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AH5010 AH5011 AH5012 Monolithic Analog Current Switches versatile


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AH5010 AH5011 AH5012 Monolithic Analog Current Switches
AH5010 AH5011 AH5012 Monolithic Analog Current Switches
versatile family monolithic JFET analog switches economically fulfills wide variety multiplexing analog switching applications Even numbered switches driven directly from standard logic whereas numbered switches intended applications utilizing logic monolithic construction guarantees tight resistance match track voltage switching applications LF13331 LF13332 LF13333 Analog Switch Family CMOS Analog Switch Family
Active filters Signal multiplexers demultiplexers Multiple channel Quad compressors expanders Choppers demodulators Programmable gain amplifiers High impedance voltage buffer Sample hold
Features
Applications
converters Micropower converters Industrial controllers Position controllers Data acquisition
Interfaces with standard CMOS ``ON'' resistance match ``ON'' resistance Very leakage Large analog signal range High switching speed Excellent isolation between channels
100X peak
Connection Schematic Diagrams (All switches shown logical ``1'' input)
Dual-In-Line Package Dual-In-Line Package
LOGIC DRIVE LOGIC LOGIC
CHANNEL AH5010C
SPST SWITCHES AH5012C AH5011C
AH5010C Switches (4-Channel Version Shown) Order Number AH5010CN Package Number M14A N14A
AH5011C AH5012C SPST Switches (Quad Version Shown) Order Number AH5011CN AH5012CM AH5012CN Package Number M16A N16A
Note diode cathodes internally connected substrate
5659
C1995 National Semiconductor Corporation
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RRD-B30M115 Printed
Absolute Maximum Ratings (Note
Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Input Voltage AH5010 AH5011 AH5012 Positive Analog Signal Voltage Negative Analog Signal Voltage Diode Current
Drain Current Soldering Information Package Package Vapor Phase Infrared Power Dissipation Operating Temperature Range Storage Temperature Range
Electrical Characteristics AH5010 AH5012 (Notes
Symbol IGSX ID(OFF) IG(ON) IG(ON) IG(ON) rDS(ON) VDIODE rDS(ON) TOFF Parameter Input Current ``OFF'' Leakage Current ``OFF'' Leakage Current ``ON'' Leakage Current ``ON'' Leakage Current ``ON'' Drain-Source Resistance Forward Diode Drop Match Turn ``ON'' Time Turn ``OFF'' Time Cross Talk Conditions 5VsVGDs11V Test Circuit Test Circuit Test Circuit Units
Electrical Characteristics AH5011 (Notes
Symbol IGSX ID(OFF) IG(ON) IG(ON) IG(ON) rDS(ON) VDIODE rDS(ON) TOFF Parameter Input Current ``OFF'' Leakage Current ``OFF'' Leakage Current ``ON'' Leakage Current ``ON'' Leakage Current ``ON'' Drain-Source Resistance Forward Diode Drop Match Turn ``ON'' Time Turn ``OFF'' Time Cross Talk Conditions 11VsVGDs15V Test Circuit Test Circuit Test Circuit Units
Note Absolute maximum ratings indicate limits beyond which damage device occur electrical specifications apply when operating device beyond specified operating conditions Note Test conditions unless otherwise noted Note ``OFF'' ``ON'' notation refers conduction state switch Note Thermal Resistance N14A N16A M14A M16A
Test Circuits Switching Time Waveforms
Cross Talk Test Circuit
Time Waveforms
Test Circuit
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Typical Performance Characteristics
Parameter Interaction Leakage Current ID(OFF) Temperature
``ON'' Resistance rDS(ON) Temperature
Cross Talk Frequency
Leakage Current Drain-Gate Voltage
Transconductance Drain Current
Drain Current Bias Voltage
Normalized Drain Resistance Bias Voltage
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Applications Information
Theory Operation series analog switches primarily intended operation current mode switch applications drains switch held near ground operating into summing junction operational amplifier Limiting drain voltage under hundred millivolts eliminates need special gate driver allowing switches driven directly standard 5V-10V CMOS open collector CMOS basic switch configurations available independent switches (SPST) pole switches used multiplexing PST-MUX) versions such AH5010 offer common drains include series operated additional placed feedback path order compensate ``ON'' resistance switch shown Figure closed-loop gain Figure rDS(ON)Q2 AVCL rDS(ON)Q1 gain accuracy determined rDS(ON) match between Typical match between ohms resulting gain accuracy (for Noise Immunity switches with source