THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE CH

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SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED Larry Gauder
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED Thanh Nguyen
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216
APPROVED Monica Poelking
MICROCIRCUIT, DIGITAL, CMOS, 8-BIT MICROCONTROLLER, MONOLITHIC SILICON
DRAWING APPROVAL DATE 00-10-05
AMSC
REVISION LEVEL
SIZE SHEET
CAGE CODE
67268
5962-00518
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E552-00
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following example: 5962 Federal stock class designator designator (see 1.2.1) Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number 80C32 Circuit function CMOS 8-bit microcontroller 00518 Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5)
1.2.3 Device class designator. device class designator single letter identifying product assurance level follows: Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator CDIP2-T40 CQCC2-J44 Terminals Package style dual-in-line package leaded chip carrier
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
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Absolute maximum ratings. Supply voltage (VDD) Input voltage (VIN) Output current (IOUT) Power dissipation (PD). Storage temperature range (Tstg). Lead temperature (soldering seconds). Junction temperature (TJ) Thermal resistance, junction case (JC). Recommended operating conditions. Supply voltage range (VDD) Case operating temperature range (TC). Digital logic testing device classes Fault coverage measurement manufacturing logic tests (MIL-STD-883, test method 5012) APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings (SMD's). Standard Microcircuit Drawings. Test Method Standard Microcircuits. Configuration Management. Interface Standard Electronic Component Case Outlines. -55°C +125°C -0.3 +7.0 -0.3 +0.3 -65°C 150°C +265°C 165°C 30°C/W
percent
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. Values will added when they become available.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00518
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Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained. REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outline(s). case outline(s) shall accordance with 1.2.4. 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Functional diagram. functional diagram shall specified figure 3.2.4 Timing waveforms. timing waveforms shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-STD-973.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00518
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Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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TABLE Electrical performance characteristics. Conditions -55°C +125°C unless otherwise specified -400 -150 (Under Test) 0.45 (Under Test)
Test
Symbol
Group subgroups
Device type
Limits 0.45 0.45
Unit
High output voltage
VOH1 VOH2 VOH3 VOH4 VOH5 VOH6
3.375 3.375 4.05 4.04
output voltage
VOL1 VOL2
Quiescent current Supply current Power down supply current
IDD(S) IDD(PD1) IDD(PD2)
level input leakage current High level input leakage current
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified (Under Test) 0.45 (Remaining Inputs) (Under Test) (Remaining Inputs) (Under Test) Open, (Under Test) Open Verify truth table without load VOUT 4.4.1b Verify truth table without load VOUT 4.4.1b Verify truth table without load VOUT 4.4.1b Verify truth table without load VOUT 4.4.1b Verify truth table with load VOUT 4.4.1b Outputs: 1TTL
Test
Symbol
Group subgroups
Device type
Limits
Unit
level input current
IIL2
High transition current Input clamp voltage VSS) Input clamp voltage VDD) Reset resistor Functional test Instruction
-750
VIC1 VIC2 RRST
-0.2
Functional test Internal register
Functional test Interrupts
Functional test Timer
Functional test Serial port
footnotes table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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REVISION LEVEL
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TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified Verify truth table with load VOUT 4.4.1b Outputs: 1TTL Verify truth table with load VOUT 4.4.1b Outputs: 1TTL Verify truth table with load VOUT 4.4.1b Outputs: 1TTL CIN/COUT VIN/OUT (Not under test) MHz, 4.4.1c figure
Test
Symbol
Group subgroups
Device type
Limits
Unit
Functional test External data
Functional test Program counter
Functional test
Input/output capacitance
pulse width Address valid Address hold valid Inst. PSEN valid Inst. Address valid Inst. footnotes table.
