HN1D02FU Ultra High Speed Switching Application HN1D02FU com
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HN1D02FU
HN1D02FU
Ultra High Speed Switching Application
HN1D02FU composed unit cathode common. forward voltage Small total capacitance 0.90V (typ.) 0.9pF (typ.) Fast reverse recovery time 1.6ns (typ.) Unit
Maximum Ratings 25°C)
Characteristic Maximum (peak) reverse voltage Reverse voltage Maximum (peak) forward current Average forward current Surge current (10ms) Power dissipation Junction temperature Storage temperature Symbol IFSM Tstg Rating 300* 100* -55~125 Unit
This Maximum Ratings single diode Q4). case using Unit Unit independently simultaneously, Maximum Ratings diode single diode one.
JEDEC EIAJ TOSHIBA Weight: 6.8mg
1-2T1B
Electrical Characteristics (Q1, Common, 25°C)
Characteristic Symbol Forward voltage Reverse current Total capacitance Reverse recovery time Test Circuit Test Condition 10mA 100mA 1MHz 10mA (fig.1) Typ. 0.60 0.72 0.90 1.20
000707EAA1
Unit
TOSHIBA continually working improve quality reliability products. Nevertheless, semiconductor devices general malfunction fail their inherent electrical sensitivity vulnerability physical stress. responsibility buyer, when utilizing TOSHIBA products, comply with standards safety making safe design entire system, avoid situations which malfunction failure such TOSHIBA products could cause loss human life, bodily injury damage property. developing your designs, please ensure that TOSHIBA products used within specified operating ranges forth most recent TOSHIBA products specifications. Also, please keep mind precautions conditions forth "Handling Guide Semiconductor Devices," "TOSHIBA Semiconductor Reliability Handbook" etc. TOSHIBA products listed this document intended usage general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products neither intended warranted usage equipment that requires extraordinarily high quality and/or reliability malfunction failure which cause loss human life bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, types safety devices, etc. Unintended Usage TOSHIBA products listed this document shall made customer's risk. information contained herein presented only guide applications products. responsibility assumed TOSHIBA CORPORATION infringements intellectual property other rights third parties which result from use. license granted implication otherwise under intellectual property other rights TOSHIBA CORPORATION others. information contained herein subject change without notice.
2001-02-08
HN1D02FU
Assignment (Top View) Marking
Fig.1 Reverse Recovery Time (trr) Test Circuit
2001-02-08
HN1D02FU
Q,2, Common
Q,2, Common
Q,2, Common
Q,2, Common
2001-02-08
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