PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, NPN,

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PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, NPN,

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INCH-POUND MIL-PRF-19500/413C July 1999 SUPERSEDING MIL-S-19500/413B March 1993
PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-POWER TYPES 2N3771 2N3772, JAN, JANTX, JANTXV This specification approved Departments Agencies Department Defense. SCOPE Scope. This specification covers performance requirements silicon, high-power transistors high-speed power-switching applications. Three levels product assurance provided each device type specified MIL-PRF-19500. Physical dimensions. figure (T0-3). Maximum ratings. 1.17C/W, 29.2C/W. +25C 2N3771 2N3772 +25C VCBO VCEO VEBO TSTG
+200 +200
Derate linearly 34.2 mW/C +25C. Derate linearly mW/C +25C. Primary electrical characteristics. HFE2 2N3771 2N3772 VCE(SAT) VCE(SAT)
Pulsed (see 4.5.1).
Beneficial comments (recommendations, additions, deletions) pertinent data which improving this document should addressed Commander, Defense Supply Center Columbus, ATTN: DSCC-VAC, 3990 East Broad Street, Columbus, 43216-5000, using Standardization Document Improvement Proposal Form 1426) appearing this document letter.
AMSC DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5961
MIL-PRF-19500/413
Limits
|hfe|
Cobo
Switching (see figure ton, toff 2N3771 ton, toff 2N3772
1,200
APPLICABLE DOCUMENTS General. documents listed this section specified sections this specification. This section does include documents cited other sections this specification recommended additional information examples. While every effort been made ensure completeness this list, document users cautioned that they must meet specified requirements documents cited sections this specification, whether they listed. Government documents. 2.2.1 Specifications, standards, handbooks. following specifications, standards, handbooks form part this document extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DODISS) supplement thereto, cited solicitation (see 6.2). SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-19500 Performance Specification Semiconductor Devices, General Specification for. STANDARD MILITARY MIL-STD-750 Test Methods Semiconductor Devices. (Unless otherwise indicated, copies above specifications, standards, handbooks available from Defense Automated Printing Sevice, Robbins Avenue, Building (DPM-DODSSP), Philadelphia, 19111-5094.) Order precedence. event conflict between text this document references cited herein (except related associated specifications specification sheets), text this document takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Qualification. Devices furnished under this specification shall products that authorized qualifying activity listing applicable qualified products list before contract award (see 6.4). Associated specification. individual item requirements shall accordance with MIL-PRF-19500 specified herein. Abbreviations, symbols, definitions. Abbreviations, symbols, definitions used herein shall specified MILPRF-19500, follows: Interface requirements physical dimensions. Interface requirements physical dimensions shall specified MIL-PRF-19500, figure herein.
MIL-PRF-19500/413
Dimension Symbol Inches .270 .038 -.420 .205 .060 .312 -Max .380 .053 .875 .440 .225 .135 .500 .050 Millimeters 6.86 0.97 -10.67 5.21 1.52 7.92 -Max 9.65 1.35 22.22 11.18 5.72 3.43 12.70 1.27 Notes
.151 1.177 .495 .131
.165 1.197 .525 .188
3.84 29.90 12.57 3.33
4.19 30.40 13.33 4.78
.655
.675
16.64
17.15
NOTES: Dimensions inches. Metric equivalents given general information only. Terminal base; terminal emitter; case collector. These dimensions should measured points .050 .055 inch (1.27 1.40 below seating plane. When gauge used, measurement will made seating plane. seating place header shall flat within .004 inch (0.03 inside .930 inch (23.62 diameter circle center header flat within .004 inch (0.03 concave .006 inch (0.15 convex overall. Collector shall electrically connected case. Dimension applies length leads beyond Diameter uncontrolled
FIGURE Physical dimensions family. (Similar TO-3)
MIL-PRF-19500/413C 3.4.1 Lead finish. Where choice lead finish desired, shall specified contract purchase order (see 6.2). Marking. Marking shall accordance with MIL-PRF-19500. option manufacturer, country origin marking omitted from body transistor. Electrical performance characteristics. Unless otherwise specified herein, electrical performance characteristics specified 1.3, table Electrical test requirements. electrical test requirements shall subgroups specified Table VERIFICATION Classification inspections. inspection requirements specified herein classified follows: Qualification inspection (see 4.2). Screening (see 4.3) Conformance inspection (see 4.4).