tLHLL tAVLL tLLAX tLLIV tPLIV tAVIV
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DSCC FORM 2234
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TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified figure
Test
Symbol
Group subgroups
Device type
Limits
Unit
tRLDV valid data valid data tAVWL Address tAVRL Address tLLPL PSEN tPLPH PSEN pulse width tPXIX PSEN Inst. hold tPXAV PSEN address valid tRLRH pulse width tWLWH pulse width data address hold data hold tRHDZ data float Address valid data tQVWX Data valid tQVWH Data setup high tWHQX data hold tRLAZ address float tWHLH high high footnotes table. tAVDV tLLRL tLLAXR tRHDX tLLDV tLLWL
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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TABLE Electrical performance characteristics Continued. Conditions -55°C +125°C unless otherwise specified figure
Test
Symbol
Group subgroups
Device type
Limits
Unit
tRHLH high high Serial port clock cycle time data setup clock Clock data hold Clock data hold Clock high data valid tXLXL tQVXH tXHQX tXHDX tXHDV
Guaranteed tested. measured with output pins disconnected; XTAL1 driven with tCLCH tCHCL +0.5 -0.5V; XTAL2 VSS; PORT0 VDD. IDD(S) measured with output pins disconnected; XTAL1 driven with tCLCH tCHCL +0.5 -0.5V; XTAL2 PORT0 VSS. IDD(PD) measured with output pins disconnected; PORT0 VDD; XTAL2 XTAL1 VSS. Functional test includes: Instruction set, Internal registers, Interrupts, Timer, Serial port, External data, Program counter, Ram, Idle mode, Power-down mode. Other parameters (guaranteed): -0.5 0.2VDD -0.25 (0.85 Except 0.2VDD -0.45 0.2VDD +1.1 (2.0 Except pins XTAL1, RESET: 0.7VDD +0.2
+0.5
Measurements shall performed percent basis, Read Record.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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Device type Case outline Number
Symbol T2/P1.0 T2EX/P1.1 P1.2 P1.3 P1.4 P1.5 P1.6 P1.7 P3.0/RXD P3.1/TXD P3.2/INT0 P3.3/INT1 P3.4/T0 P3.5/T1 P3.6/WR P3.7/RD XTAL2 XTAL1
Number
Symbol P2.0 P2.1 P2.2 P2.3 P2.4 P2.5 P2.6 P2.7 PSEN P0.7 P0.6 P0.5 P0.4 P0.3 P0.2 P0.1 P0.0
Device type Case outline Number connection.
Symbol P1.5 P1.6 P1.7 P3.0/RXD P3.1/TXD P3.2.INT0 P3.3/INT1 P3.4/T0 P3.5/T1 P3.6/WR P3.7/RD XTAL2 XTAL1 P2.0 P2.1 P2.2 P2.3 P2.4
Number
Symbol P2.5 P2.6 P2.7 PSEN P0.7 P0.6 P0.5 P0.4 P0.3 P0.2 P0.1 P0.0 T2/P1.0 T2EX/P1.1 P1.2 P1.3 P1.4
FIGURE Terminal connections.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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NOTE: this device, only externally addressable using signal requirements.
FIGURE Functional diagram.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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REVISION LEVEL
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FIGURE Timing waveforms.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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FIGURE Timing waveforms Continued.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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SHIFT REGISTER TIMING WAVEFORMS
SYMBOL tXLXL tQVXH tXHQX tXHDX tXHDV
PARAMETER Serial Port Clock Time Output Data Setup Clock Rising Edge Output Data Hold After Clock Rising Edge Input Data Hold After Clock Rising Edge Clock Rising Edge Input Data Valid
12tCLCL 10tCLCL-133 2tCLCL-117
10tLCL-133
UNIT
FIGURE Timing waveforms Continued.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-00518
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QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MILPRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein except where option MIL-PRF-38535 permits alternate in-line control testing. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4).
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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5962-00518
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4.4.1 Group inspection. Tests shall specified table herein. device class subgroups tests shall sufficient verify truth table. device classes subgroups shall include verifying functionality device; these tests shall have been fault graded accordance with MIL-STD-883, test method 5012 (see herein). Subgroup (CIN COUT measurements) shall measured only initial test after process design changes which affect input capacitance. minimum sample devices with zero rejects shall required.