diodes grounded exhibit improved noise immunity positive analog signals ``OFF'' state With source clamped about diode (VGS ensuring that signals imposed input will gate ``ON Selection Gain Setting Resistors Since series analog switches operated current mode generally advisable make signal current large possible However current through switch tends forward bias source gate junction signal shunting diode resulting leakage through these junctions shown Figure IG(ON) represents finite error current reaching summing junction Secondly rDS(ON) begins ``round'' approaches IDSS practical rule thumb maintain less than IDSS Combining criteria from above discussion yields VA(MAX) (2a) R1min IG(ON) VA(MAX) IDSS whichever larger
(2b)
FIGURE Compensation
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FIGURE Leakage Current IG(ON)
Applications Information (Continued)
Where VA(MAX) Peak amplitude analog input signal Desired accuracy IG(ON) IDSS
Leakage given Saturation current
Accordingly VA(MIN) ID(OFF) Where VA(MIN) Minimum value analog input signal Desired accuracy R1(MAX)s ID(OFF)
Number channels ``OFF'' leakage given
switch typical application might CsTAs85 criterion equation (2b) predicts (10V) R1(MIN)t electrical characteristics guarantee IG(ON)s AH5010 criterion equation (2a)
switch example ID(OFF) AH5010 R1(MAX) R1(MAX)s (1V)(10b3) (10)(10 10b9)
Selection course depends gain desired unity gain Lastly foregoing discussion ignored resistor tolerances input bias current offset voltage which should considered setting overall gain accuracy circuit Compatibility series driven with different logic voltage swings even numbered part types specified driven from standard logic numbered types from open collector
R1(MIN)t
(10V)(10b3) 10b6
Since equation (2a) predicts higher value resistor should used ``OFF'' condition also affects gain accuracy shown Figure leakage across ID(OFF) represents finite error current arriving summing junction
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FIGURE
Applications Information (Continued)
Standard gates pull-up about load) order ensure turn-off even numbered switches such AH5010 pull-up resistor REXT least should placed between gate output shown Figure Likewise open-collector high voltage outputs should pull-up resistor shown Figure both cases t(OFF) improved lower values REXT expense power dissipation state Definition Terms terms referred electrical characteristics tables defined Figure
FIGURE Interfacing with
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FIGURE Interfacing with Open Collector
Applications Information (Continued)
FIGURE Definition Terms
Typical Applications
De-Glitched Switch Noiseless Audio Switching
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Typical Applications (Continued)
3-Channel Multiplexer with Sample Hold
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8-Bit Binary (BCD) Multiplying Converter
Recommended resistor array connection application
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Beckman resistor arrays Part 698-1-R 100k recommended
Note switch ``ON'' when (Logic ``0'')
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Typical Applications (Continued)
16-Channel Multiplexer
CHARACTERISTICS ERROR TYPICAL 10mV TYPICAL
Note analog switch between input switches reduces errors leakage resistors
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Typical Applications (Continued)
Gain Programmable Amplifier
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Physical Dimensions inches (millimeters)
Small Outline Package Order Number AH5010CM Package Number M14A
Physical Dimensions inches (millimeters) (Continued)
Small Outline Package Order Number AH5012CM Package Number M16A
Dual-In-Line Package Order Number AH5010CN Package Number N14A
AH5010 AH5011 AH5012 Monolithic Analog Current Switches
Physical Dimensions inches (millimeters) (Continued)
Dual-In-Line Package Order Number AH5011CN AH5012CN Package Number N16A
LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
National Semiconductor Europe (a49) 0-180-530 Email cnjwge tevm2 Deutsch (a49) 0-180-530 English (a49) 0-180-532 Fran (a49) 0-180-532 Italiano (a49) 0-180-534
National Semiconductor Hong Kong 13th Floor Straight Block Ocean Centre Canton Tsimshatsui Kowloon Hong Kong (852) 2737-1600 (852) 2736-9960
National Semiconductor Japan 81-043-299-2309 81-043-299-2408
National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

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