Qualification inspection. Qualification inspection shall accordance with MIL-PRF-19500 specified herein. Screening (JANTXV JANTX levels). Screening shall accordance with MIL-PRF19500 (table specified herein. following measurements shall made accordance with table herein. Devices that exceed limits table herein shall acceptable.
Screen (see table MIL-PRF-19500)
Measurement JANTX JANTXV levels
ICEX1 ICEX1 hFE2; ICEX1 percent initial value whichever greater. Burn-in (see 4.3.1)
ICEX1 percent initial value whichever greater; hFE2 percent initial reading. Subgroup table herein.
4.3.1 Power burn-in conditions. Power burn-in conditions follows: +35C; +187.5C ±12.5C Note: heat sink forced cooling devices shall permitted. Conformance inspection. Conformance inspection shall accordance with MIL-PRF-19500 specified herein. 4.4.1 Group inspection. Group inspection shall conducted accordance with MIL-PRF-19500 table herein. Endpoint electrical measurements shall accordance with table subgroup herein.
MIL-PRF-19500/413C 4.4.2 Group inspection. Group inspection shall conducted accordance with conditions specified subgroup testing table (JANTX, JANTXV) MIL-PRF-19500 follows. Electrical measurements (end-points) delta requirements shall accordance with table subgroup herein. Delta requirement shall accordance with 4.5.3 herein. 4.4.2.1 Group inspection, table MIL-PRF-19500. 4.4.2.2 Group inspection, (JAN, JANTX, JANTXV). Electrical endpoints shall accordance with Group subgroup herein. Subgroup Method 1051 1037 1027 2037 3131 1031 Condition Temperature cycling; test condition solder attach: Intermittent operation life; 2,000 cycles; eutectic attach: 35C, Adjust achieve 175C minimum. Bond strength; Test condition applicable. internal leads each device shall pulled separately. 4.5.2 High-temperature life (non-operating), +200C.
4.4.3 Group inspection. Group inspection shall conducted accordance with conditions specified subgroup testing table MIL-PRF-19500 follows. Electrical measurements (end-points) delta requirements shall accordance with Table group subgroup Delta requirements shall accordance with 4.5.3 herein. 4.4.3.1 Group inspection, table MIL-PRF-19500. Subgroup Method 1056 2036 1037 1027 Condition Thermal shock; test condition Test condition weight lbs., applicable solder attach: Intermittent operation life, 6,000 cycles; eutectic attach: 35C, Adjust achieve 175C minimum.
Method inspection. Methods inspection shall specified appropriate tables follows. 4.5.1 Pulse measurements. Conditions pulse measurement shall specified section MIL-STD-750. 4.5.2 Thermal resistance. Thermal resistance measurements shall conducted accordance with method 3131 MIL-STD-750. following details shall apply: measurement measurement voltage. collector heating current collector emitter heating voltage. heating time measurement delay time. (minimum) (minimum). Steady-state (see MIL-STD-750, method 3131). maximum
sample window time
MIL-PRF-19500/413C 4.5.3 Delta requirements. Delta requirements shall specified below: Step Forward-current transfer ratio 2N3771 2N3772 3076 pulsed (see 4.5.1) Inspection Method MIL-STD-750 Conditions Symbol Limit ±25% change from previously measured value Unit
hFE2
Devices which exceed group limits this test shall acceptable. electrical measurements table IVb, (JAN, JANTX JANTXV) MIL-PRF-19500 follows: Subgroup table herein, step Subgroup table herein, steps electrical measurements table MIL-PRF-19500 follows: Subgroup table herein, step Subgroup table herein, step
MIL-PRF-19500/413C TABLE Group inspection.
