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True Logic High-Current 3-State Outputs Drive LSTTL Loads Package Opti


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SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
True Logic High-Current 3-State Outputs Drive LSTTL Loads Package Options Include Plastic Small-Outline (DW) Ceramic Flat Packages, Ceramic Chip Carriers (FK), Standard Plastic Ceramic 300-mil DIPs
SN54HC645 PACKAGE SN74HC645 PACKAGE (TOP VIEW)
description
These octal transceivers designed asynchronous two-way communication between data buses. These devices transmit data from from bus, depending upon level direction-control (DIR) input. output-enable (OE) input used disable device buses effectively isolated. SN54HC645 characterized operation over full military temperature range -55°C 125°C. SN74HC645 characterized operation from -40°C 85°C.
FUNCTION TABLE INPUTS OPERATION data data Isolation
SN54HC645 PACKAGE (TOP VIEW)
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
Copyright 1997, Texas Instruments Incorporated
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
logic symbol
[BA] [AB]
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12.
logic diagram (positive logic)
Seven Other Transceivers
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
absolute maximum ratings over operating free-air temperature range
Supply voltage range, -0.5 Input clamp current, VCC) (see Note Output clamp current, VCC) (see Note Continuous output current, VCC) Continuous current through Package thermal impedance, (see Note package 97°C/W package 67°C/W Storage temperature range, Tstg -65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output voltage ratings exceeded input output current ratings observed. package thermal impedance calculated accordance with JESD except through-hole packages, which trace length zero.
recommended operating conditions
SN54HC645 Supply voltage High-level input voltage Low-level input voltage Input voltage Output voltage Input transition (rise fall) time Operating free-air temperature 3.15 1.35 1000 SN74HC645 3.15 1.35 1000 UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS -7.8 3.98 5.48 25°C 1.998 4.499 5.999 0.002 0.001 0.001 0.17 0.15 ±0.1 ±0.01 0.26 0.26 ±100 ±0.5 SN54HC645 ±1000 SN74HC645 3.84 5.34 0.33 0.33 ±1000 UNIT
switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure
PARAMETER FROM (INPUT) (OUTPUT) tdis 25°C SN54HC645 SN74HC645 UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure
PARAMETER FROM (INPUT) (OUTPUT) 25°C SN54HC645 SN74HC645 UNIT
operating characteristics, 25°C
PARAMETER Power dissipation capacitance transceiver TEST CONDITIONS load UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54HC645, SN74HC645 OCTAL TRANSCEIVERS WITH 3-STATE OUTPUTS
PARAMETER MEASUREMENT INFORMATION
PARAMETER Test Point tPZH tPZL tPHZ tPLZ Open Closed Open Closed Open Closed Open Closed Open Open
From Output Under Test (see Note
tdis
LOAD CIRCUIT Input tPLH In-Phase Output tPHL Out-of-Phase Output tPLH tPHL
Output Control (Low-Level Enabling) tPZL Output Waveform (See Note tPZH
tPLZ tPHZ
VOLTAGE WAVEFORMS PROPAGATION DELAY OUTPUT TRANSITION TIMES
Input
Output Waveform (See Note
VOLTAGE WAVEFORM INPUT RISE FALL TIMES
VOLTAGE WAVEFORMS ENABLE DISABLE TIMES 3-STATE OUTPUTS
NOTES: includes probe test-fixture capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. Phase relationships between waveforms were chosen arbitrarily. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS INVOLVE POTENTIAL RISKS DEATH, PERSONAL INJURY, SEVERE PROPERTY ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). SEMICONDUCTOR PRODUCTS DESIGNED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. INCLUSION PRODUCTS SUCH APPLICATIONS UNDERSTOOD FULLY CUSTOMER'S RISK. order minimize risks associated with customer's applications, adequate design operating safeguards must provided customer minimize inherent procedural hazards. assumes liability applications assistance customer product design. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. TI's publication information regarding third party's products services does constitute TI's approval, warranty endorsement thereof.
Copyright 1998, Texas Instruments Incorporated

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