QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 1-of-8 Decoders

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 1-of-8 Decoders

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QS54/74FCT138T, 238T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 1-of-8 Decoders
QS54/74FCT138T QS54/74FCT238T
DESCRIPTION
QSFCT138T QSFCT238T high-speed CMOS TTL-compatible high-speed binary decoders. QSFCT138T negative active outputs, QSFCT238T positive active outputs. high output current drive highcapacitance loads. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
QSFCT138A faster than Industrial temperature -40°C 85°C 48mA IND, 32mA TTL-compatible input output levels product compliant with MIL-STD 883, Class QSFCT238T positive active outputs CMOS power levels 7.5mW static Available DIP, SOIC, QSOP, HQSOP JEDEC standard pinouts
Figure Functional Block Diagram
Inverting Outputs Only (Non-inverting Outputs 238)
MDSL-00003-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT138T, 238T Figure Configurations (All Pins View)
DIP, SOIC, QSOP HQSOP
Note: Available both 150-mil wide SOIC (Package Code 300-mil SOIC (Package Code SO).
Table Description Function Table
Name A2-A0 O7-O0 Enable Description Select Inputs Decode Outputs Enable Select Output State
Output Level
Function Disable Disable Disable A2-0 A2-0 A2-0 A2-0 A2-0 A2-0 A2-0 A2-0
Output
QUALITY SEMICONDUCTOR, INC.
MDSL-00003-04 DECEMBER 1998
QS54/74FCT138T, 238T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage this device resulting functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 9-12 4-6, 13-15 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 16-pin package.
Typ(1) -0.7 -1.2 0.50 0.50 Unit
Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol
Parameter
Military -55°C 125°C, 5.0V ±10%
Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., VOUT GND(2,3) Min., -18MA, 25°C(3) Min., Min., -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND)
Input HIGH Voltage Input Voltage Input Hysteresis
Input Current Input HIGH Short Circuit Current Input Clamp Voltage Output HIGH Voltage Output Voltage
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
MDSL-00003-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT138T, 238T Table Power Supply Characteristics
Symbol QCCD Parameter Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4) 0.25 Unit
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Military -55°C 125°C, 5.0V ±10% CLOAD 50pF, RLOAD unless otherwise specified. 138A 238A 138C 238C 138D Unit
Symbol tPHL tPLH
Description(1)
tPHLE tPLHE
Propagation Delay Propagation Delay
Note: Minimums guaranteed tested. Test Circuit Waveforms.
QUALITY SEMICONDUCTOR, INC.
MDSL-00003-04 DECEMBER 1998

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 1-of-8 Decoders

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