QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Regi

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Regi

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QS54/74FCT821T, 823T, 2821T, 2823T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 10-Bit Registers
DESCRIPTION
QS54/74FCT821T QS54/74FCT823T QS54/74FCT2821T QS54/74FCT2823T
function compatible 74F821/3 74FCT821/3 74FCT821T/3T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class 821T, 823T JEDEC-FCT spec compatible 48mA Ind., 32mA Mil. 2821T, 2823T Built-in series resistor outputs reduce reflection other system noise 12mA Ind.
QSFCT821T/823T QSFCT2821T/2823T 9-bit high-speed CMOS TTL-compatible buffered registers with three-state outputs that ideal driving high capacitance loads such memory address buses. 2821/3 devices resistor output versions useful driving transmission lines reducing system noise. 2821/3 series parts replace 821/3 series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
(FCT2xxx Only)
MDSL-00026-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT821T, 823T, 2821T, 2823T FCT821/2821 10-BIT REGISTER Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs-Three State Clock Pulse Output Enable
Figue FCT821 Logic Symbol
QUALITY SEMICONDUCTOR, INC.
MDSL-00026-04 DECEMBER 1998
QS54/74FCT821T, 823T, 2821T, 2823T FCT823/2823 9-BIT REGISTER Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs-Three State Output Enable Clock Enable Asynchronous Reset Clock Pulse
Figure FCT823 Logic Symbol
MDSL-00026-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT821T, 823T, 2821T, 2823T Table Function Table
Inputs Int. Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Function High High Clear Clear Hold Hold Load Load Load Load
Note: 821, HI-Z Load functions only apply present these devices.
Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 3-11, 15-22 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 24-pin package.
QUALITY SEMICONDUCTOR, INC.
MDSL-00026-04 DECEMBER 1998
QS54/74FCT821T, 823T, 2821T, 2823T Table Power Supply Characteristics
Symbol QCCD Parameter Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs open enabled toggling duty cycle Other inputs VCC(3,4) 0.25 Unit
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -15mA (MIL) -24mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND)
Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 0.50 0.50 0.50 0.50 Unit
Short Circuit Current (FCTXXX) Current Drive (FCT2XXX) Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX- Output Resistance (FCT2XXX-
ROUT
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
MDSL-00026-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT821T, 823T, 2821T, 2823T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
Symbol tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tENS tENH
Description(1) Clock Delay LOW, 821/3 Clock Delay(2,3) LOW, 821/3 Clock Delay LOW, 2821/3 Clock Delay(2,3) LOW, 2821/3 Data Setup Time Data Hold Time Setup Time Hold Time
821A 821B 823A 823B 2821A 2821B 821C 821D 2823A 2823B 823C 823D 11.5 11.5 12.5 13.5 12.5 12.5 12.5
Unit
Notes: Test Circuit Waveforms. This parameter guaranteed design tested. CLOAD 300pF
QUALITY SEMICONDUCTOR, INC.
MDSL-00026-04 DECEMBER 1998
QS54/74FCT821T, 823T, 2821T, 2823T Table Timing Requirements Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
Symbol tCLR tCLR tREC tPWH tPWL tPZH tPZL tPZH tPZL tPZH tPZL tPZH tPZL tPHZ tPLZ tPHZ tPLZ
Description(1) Delay Delay 2823 Setup Time Clock Pulse Width(2) HIGH Output Enable Time 821/3 Output Enable Time(2,3) 821/3 Output Enable Time 2821/3 Output Enable Time(2,3) 2821/3 Output Disable Time(2,4) Output Disable Time(2)
821A 821B 823A 823B 2821A 2821B 821C 821D 2823A 2823B 823C 823D
Unit
12.5 13.5
12.5
Notes: Test Circuit Waveforms. This parameter guaranteed design tested. CLOAD 300pF. CLOAD 5pF.
MDSL-00026-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 10-Bit Regi

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