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case outlines
00-06-08
Monica Poelking
SHEET SHEET STATUS SHEETS PMIC SHEET
PREPARED Thomas Hess DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED Thomas Hess APPROVED Monica Poelking DRAWING APPROVAL DATE 00-04-04
REVISION LEVEL
MICROCIRCUIT, DIGITAL, CMOS, GATE ARRAY, MONOLITHIC SILICON
AMSC
SIZE SHEET
CAGE CODE
67268
5962-00B02
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E324-00
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following example: 5962
00B02
Federal stock class designator
designator (see 1.2.1) Drawing number
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number MG2044E MG2091E MG2140E MG2194E MG2265E MG2360E MG2480E MG2700E Circuit function 44,000 gates available 91,000 gates available 140,000 gates available 194,000 gates available 265,000 gates available 360,000 gates available 480,000 gates available 700,000 gates available
1.2.3 Device class designator. device class designator single letter identifying product assurance level follows: Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator Figure Figure Figure Figure Figure Figure Figure CQCC2-F172 Figure Figure Figure Figure Terminals Package style Flatpack gull wing leads Flatpack gull wing leads Flatpack gull wing leads Flatpack unformed leads Quad flatpack with non-conductive Flatpack unformed leads Flatpack gull wing leads Flatpack unformed leads Flatpack unformed leads Flatpack unformed leads Flatpack unformed leads Flatpack unformed leads
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class Absolute maximum ratings Supply voltage range (VDD). Input voltage range (VIN). Input current (IIN) Signal Power Output short circuit current VOUT VDD. VOUT Lead temperature (soldering, sec) Storage temperature. Maximum junction temperature (TJ) Recommended operating conditions. Supply voltage range. Ambient operating temperature (TA) -55°C 125°C Digital logic testing device classes Fault coverage measurement manufacturing logic tests (MIL-STD-883, test method 5012) specified -0.5 -0.5 300°C -65°C 150°C 175°C
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. voltages referenced Ground unless otherwise specified. shall exceed maximum output current single output short condition maximum duration second. Duration distance less than This gate array device capable being configured with ±10% ±10%.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings (SMD's). Standard Microcircuit Drawings. Test Method Standard Microcircuits. Configuration Management. Interface Standard Microcircuit Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
requirements. AIDs written against this shall sent DSCC-VA. following items shall provided device manufacturer customer part AID. 3.3.1 Terminal connections assignments. 3.3.2 Package type (see 1.2.4). 3.3.3 Functional block diagram equivalent VHDL behavioral description). 3.3.4 Functional description terms symbols. 3.3.5 Logic diagram equivalent structural VHDL description mutually agreed list). 3.3.6 function description. 3.3.7 Design tape Design document name (i.e., list). 3.3.8 Design functional tape name. 3.3.9 Test functional tape name. 3.3.10 Timing diagram(s). 3.3.11 Fault coverage measurement manufacturing logic tests. 3.3.12 Burn-in circuit. 3.3.13 class voltage. 3.3.14 Device electrical performance characteristics (additions Table Device electrical performance characteristics shall include parametric, functional, parameters other data which would considered required design engineer. electrical performance characteristics apply over full recommended ambient operating temperature range specified test load conditions. 3.3.15 Maximum power dissipation. Maximum power dissipation shall accordance with application specific design. Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix number shall added marking manufacturer. 3.6.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-STD-973. 3.10 Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.11 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified -300 GND, GND, GND, Outputs disabled VOUT Outputs disabled VOUT Outputs disabled VOUT Outputs disabled VOUT Functional verification
Test
Symbol
Group subgroups
Device type -1.2
Limits -0.2
Unit
Input Clamp Voltage
Level Input Current
IILPU ILLPD
IIHPU IIHPD IOZL
Level Input Current, Pull-up Level Input Current, Pull-down
High Level Input Current High Level Input Current, Pull-up High Level Input Current, Pull-down Output Leakage Current Output Leakage High Current Pull-down Output Output Leakage Current Pull-up Output Output Leakage High Current Level Input Voltage Level Output Voltage Level Output Voltage Level Output Voltage High Level Output Voltage High Level Output Voltage notes table.
