QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual Binary 1-of-4 De

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual Binary 1-of-4 De

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QS54/74FCT139T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Dual Binary 1-of-4 Decoders
DESCRIPTION
QS54/74FCT139T
QSFCT139D with 4.0ns propagation delay Industrial temperature -40°C 85°C 48mA IND, 32mA TTL-compatible input output levels product compliant with MIL-STD 883, Class CMOS power levels 7.5mW static Available DIP, SOIC, QSOP, HQSOP JEDEC standard pinouts
QSFCT139T high-speed CMOS TTLcompatible high-speed binary decoder. QSFCT139T negative active outputs. high output current drive high-capacitance loads. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
MDSL-00004-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT139T Figure Configurations (All Pins View)
DIP, SOIC, QSOP HQSOP
Note: Available both wide SOIC (package code SOIC (package code SO).
Table Description
Name Description Select Inputs Decode Outputs Enable
Select
Table Function Table
Enable FCT139 Output Note Disable Decode A1-0 A1-0 A1-0 A1-0
QUALITY SEMICONDUCTOR, INC.
MDSL-00004-04 DECEMBER 1998
QS54/74FCT139T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage this device resulting functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 9-12 4-6, 13-15 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 16-pin package.
Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol Parameter Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., VOUT GND(2,3) Min., -18mA, 25°C Min., Min., -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Short Circuit Current Input Clamp Voltage Output HIGH Voltage Output Voltage Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 0.50 0.50 Unit
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
MDSL-00004-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT139T Table Power Supply Characteristics
Symbol QCCD Parameter Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4) 0.25 Unit
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Symbol tPHL tPLH Description(1)
Military -55°C 125°C, 5.0V ±10%
tPHLE tPLHE
Propagation Delay Propagation Delay
139A 139C 139D Unit
Notes: Minimums guaranteed tested. Test Circuit Waveforms.
QUALITY SEMICONDUCTOR, INC.
MDSL-00004-04 DECEMBER 1998

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Dual Binary 1-of-4 De

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