TABLE Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) 7,8A, 7,8A, 7,8A, 7,8A, Subgroups accordance with MIL-PRF-38535, table III) Device class Device class
applies subgroup applies subgroups 4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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5962-00518
SHEET
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MILSTD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). End-point electrical parameters shall specified table herein. device classes devices test vehicle shall subjected radiation hardness assured tests specified MIL-PRF-38535 level being tested. device class devices shall subjected radiation hardness assured tests specified MIL-PRF-38535, appendix level being tested. device classes must meet postirradiation end-point electrical parameter limits defined table +25°C ±5°C, after exposure, subgroups specified table herein. When specified purchase order contract, copy delta limits shall supplied.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor prepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished accordance with MIL-STD-973 using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0674. Comments. Comments this drawing should directed DSCC-VA Columbus, Ohio 43216-5000, telephone (614) 692-0674. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535, MIL-HDBK-1331, follows:
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descriptions. Port Port 8-bit open drain bi-directional port. Port pins that have written them float that state used high impedance inputs. Port also multiplexed low-order address data during accesses external program data memory. this application, uses strong internal pull-ups when emitting 1's. External pull-ups required during program verification. Port sink eight inputs. Port also outputs code bytes during program verification device. Port Port 8-bit bi-directional port with internal pull-ups. Port pins that have written them pulled high internal pull-ups, that state used inputs. inputs, Port pins that externally being pulled will source current because internal pull-ups. Port also receives order address byte during program verification. drive CMOS inputs without external pull-ups. Also this device Port sink/source three inputs. inputs Port also used Timer/Counter P1.0 (T2): External clock inputs. P1.1 (T2EX): Trigger input reloaded captured causing Timer/Counter interrupt. Port Port2 8-bit bi-directional port with internal pull-ups. Port pins that have written them pulled high internal pull-ups that state used inputs. inputs, Port pins that externally being pulled will source current because internal pull-ups. Port emits high-order address byte during fetches from external Program Memory during accesses external Data Memory that 16-bit addresses. this application, uses strong internal pull-ups when emitting 1's. During access external Data Memory that 8-bit addresses, Port emits contents Special Function Register. Port sink/source three inputs. drive CMOS inputs with external pull-ups. this device Port also receives high-order address bits control signals during program verification. Port Port 8-bit bi-directional port with internal pull-ups. Port pins that have written them pulled high internal pull-ups that state used inputs. inputs, Port pins that externally being pulled will source current because pull-ups. also serves functions various special features MCS-51 Family listed below. PORT P3.0 P3.1 P3.2 P3.3 P3.4 P3.5 P3.6 P3.7 ALTERNATE FUNCTION (Serial Input Port) (Serial Output Port) INT0 (External Interrupt INT1 (External Interrupt (Timer External Input) (Timer External Input) (External Data Memory Write Strobe) (External Data Memory Read Strobe)
Port sink/source three inputs. drive CMOS inputs without external pull-ups. high level this machine cycles while oscillator running, resets device. internal pull-down resistor permits Power-On reset using only capacitor connected VDD. soon reset applied (VIN), Ports tied "1". This operation achieved asynchronously even oscillator does startup. Address Latch Enable output latching byte address during accesses external memory. activated though this purpose constant rate oscillator frequency except during external data memory access which time pulse skipped. sink/source inputs. drive CMOS inputs without external pull-up.
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descriptions Continued. PSEN Program Store Enable read strobe external Program Memory. PSEN activated twice each machine cycle during fetches from external Program Memory (however, when executing external Program Memory, activations PSEN skipped during each access external Data Memory). PSEN activated during fetches from internal Program Memory. PSEN sink/source inputs. drive CMOS inputs without external pull-up. When held high, executes internal Program Memory (unless Program Counter exceeds 3FFFH). When held low, executes only external Program Memory. must floated.
XTAL1 Input inverting amplifier that forms oscillator. Receives external oscillator signal when external oscillator used. XTAL2 Output inverting amplifier that forms oscillator input internal clock generator. This should floated when external oscillator used. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
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STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 00-10-05 Approved sources supply 5962-00518 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-0051801QQC 5962-0051801VQC 5962-0051801QXC 5962-0051801VXC
Vendor CAGE number F7400 F7400 F7400 F7400
Vendor similar MC80C32E-30MQ SC80C32E-30SV MJ80C32E-30MQ SJ80C32E-SV
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing.
Vendor CAGE number F7400
Vendor name address TEMIC Chantrerie 44306 Nantes CEDEX France Point contact: TEMIC 2325 Orchard Parkway Jose, 95131
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.

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