-120
IOZHPD
IOZLPU IOZH VOL1 VOL2 VOL3 VOH1 VOH2
-120
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
TABLE Electrical performance characteristics.- Continued. Conditions -55°C +125°C unless otherwise specified
Test
Symbol
Group subgroups
Device type
Limits
Unit
High Level Output Voltage Schmitt trigger positive threshold CMOS input input Schmitt trigger negative threshold CMOS input input High Level Input Voltage Input Capacitance Output Capacitance
VOH3
VTVIH Functional verification
notes table.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified -300 GND, GND, 3.3V GND, Outputs disabled VOUT Outputs disabled VOUT Outputs disabled VOUT Outputs disabled VOUT Functional verification +1.5
Test
Symbol
Group subgroups
Device type -1.2
Limits -0.2
Unit
Input Clamp Voltage
Level Input Current
IILPU ILLPD
IIHPU IIHPD IOZL
Level Input Current, Pull-up Level Input Current, Pull-down
High Level Input Current High Level Input Current, Pull-up High Level Input Current, Pull-down Output Leakage Current Output Leakage High Current Pull-down Output Output Leakage Current Pull-up Output Output Leakage High Current Level Input Voltage Level Output Voltage Level Output Voltage Level Output Voltage High Level Output Voltage High Level Output Voltage notes table.
IOZHPD
IOZLPU
IOZH
VOL1
VOL2
VOL3
VOH1
VOH2
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
TABLE Electrical performance characteristics.- Continued. Conditions -55°C +125°C unless otherwise specified
Test
Symbol
Group subgroups
Device type
Limits
Unit
High Level Output Voltage Schmitt trigger positive threshold CMOS input input Schmitt trigger negative threshold CMOS input input High Level Input Voltage Input Capacitance Output Capacitance
VOH3
VTVIH Functional verification
Forcing conditions functional test, assure that these limits met, they will individually recorded. Read Record measurements accordance with MIL-PRF-38535. Tested initial design after major process changes, otherwise guaranteed.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
Case
Figure Case outlines Continued
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition described AID. test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein except where option MIL-PRF-38535 permits alternate in-line control testing. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4).
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
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5962-00B02
SHEET
4.4.1 Group inspection. Tests shall specified table herein. device class subgroups tests shall sufficient verify functionality device described AID. These tests shall have been fault graded accordance with MIL-STD-883, test method 5012 (see herein) described manufacturers plan. TABLE Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) applies subgroup applies subgroups 4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition described AID. test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883. Subgroups accordance with MIL-PRF-38535, table III) Device class Device class
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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5962-00B02
SHEET
4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). End-point electrical parameters shall specified table herein. device classes devices test vehicle shall subjected radiation hardness assured tests specified MIL-PRF-38535 level being tested. device class devices shall subjected radiation hardness assured tests specified MIL-PRF-38535, appendix level being tested. device classes must meet postirradiation end-point electrical parameter limits defined table +25°C ±5°C, after exposure, subgroups specified table herein. When specified purchase order contract, copy delta limits shall supplied.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor prepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished accordance with MIL-STD-973 using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. Comments. Comments this drawing should directed DSCC-VA Columbus, Ohio 43216-5000, telephone (614) 692-0674. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
STANDARD MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00B02
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 00-06-08 Approved sources supply 5962-00B02 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-00B0201Q_C 5962-00B0201V_C 5962-00B0202Q_C 5962-00B0202V_C 5962-00B0203Q_C 5962-00B0203V_C 5962-00B0204Q_C 5962-00B0204V_C 5962-00B0205Q_C 5962-00B0205V_C 5962-00B0206Q_C 5962-00B0206V_C 5962-00B0207Q_C 5962-00B0208Q_C
Vendor CAGE number OHGZ7
Vendor similar MG2044E
OHGZ7
MG2091E
OHGZ7
MG2140E
OHGZ7
MG2194E
OHGZ7
MG2265E
OHGZ7
MG2360E
OHGZ7 OHGZ7
MG2480E MG2700E
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. nature this SMD, standard microcircuit drawing corresponding vendor similar shall specified AID. Vendor CAGE number OHGZ7 Vendor name address Temic S.A. Chantrerie Route Gachet 44306 Nantes Cedex France
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
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