refresh ILLEGAL Refer Operations Table Begin Clock Suspend Next Cycle Enable Clock Next Cycle Continue Clock Suspension State Other than Listed Above *Notes Power-down self-refresh entered only when banks idle state. 30/31 FEDD56V16800F-01 Semiconductor MSM56V16800F NOTICE information contained herein change without notice owing product and/or technical improvements. Before using product, please make sure that information being referred up-to-date. outline action examples application circuits described herein have been chosen explanation standard action performance product. When planning product, please ensure that external conditions reflected actual circuit, assembly, program designs. When designing your product, please product below specified maximum ratings within specified operating ranges including, limited operating voltage, power dissipation, operating temperature. assumes responsibility liability whatsoever failure unusual unexpected operation resulting from misuse, neglect, improper installation, repair, alteration accident, improper handling, unusual physical electrical stress including, limited exposure parameters beyond specified maximum ratings operation outside specified operating range. Neither indemnity against license third party's industrial intellectual property right, etc. granted connection with product and/or information drawings contained herein. responsibility assumed infringement third party's right which result from thereof. products listed this document intended general electronics equipment commercial applications (e.g., office automation, communication equipment, measurement equipment, consumer electronics, etc.). These products authorized system application that requires special enhanced quality reliability characteristics system application where failure such system application result loss damage property, death injury humans. Such applications include, limited traffic automotive equipment, safety devices, aerospace equipment, nuclear power control, medical equipment, life-support systems. Certain products this document need government approval before they exported particular countries. purchaser assumes responsibility determining legality export these products will take appropriate necessary steps their expense these. part contents contained herein reprinted reproduced without prior permission. Copyright 2001 Electric Industry Co., Ltd. 31/31 Other recent searchesMIC4416 - MIC4416 MIC4416 Datasheet 4417 - 4417 4417 Datasheet JOG-01056 - JOG-01056 JOG-01056 Datasheet ES2A - ES2A ES2A Datasheet ES2B - ES2B ES2B Datasheet ES2C - ES2C ES2C Datasheet ES2D - ES2D ES2D Datasheet ES2AA - ES2AA ES2AA Datasheet ES2BA - ES2BA ES2BA Datasheet ES2CA - ES2CA ES2CA Datasheet ES2DA - ES2DA ES2DA Datasheet ES2A - ES2A ES2A Datasheet ES2D - ES2D ES2D Datasheet BC849 - BC849 BC849 Datasheet BA9741FS - BA9741FS BA9741FS Datasheet AFBR-703ASDZ-AS - AFBR-703ASDZ-AS AFBR-703ASDZ-AS Datasheet RoHS-6 - RoHS-6 RoHS-6 Datasheet
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