QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual 4-Input Multiple

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual 4-Input Multiple

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QS54/74FCT153T, 253T, 2153T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Dual 4-Input Multiplexers
DESCRIPTION
QS54/74FCT153T QS54/74FCT253T QS54/74FCT2153T
function compatible 74F153/253 74FCT153/253 74FCT153T/253T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available PDIP, SOIC, QSOP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 153T, 253T JEDEC-FCT spec compatible speed grades with 4.5ns 48mA Ind., 32mA Mil. FCT-T 2153T Built-in series resistor outputs reduce reflection other system noise speed grade with 5.2ns 12mA Ind.
QSFCT153T QSFCT253T high-speed CMOS TTL-compatible dual 4-input multiplexers. ouputs; 3-state outputs. QSFCT2153T resistor output version useful driving transmission lines reducing system noise. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001). Ouputs will load active when removed from device.
Figure Functional Block Diagram
3-STATE ENABLE ONLY
(FCT2153 Only)
(FCT2153 Only)
MDSL-00006-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT153T, 253T, 2153T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP
HQSOP
Note: Available both wide SOIC (package code wide SOIC (package code SO).
Table Description
Name I7-I0 S1-S0
Select
Description Data Select Enable Data
Table Function Table
Enable 153, 2153 HI-Z HI-Z Function Disable Disable S1-0 S1-0 S1-0 S1-0
QUALITY SEMICONDUCTOR, INC.
MDSL-00006-04 DECEMBER 1998
QS54/74FCT153T, 253T, 2153T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage this device resulting functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-6, 10-15 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 16-pin package.
0.25 Unit
Table Power Supply Characteristics
Symbol Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
Supply Current Input HIGH Supply Current Input
QCCD
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00006-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT153T, 253T, 2153T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z)(FCT253) Short Circuit Current FCTXXX Current Drive FCT2153 Input Clamp Voltage Output HIGH Voltage Output Voltage FCTXXX Output Voltage FCT2153 (25) Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min., Min., Min., Min., -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance FCT2153 (25)
QUALITY SEMICONDUCTOR, INC.
MDSL-00006-04 DECEMBER 1998
QS54/74FCT153T, 253T, 2153T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 153A 253A 2153A Symbol tOEH tOEL tOEH tOEL tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay 153/253 Propagation Delay 2153 Propagation Delay 153/253 Propagation Delay 2153 Output Enable Time Output Enable Time 2153 Ouput Enable Time Output Disable Time(2)
153C 253C Unit
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00006-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual 4-Input Multiple

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