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REVISIONS DESCRIPTION Update current requirements. Editorial changes throughout. DATE (YR-MO-DA) 06-08-02 APPROVED Raymond Monnin
original first page this drawing been replaced. SHEET SHEET STATUS SHEETS PMIC SHEET PREPARED Thanh Nguyen
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE
CHECKED APPROVED
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil
DRAWING APPROVAL DATE 92-05-21
MICROCIRCUIT, DIGITAL, ECL, QUINT DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
AMSC
REVISION LEVEL
SIZE SHEET
CAGE CODE
67268
5962-91629
DSCC FORM 2233
5962-E507-06
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following example:
5962
91629
Federal stock class designator
designator (see 1.2.1)
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
Drawing number 1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number 100314 Circuit function Quint differential line receiver
1.2.3 Device class designator. device class designator single letter identifying product assurance level follows: Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, nonJAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP5-T24 CDIP6-T24 figure Terminals Package style dual-in-line quad flat pack
1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
Absolute maximum ratings. Negative supply voltage range (VEE) input voltage range (VIN) Maximum output current (IOUT) Storage temperature range Lead temperature (soldering, seconds) Junction temperature (TJ) Maximum power dissipation (PD) -7.0 +0.5 +0.5 -65°C +150°C +300°C +175°C
Thermal resistance, junction-to-case (JC): Case Case
MIL-STD-1835
Recommended operating conditions. Negative supply voltage range (VEE) High level input voltage range (VIH) level input voltage range (VIL) Case operating temperature range (TC) APPLICABLE DOCUMENTS Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those cited solicitation contract. DEPARTMENT DEFENSE SPECIFICATION MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. -5.7 minimum -4.2 maximum -1.165 minimum -0.870 maximum -1.830 minimum -1.475 maximum -55°C +125°C
DEPARTMENT DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings. Standard Microcircuit Drawings.
(Copies these documents available online www.dodssp.daps.mil from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.)
Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained.
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outline(s). case outline(s) shall accordance with 1.2.4 herein figure 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Truth table. truth table shall specified figure 3.2.4 Test circuit switching waveforms. test circuit switching waveforms shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change that affects this drawing. Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
TABLE Electrical performance characteristics. Conditions -55°C +125°C -5.7 -4.2 unless otherwise specified -4.2 -1.830 -0.870
Test
Symbol
Group Subgroups -1.025 -1.085 -1.830 -1.830 -1.035 -1.085
Limits -0.870 -0.870 -1.620 -1.555
Unit
High level output voltage
level output voltage
High level threshold output voltage level threshold output voltage Output reference voltage
VOHC
-4.2 -1.475 -1.165
VOLC
-1.610 -1.555 -1.260 -1.380 -1.396 -2.0 0.150 -0.5
-4.2 IVBB -5.7 IVBB -0.25 -5.7 IVBB -0.35
Common mode voltage Differential input voltage High level input current, select inputs Input collector-base leakage current Power supply drain current Functional tests Propagation delay time, data output
VDIFF
-4.2
-5.7 -0.870
ICBO
-4.2 -4.2 -5.7 -4.2 Inputs open -1.652 -1.018 -5.7 -4.2 4.4.1b
tPLH, tPHL
figure
Transition time, output
tTLH, tTHL
Each input/output, applicable, shall tested specified temperature specified limits. Output terminals shall terminated through Input terminals designated shall high logic level, logic level, open. This parameter provided design information only (not tested guaranteed).
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
Symbol
Inches .085 .016 .018 .004 .006 .370 .400 .045 .055 .250 .360 .035 .050 .075
Millimeters 2.16 0.41 0.46 0.10 0.15 9.40 10.16 1.14 1.40 6.35 9.14 0.89 1.27 1.91
NOTE: U.S. government preferred system measurement metric system. However, since this item originally designed using inch-pound units measurement, event conflict between metric inch-pound units, inch-pound units shall take precedence. This dimension allows meniscus glass overrun.
FIGURE Case outline.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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REVISION LEVEL
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Device type Case outlines Terminal number
Terminal symbol
VCCA
VCCA
FIGURE Terminal connections.
Inputs
Outputs
High level (with respect other input) level (with respect other input) Connected reference supply Some potential between FIGURE Truth table.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
NOTES: VCCA +2.0 -2.5 equal length impedance lines. terminator internal scope. Decoupling from VEE. unused outputs loaded with GND. fixture stray capacitance
FIGURE Test circuit timing waveforms.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
VERIFICATION Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection. Tests shall specified table herein. device class subgroups tests shall sufficient verify truth table. device classes subgroups shall include verifying functionality device. Subgroups table method 5005 MIL-STD-883 shall omitted.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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REVISION LEVEL
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TABLE Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Subgroups accordance with MIL-PRF-38535, table III) Device class Device class
Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4)
applies subgroup applies subgroups
4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified method 1005 MILSTD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified method 1005 MIL-STD883.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). End-point electrical parameters shall specified table herein. device classes devices test vehicle shall subjected radiation hardness assured tests specified MIL-PRF-38535 level being tested. device class devices shall subjected radiation hardness assured tests specified MIL-PRF-38535, appendix level being tested. device classes must meet postirradiation end-point electrical parameter limits defined table +25°C ±5°C, after exposure, subgroups specified table herein.
PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractor prepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices. Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus (DSCC) when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. Comments. Comments this drawing should directed DSCC-VA, Columbus, Ohio 43218-3990, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
SIZE
REVISION LEVEL
5962-91629
SHEET
STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 06-08-02 Approved sources supply 5962-91629 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This information bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 5962-9162901MXA
Vendor CAGE number 27014 0C7V7
Vendor similar 100314DMQB 100314DMQB 100314FMQB 100314FMQB 100314J-QMLV 100314W-QMLV
5962-9162901MYA
27014 0C7V7
5962-9162901VXA 5962-9162901VYA
27014 27014
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing.
Vendor CAGE number 27014
Vendor name address National Semiconductor Corp. 2900 Semiconductor Drive 58090 Santa Clara, 95052-8090 Semiconductor 2945 Oakmead Village Court Santa Clara, 95051
0C7V7
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.

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