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ISSUE JUNE 1998 Description Shock: 68-2-27 test (MIL-STD-202 Meth


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CFPSF-1000 SERIES
ISSUE JUNE 1998 Description
Shock: 68-2-27 test (MIL-STD-202 Method 213), Sinewave 981m/s2 11ms, three shocks each plane Damp Heat: 68-2-3 test (steady state), duration days, recovery time hours Solderability: 68-2-20 test Method (solder bath) (MIL-STD-202 Method 208), Temperature 235°C Change Temperature: 68-2-14 test (rapid change) (MIL-STD-202 Method 107), cycles hour duration each -40/+25/+85/+25°C cycle Vibration: 68-2-6 test Procedure (MIL-STD-202 Method 204), Duration hours, 55Hz 1.5mm D.A., 2000Hz (10gn) Bump: 68-2-29 test 4000 bumps 400m/s2 (40gn) each three mutually perpendicular planes
CFPSF-1000 series filters aimed professional telecoms market. Device characteristics optimised such typical applications Pulse Code Modulation (PCM) re-timing systems voltage controlled oscillators. Standard devices available synchronous digital hierarchy (SDH) frequencies 622.080MHz 2488.320MHz. filters surface-mount packages filled with nitrogen hermetically sealed ensure maximum long term reliability.
Features:
Frequencies from 500.0MHz 2600.0MHz Standard frequencies available Ageing characteristics 10ppm first year Surface-mount ceramic base package, gold plated kovar walls, kovar lid, hermetically seam welded profile; 1.9mm Custom design capability
Options
other packages/specifications please contact sales office
Marking
Package Outline
Manufacturer Model Number Frequency Date code (Year/Week)
Leadless Chip Carrier (LCC) filters encapsulated ceramic package with seam welded metal lid.
Frequency Range (Fc) (mean points)
Minimum Order Information Required
500.0MHz 2600.0MHz
Operating Temperature Range
-40°C 85°C
wide range possible alternatives combinations essential that contact C-MAC Frequency Products.
Storage Temperature Range
-55°C 125°C Outline (inches) (scale 1:2)
(Fc/bandwidth)
Typical (depending design)
Insertion loss (IL)
25dB into (depending design)
Ageing
±10ppm first year ±5ppm year thereafter
Environmental Specification
Hermetic Seal: 68-2-17 test (Fine Leak), (MIL-STD-202 Method Test condition 68-2-17 test (Gross Leak), (MIL-STD-202 Method Test condition
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