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HN1D03FU Ultra High Speed Switching Application Unit Built a
Top Searches for this datasheetHN1D03FU HN1D03FU Ultra High Speed Switching Application Unit Built anode common cathode common. Unit forward voltage Small total capacitance Unit forward voltage Small total capacitance 0.90V (typ.) 0.9pF (typ.) 0.92V (typ.) 2.2pF (typ.) Fast reverse recovery time 1.6ns (typ.) Fast reverse recovery time 1.6ns (typ.) Unit Unit Common Maximum Ratings 25°C) Characteristic Maximum (peak) reverse voltage Reverse voltage Maximum (peak) forward current Average forward current Surge current (10ms) Power dissipation Junction temperature Storage temperature Symbol IFSM Tstg Rating 240* -55~125 Unit JEDEC EIAJ TOSHIBA Weight: 6.2mg 1-2T1D This Maximum Ratings single diode Q4). case using Unit Unit independently simultaneously, Maximum Ratings diode single diode one. Marking Assignment (Top View) 961001EAA2 TOSHIBA continually working improve quality reliability products. Nevertheless, semiconductor devices general malfunction fail their inherent electrical sensitivity vulnerability physical stress. responsibility buyer, when utilizing TOSHIBA products, observe standards safety, avoid situations which malfunction failure TOSHIBA product could cause loss human life, bodily injury damage property. developing your designs, please ensure that TOSHIBA products used within specified operating ranges forth most recent products specifications. Also, please keep mind precautions conditions forth TOSHIBA Semiconductor Reliability Handbook. information contained herein presented only guide applications products. responsibility assumed TOSHIBA CORPORATION infringements intellectual property other rights third parties which result from use. license granted implication otherwise under intellectual property other rights TOSHIBA CORPORATION others. information contained herein subject change without notice. 2000-09-14 HN1D03FU Fig.1 Reverse Recovery Time (trr) Test Circuit Unit Electrical Characteristics (Q1, Common) 25°C) Characteristic Symbol Forward voltage Reverse current Total capacitance Reverse recovery time Test Circuit Test Condition 10mA 100mA 1MHz =10mA (fig.1) Typ. 0.60 0.72 0.90 1.20 0.10 0.50 Unit Unit Electrical Characteristics (Q3, Common) 25°C) Characteristic Symbol Forward voltage Reverse current Total capacitance Reverse recovery time Test Circuit Test Condition 10mA 100mA 1MHz =10mA (fig.1) Typ. 0.61 0.74 0.92 2.20 1.60 1.20 0.10 0.50 Unit 2000-09-14 HN1D03FU 2000-09-14 HN1D03FU 2000-09-14 Other recent searchesTMP86C807NG - TMP86C807NG TMP86C807NG Datasheet Si3456BDV - Si3456BDV Si3456BDV Datasheet RA78K4 - RA78K4 RA78K4 Datasheet Structured - Structured Structured Datasheet Assembler - Assembler Assembler Datasheet Preprocessor - Preprocessor Preprocessor Datasheet MPDI041 - MPDI041 MPDI041 Datasheet I27134 - I27134 I27134 Datasheet HCNW2201 - HCNW2201 HCNW2201 Datasheet HCNW2211 - HCNW2211 HCNW2211 Datasheet HCNW22XX - HCNW22XX HCNW22XX Datasheet HCPL0211 - HCPL0211 HCPL0211 Datasheet Delta39KTM - Delta39KTM Delta39KTM Datasheet CDLE-420-146 - CDLE-420-146 CDLE-420-146 Datasheet ADSP-21mod970-110 - ADSP-21mod970-110 ADSP-21mod970-110 Datasheet
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