QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Latc

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Latc

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QS54/74FCT841T, 2841T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 10-Bit Latch
DESCRIPTION
QS54/74FCT841T QS54/74FCT2841T
function compatible Am29841 74FCT841 74FCT841T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, Undershoot Clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 841T JEDEC-FCT spec compatible speed grades with 5.5ns 48mA Ind., 32mA Mil. FCT-T 2841T Built-in series resistor outputs reduce reflection other system noise speed grades with 5.5ns 12mA Ind.
QSFCT841T 10-bit high-speed CMOS TTLcompatible buffered latch with three-state outputs that ideal driving high capacitance loads such memory address buses. device comes speed grades with 5.5ns (Max.) tPLH/tPLH grade. 2841 devices resistor output version useful driving transmission lines reducing system noise. 2841 eliminates need external series resistor high speed systems replace series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
(FCT2841 Only)
MDSL-00029-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT841T, 2841T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP
Figure Logic Symbol
Table Description
Name
Description Data Inputs Data Outputs Three State Latch Enable Output Enable
Table Function Tables
Inputs Internal Outputs Function Hi-Z Output Enabled Output Enabled Transparent Transparent Latched MDSL-00029-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT841T, 2841T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-11, 15-22 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 24-pin package
0.25 Unit
Table Power Supply Characteristics
Symbol
Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs open enabled toggling duty cycle Other inputs VCC(3,4)
Supply Current Input HIGH Supply Current Input
QCCD
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00029-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT841T, 2841T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCT841) Current Drive (FCT2841 Input Clamp Voltage Output HIGH Voltage Output Voltage (FCT841) Output Voltage (FCT2841 Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2841
QUALITY SEMICONDUCTOR, INC.
MDSL-00029-05 DECEMBER 1998
QS54/74FCT841T, 2841T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 841A 2841A Symbol tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tLEY tLEY tLEY tLEY Description Data Delay LOW, Data Delay(2,3) LOW, Data Delay LOW, 2841 Data Delay(2,3) LOW, 2841 Data Setup Data Hold Time Delay LOW, Delay(2,3) LOW, Delay LOW, 2841 Delay(2,3) LOW, 2841 841B 2841B 841C 2841C Unit
10.5 15.5 10.5 15.5
10.5
Notes: Test Circuit Waveforms. This parameter guaranteed design tested. CLOAD 300pF.
MDSL-00029-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT841T, 2841T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 841A 2841A Symbol tLEH tPZH tPZL tPZH tPZL tPZH tPZL tPZH tPZL tPHZ tPLZ tPHZ tPLZ Description(1) Pulse Width HIGH Output Enable Time Output Enable Time(2,3) Output Enable Time 2841 Output Enable Time(2,3) 2841 Output Disable Time(2,4) Output Disable Time(2)
841B 2841B
841C 2841C Unit
11.5 11.5
Notes: Test Circuit Waveforms. This parameter guaranteed design tested. CLOAD 300pF. CLOAD 5pF.
QUALITY SEMICONDUCTOR, INC.
MDSL-00029-05 DECEMBER 1998

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Latc

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