QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Input Multiplexers
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QS54/74FCT151T, 251T, 2151T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Input Multiplexers
DESCRIPTION
QS54/74FCT151T QS54/74FCT251T QS54/74FCT2151T
function compatible 74F151/251 74FCT151/251 74FCT151T/251T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 151T, 251T JEDEC-FCT spec compatible speed grades with 4.5ns 48mA Ind., 32mA Mil. FCT-T 2151T Built-in series resistor outputs reduce reflection other system noise Std., speed grades with 4.5ns 12mA Ind.
QSFCT151T QSFCT251T high-speed CMOS TTL-compatible 8-input muliplexers. outputs; 3-state outputs. QSFCT2151T resistor output version useful driving transmission lines reducing system noise. inputs have clamp diodes undershoot noise suppression. ouputs have ground bounce suppression (see Application Note AN-001). Outputs will load active when removed from device.
Figure Functional Block Diagram
3-STATE ENABLE ONLY
(FCT2151 Only)
MDSL-00005-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT151T, 251T, 2151T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP HQSOP
Note: Available both wide SOIC (package code SOIC (package code SO).
Table Description
Name I7-I0 S2-S0 Description Data Enable Select Data
Select
Table Function Table
151, 2151 HI-Z HI-Z Function Disable S2-0 S2-0 S2-0 S2-0 S2-0 S2-0 S2-0 S2-0
QUALITY SEMICONDUCTOR, INC.
MDSL-00005-04 DECEMBER 1998
QS54/74FCT151T, 251T, 2151T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage this device resulting functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-3, 13-15 4-7, SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 16-pin package.
0.25 Unit
Table Power Supply Characteristics
Symbol Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
Supply Current Input HIGH Supply Current Input
QCCD
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00005-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT151T, 251T, 2151T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z)(FCT251) Short Circuit Current (FCTXXX) Current Drive (FCT2151) Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2151- Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min., -12mA (MIL) -15mA (IND) Min., 32mA (MIL) 48mA (IND) Min., 12mA (MIL) 12mA (IND) Min., 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2151-
QUALITY SEMICONDUCTOR, INC.
MDSL-00005-04 DECEMBER 1998
QS54/74FCT151T, 251T, 2151T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 151A 251A 2151A
2151 Symbol tOEH tOEL tOEH tOEL tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay 151/251 Propagation Delay 2151 Propagation Delay 151/251 Propagation Delay 2151 Output Enable Time Output Enable Time 2151 Ouput Enable Time Output Disable Time(2)
151C 2151C Unit
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00005-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
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