QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Latch

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Latch

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QS54/74FCT573T, 2573T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 8-Bit Latches
DESCRIPTION
QS54/74FCT573T QS54/74FCT2573T
function compatible 74F573 74FCT573 74FCT573T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 573T JEDEC-FCT spec compatible Std, speed grades with 4.2ns 48mA Ind., 32mA Mil. FCT-T 2573T Built-in series resistor outputs reduce reflection other system noise Std, speed grades with 4.2ns 12mA Ind.
QSFCT573T QSFCT2573T 8-bit highspeed CMOS TTL-compatible buffered latches with three-state outputs that ideal driving high capacitance loads such memory address buses. 2573 devices resistor output versions useful driving transmission lines reducing system noise. 2573 series parts replace series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
(FCT2573 Only)
MDSL-00022-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT573T, 2573T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs Latch Enable Output Enable
Table Function Table
Inputs
Internal Value
Outputs Hi-Z
Function Disable Outputs Enable Outputs Enable Outputs Pass Inputs Pass Inputs Hold Prior Data
QUALITY SEMICONDUCTOR, INC.
MDSL-00022-05 DECEMBER 1998
QS54/74FCT573T, 2573T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-9, 12-19 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
0.25 Unit
Table Power Supply Characteristics
Symbol
Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
Supply Current Input HIGH
QCCD
Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00022-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT573T, 2573T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCT573) Current Drive (FCT2573 Input Clamp Voltage Output HIGH Voltage Output Voltage (FCT573) Output Voltage (FCT2573 Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min., Min., Min., Min., -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2573
QUALITY SEMICONDUCTOR, INC.
MDSL-00022-05 DECEMBER 1998
QS54/74FCT573T, 2573T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
2573 Symbol tPHL tPLH tPHL tPLH tPHLE tPLHE tPHLE tPLHE tPZH tPZL tPZH tPZL tPLZ tPHZ Description(1) Propagation Delay Data Propagation Delay Data 2573 Propagation Delay Propagation Delay 2573 Output Enable Time Output Enable Time 2573 Output Disable Time(2) Data Setup Time HIGH 12.5 12.5
573A 2573A
573C 2573C Unit
Data Hold Time HIGH Pulse Width(2) HIGH
Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00022-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Latch

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