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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Quad 2-Input Multiple


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QS54/74FCT157T, 158T, 257T, 2157T, 2257T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Quad 2-Input Multiplexers
DESCRIPTION
QS54/74FCT157T QS54/74FCT158T QS54/74FCT257T QS54/74FCT2157T QS54/74FCT2257T
function compatible 74FCT257, 74FCT157/8 74FCT2157/2257 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 157T, 158T, 257T JEDEC-FCT spec compatible speed grades with 4.3ns 48mA Ind., 32mA Mil. FCT-T 2157T, 2257T Built-in series resistor outputs reduce reflection other system noise Std., speed grades with 4.3ns 12mA Ind.
QSFCT157T/8T QSFCT257T highspeed CMOS TTL-compatible, quad, 2-input multiplexers. 157/257 parts non-inverting; inverting. 157/8 outputs; 3-state outputs. QSFCT2157T QSFCT2257T resistor output versions useful driving transmission lines reducing system noise. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001). Outputs will load active when removed from device.
Figure Functional Block Diagram
Inverting Outputs Only
3-STATE ENABLE 257/2257 ONLY. (FCT2xxx Only)
MDSL-00007-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT157T, 158T, 257T, 2157T, 2257T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP
HQSOP
Note: Available both wide SOIC (package code SOIC (package code SO).
Table Description
Name YA-YD Description Data Inputs Select Input Enable Input Data Outputs
Table Function Tables
FCT157/2157 FCT158 Function Disable Select Select
FCT257/2257 Hi-Z Hi-Z Hi-Z Hi-Z Function Disable Select Select
QUALITY SEMICONDUCTOR, INC.
MDSL-00007-04 DECEMBER 1998
QS54/74FCT157T, 158T, 257T, 2157T, 2257T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-3, 13-15 SOIC QSOP PDIP
Notes: Capacitance characterized tested. reference 16-pin package.
Unit
Table Power Supply Characteristics
Symbol QCCD Parameter Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4) 0.25 Unit
Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00007-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT157T, 158T, 257T, 2157T, 2257T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) (257, 2257) Short Circuit Current (FCTXXX) Current Drive (FCT2XXX) Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX- Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Military -55°C 125°C, 5.0V ±10% Typ(1) Unit
ROUT
Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND)
-0.7 -1.2 0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2XXX-
QUALITY SEMICONDUCTOR, INC.
MDSL-00007-04 DECEMBER 1998
QS54/74FCT157T, 158T, 257T, 2157T, 2257T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 157/8A 257A 2157A 2257A 157/8C 257C 2157C 2257C Unit
2257 Symbol tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay 157/8/257 Propagation Delay 2157/2257 Propagation Delay 157/8/257 Propagation Delay 2157/2257 Propagation Delay 157/8 Propagation Delay 2157 Ouput Enable Time Output Enable Time 2257 Output Disable Time 257/2257 Ind(2) Mil(2) 10.5 10.5 10.5 10.5
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00007-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

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