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EPIC (Enhanced-Performance Implanted CMOS) Submicron Process Ioff Supp
Top Searches for this datasheetSN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS EPIC (Enhanced-Performance Implanted CMOS) Submicron Process Ioff Supports Partial-Power-Down Mode Operation Supports Operation Package Options Include Plastic Thin Shrink Small-Outline (DCT, DCU) Packages PACKAGE (TOP VIEW) description This dual buffer gate designed 1.65-V 5.5-V operation. SN74LVC2G125 features dual line drivers with 3-state outputs. outputs disabled when associated output-enable (OE) input high. ensure high-impedance state during power power down, should tied through pullup resistor; minimum value resistor determined current-sinking capability driver. This device fully specified partial-power-down applications using Ioff. Ioff circuitry disables outputs, preventing damaging current backflow through device when powered down. SN74LVC2G125 characterized operation from -40°C 85°C. FUNCTION TABLE (each buffer) INPUTS OUTPUT logic symbol This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. EPIC trademark Texas Instruments Incorporated. PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice. Copyright 2000, Texas Instruments Incorporated POST OFFICE 655303 DALLAS, TEXAS 75265 PRODUCT PREVIEW SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS logic diagram (positive logic) absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, -0.5 Input voltage range, (see Note -0.5 Output voltage range, (see Notes -0.5 Input clamp current, Output clamp current, Continuous output current, Continuous current through ±100 Package thermal impedance, (see Note package 296°C/W package 329°C/W Storage temperature range, Tstg -65°C 150°C Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input negative-voltage output voltage ratings exceeded input output current ratings observed. value provided recommended operating conditions table. package thermal impedance calculated accordance with JESD PRODUCT PREVIEW POST OFFICE 655303 DALLAS, TEXAS 75265 SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS recommended operating conditions (see Note Supply voltage Operating Data retention only 1.65 1.95 1.65 1.95 1.65 High-level output current 1.65 Low-level output current 0.15 Input transition rise fall rate 1.65 0.65 0.35 ns/V UNIT High-level High level input voltage Low-level level input voltage Input voltage Output voltage Operating free-air temperature NOTE unused inputs device must held ensure proper device operation. Refer application report, Implications Slow Floating CMOS Inputs, literature number SCBA004. POST OFFICE 655303 DALLAS, TEXAS 75265 PRODUCT PREVIEW SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER -100 inputs GND, input TEST CONDITIONS 1.65 1.65 1.65 1.65 Other inputs 1.65 VCC-0.1 0.45 0.55 0.55 UNIT PRODUCT PREVIEW Ioff typical values 25°C. switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (see Figures through PARAMETER tdis FROM (INPUT) (OUTPUT) 0.15 UNIT operating characteristics, 25°C PARAMETER Power dissipation capacitance TEST CONDITIONS UNIT POST OFFICE 655303 DALLAS, TEXAS 75265 SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS PARAMETER MEASUREMENT INFORMATION 0.15 From Output Under Test (see Note Open TEST tPLZ/tPZL tPHZ/tPZH Open LOAD CIRCUIT Timing Input Data Input VCC/2 VCC/2 VCC/2 VOLTAGE WAVEFORMS SETUP HOLD TIMES Output Waveform (see Note tPZH Output VCC/2 VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES VCC/2 Output Waveform (see Note Output Control tPZL Input VCC/2 tPLH VCC/2 tPHL VCC/2 VCC/2 tPLZ VCC/2 0.15 tPHZ 0.15 VOLTAGE WAVEFORMS ENABLE DISABLE TIMES Input VCC/2 VOLTAGE WAVEFORMS PULSE DURATION VCC/2 VCC/2 NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 PRODUCT PREVIEW SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS PARAMETER MEASUREMENT INFORMATION From Output Under Test (see Note Open TEST tPLZ/tPZL tPHZ/tPZH Open LOAD CIRCUIT Timing Input VCC/2 VCC/2 VCC/2 VOLTAGE WAVEFORMS SETUP HOLD TIMES Output Waveform (see Note tPZH Output VCC/2 VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES VCC/2 Output Waveform (see Note Output Control tPZL Input VCC/2 tPLH VCC/2 tPHL VCC/2 VCC/2 tPLZ VCC/2 0.15 tPHZ 0.15 VOLTAGE WAVEFORMS ENABLE DISABLE TIMES Input VCC/2 VOLTAGE WAVEFORMS PULSE DURATION VCC/2 PRODUCT PREVIEW Data Input VCC/2 NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS PARAMETER MEASUREMENT INFORMATION Open TEST tPLZ/tPZL tPHZ/tPZH Open From Output Under Test (see Note LOAD CIRCUIT Timing Input Data Input VOLTAGE WAVEFORMS SETUP HOLD TIMES Input VOLTAGE WAVEFORMS PULSE DURATION Output Control tPZL Output Waveform (see Note tPZH Output Waveform (see Note tPLZ tPHZ VOLTAGE WAVEFORMS ENABLE DISABLE TIMES Input tPLH tPHL Output VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 PRODUCT PREVIEW SN74LVC2G125 DUAL BUFFER GATE WITH 3-STATE OUTPUTS PARAMETER MEASUREMENT INFORMATION Open From Output Under Test (see Note TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open LOAD CIRCUIT Timing Input VCC/2 VCC/2 VOLTAGE WAVEFORMS SETUP HOLD TIMES VCC/2 Input VCC/2 VCC/2 Data Input PRODUCT PREVIEW VOLTAGE WAVEFORMS PULSE DURATION Input tPLH Output tPHL VCC/2 VCC/2 VCC/2 VCC/2 tPHL VCC/2 tPLH Output VCC/2 VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS Output Control tPZL VCC/2 VCC/2 tPLZ VCC/2 tPZH tPHZ VCC/2 Output Waveform (see Note Output Waveform (see Note VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. 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