Inspection Method Subgroup Visual mechanical examination Subgroup Breakdown voltage, collector base 2N3771 2N3772 Breakdown voltage collector emitter 3011 3011 2071
MIL-STD-750 Conditions
Symbol
Limits
Unit
Bias condition pulsed (see 4.5.1),
V(BR)CEO
Bias condition 100, pulsed (see 4.5.1)
V(BR)CER
2N3771 2N3772 Breakdown voltage, collector emitter 3011 Bias condition -1.5 pulsed (see 4.5.1) V(BR)CEX
2N3771 2N3772 Collector-emitter cutoff current 2N3771 2N3772 Emitter base cutoff current Collector-emitter cutoff current 2N3771 2N3772 Base emitter voltage (nonsaturated) 3066 3061 3041 Bias condition Bias condition Bias condition Test condition pulsed (see 4.5.1), 3071 Pulsed (see 4.5.1) VCE(sat)1 IEBO ICEX1 ICEO
3041
2N3771 2N3772 Collector emitter voltage (saturated) 2N3771 2N3772
footnotes table.
MIL-PRF-19500/413C TABLE Group inspection Continued.
Inspection Method Subgroup Continued Collector emitter voltage (saturated) 2N3771 2N3772 Forward-current transfer ratio Forward current transfer ratio 2N3771 2N3772 Subgroup High temperature operation: Collector emitter cutoff current 2N3771 2N3772 temperature operation: Forward-current transfer ratio 2N3771 2N3772 Subgroup Pulse response transfer ratio 3251 3076 3041 3076 3071
MIL-STD-750 Conditions
Symbol
Limits
Unit
Pulsed (see 4.5.1) Pulsed (see 4.5.1) Pulsed (see 4.5.1)
VCE(sat)2 hFE1
3076
hFE2
+150C Bias condition -1.5 -55C Pulsed (see 4.5.1), hFE3 ICEX2
Test condition except test circuit pulse requirements accordance with figure herein -1.5 toff
Turn time 2N3771 2N3772 Turn time 2N3771 2N3772 footnotes table.
MIL-PRF-19500/413C TABLE Group inspection Continued.
Inspection Method Subgroup Continued Magnitude common emitter small-signal short-circuit forwardcurrent transfer ratio Small-signal short-circuit forward-current transfer ratio Output capacitance (open circuit) Subgroup Safe operating area operation) Test (2N3771 only) Test (2N3771 only) Test (2N3772 only) Test (2N3772 only) Safe operating area (clamped inductive) 3053 3051 3306
MIL-STD-750 Conditions
Symbol
Limits
Unit
|hfe|
3206
3236
Cobo
1,200
+25C, cycle, figure 3.75 Load condition +25C, duty cycle percent, (vary pulse width achieve IC), 0.1, (see figure RBB1 VBB1 RBB2 VBB2 .67, 0.01 (Signal transformer CH-30 equivalent), 1N1186A, clamp voltage (device fails clamp voltage reached)
Test (2N3771 only)
footnotes page.
MIL-PRF-19500/413C TABLE Group inspection Continued.
Inspection Method Subgroup Continued Test (2N3772 only)
MIL-STD-750 Conditions
Symbol
Limits
Unit
RBB1 VBB1 RBB2 100, VBB2 0.01 (Signal transformer CH-30 equivalent), 1N1186A, clamp voltage (device fails clamp voltage reached) table subgroup
point electrical measurements Subgroup Safe operating area (unclamped inductive) 3053
Load condition (unclamped inductive load) figure herein; 25C; duty cycle 10%; 0.1; RBB2 100; VBB2 RBB1 VBB1 0.005 (Signal transformer CH-100 equivalent); RBB1 VBB1 0.01 (Signal transformer CH-50 equivalent); RBB1 VBB1 (Signal transformer CH-8 equivalent);
Test (2N3771 only)
Test (2N3772 only)
Test (both types)
Safe operating area (clamped inductive) (destructive)
3053
Load condition 25C; duty cycle 10%; 0.1; (see figure
footnotes table.
MIL-PRF-19500/413C TABLE Group inspection Continued.
Inspection Method Subgroup Continued Test (2N3771 only)
MIL-STD-750 Conditions RBB1 VBB1 RBB2 100; VBB2 +0,-5 1.67; 0.01 (Signal transformer CH-30 equivalent); 1N1186A; Clamp voltage RBB1 VBB1 RBB2 100; VBB2 +0,-5 4.5; 0.01 (Signal transformer CH-30 equivalent); 1N1186A; Clamp voltage table subgroup
Symbol
Limits
Unit
Test (2n3772 only)
Electrical measurements
sampling plan, MIL-PRF-19500.
MIL-PRF-19500/413
NOTES: rise time (tr) fall time (tf) applied pulse shall each nanoseconds; duty cycle generator source impedance shall pulse width Output sampling oscilloscope:
rise time nanoseconds.
FIGURE Pulse response test circuit.
MIL-PRF-19500/413
FIGURE Maximum save operating area graph (continuous dc).
MIL-PRF-19500/413
FIGURE Save operating area switching between saturation cutoff (unclamped inductive load).
MIL-PRF-19500/413
FIGURE Safe operating area switching between saturation cutoff (clamped inductive load).
MIL-PRF-19500/413C PACKAGING Packaging. acquisition purposes, packaging requirements shall specified contract order (see 6.2). When actual packaging material performed personnel, these personnel need contact responsible packaging activity ascertain requisite packaging requirements. Packaging requirements maintained Inventory Control Points' packaging activity within Military Department Defense Agency, within Military Departments' System Command. Packaging data retrieval available from managing Military Departments' Defense Agency's automated packaging files, CD-ROM products, contacting responsible packaging activity. NOTES (This section contains information general explanatory nature that helpful, mandatory.) Notes. notes specified MIL-PRF-19500 applicable this specification. Acquisition requirements. Acquisition documents should specify following: Issue DODISS cited solicitation and, required, specific issue individual documents referenced (see 2.2.1). Lead finish specified (see 3.4.1). Type designation product assurance level. Packing requirements (see 5.1) Changes from previous issue. Marginal notations used this revision identify changes with respect previous issue, extensiveness changes. Qualification. With respect products requiring qualification, awards will made only products which are, time award contract, qualified inclusion Qualified Manufacturers List -19500 whether such products have actually been listed that date. attention contractors called these requirements, manufacturers urged arrange have products that they propose offer Federal Government tested qualification order that they eligible awarded contracts purchase orders products covered this specification. Information pertaining qualification products obtained from Defense Supply Center Columbus, ATTN: DSCC-VQE, 3990 East Broad Street, Columbus, 43216-5000.
CONCLUDING MATERIAL
Custodians: Army Navy Force NASA Review activity: Force
Preparing activity: (Project 5961-2156)
MIL-PRF-19500/413
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL INSTRUCTIONS preparing activity must complete blocks block both document number revision letter should given. submitter this form must complete blocks preparing activity must provide reply within days from receipt form. NOTE: This form used request copies documents, request waivers, clarification requirements current contracts. Comments submitted this form constitute imply authorization waive portion referenced document(s) amend contractual requirements. DOCUMENT NUMBER MIL-PRF-19500/413C DOCUMENT DATE
RECOMMEND CHANGE:
DOCUMENT TITLE Semiconductor Device, Transistor, NPN, Silicon, High-Power Types 2N3771, 2N3772, JANTX JANTXV
NATURE CHANGE (Identify paragraph number include proposed rewrite, possible. Attach extra sheets needed.)
REASON RECOMMENDATION
SUBMITTER NAME (Last, First, Middle initial)
ORGANIZATION
ADDRESS (Include Code)
TELEPHONE (Include Area Code) Commercial (614) 692-0510 850-0510 (614) 692-6939 EMAIL alan_barone@dscc.dla.mil
DATE SUBMITTED
PREPARING ACTIVITY Point Contact Barone TELEPHONE (Include Area Code) Commercial 850-0510 (614) 692-6939 EMAIL alan_barone@dscc.dla.mil RECEIVE REPLY WITHIN DAYS, CONTACT: Defense Standardization Program Office (DLSC-LM) 8725 John Kingman Road, Suite 2533, Fort Belvoir, Virginia 22060-6221 Telephone (703) 767-6888 427-6888 Previous editions obsolete 198/290
ADDRESS Defense Supply Center Columbus ATTN: DSCC-VAC Columbus, 43216-5000
Form 1426, 1999 (EG)

PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, NPN,

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