QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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QS54/74FCT646T, 2646T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 8-Bit Interface Register Transceivers
DESCRIPTION
QS54/74FCT646T QS54/74FCT2646T
function compatible 74F646 74FCT646 74FCT646T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 646T JEDEC-FCT spec compatible Std., speed grades with 4.8ns 64mA Ind., 48mA Mil. FCT-T 2646T Built-in series resistor outputs reduce reflection other system noise speed grades with 5.4ns 12mA Ind.
QSFCT646T QSFCT2646T 8-bit highspeed CMOS TTL-compatible registered transceivers with three-state outputs that ideal driving high capacitance loads such memory address buses. 2646 device resistor output version useful driving transmission lines reducing system noise. 2646 series parts replace series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
(FCT2646 Only)
REGISTER
MULTIPLEXER
MULTIPLEXER
REGISTER
(FCT2646 Only)
MDSL-00024-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT646T, 2646T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name A8-A1 B8-B1 Description Clock Register Clock Register Direction,
Inputs
Output Enable
Table Function Table
Outputs A8-A1 B8-B1 Hi-Z Hi-Z Hi-Z Hi-Z Function Disabled Output Output Load Register Load Register
QUALITY SEMICONDUCTOR, INC.
MDSL-00024-05 DECEMBER 1998
QS54/74FCT646T, 2646T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-11, 13-23 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 24-pin package.
0.25 Unit
Table Power Supply Characteristics
Symbol Parameter Quiescent Power Supply Current
QCCD
Supply Current Input HIGH Supply Current Input
Test Conditions(1) Max., freq 0.2V -0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00024-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT646T, 2646T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCT646) Current Drive (FCT2646) Input Clamp Voltage Output HIGH Voltage Output Voltage (FCT646) Output Voltage (FCT2646- Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 48mA (MIL) 64mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.55 0.55 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2646-
QUALITY SEMICONDUCTOR, INC.
MDSL-00024-05 DECEMBER 1998
QS54/74FCT646T, 2646T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
Symbol tPHLB tPLHB tPHLB tPLHB tPZH tPZL tPZH tPZL tPHZ tPLZ tPHLC tPLHC tPHLC tPLHC tPHLS tPLHS tPHLS tPLHS
Description(1) Delay, Delay, 2646 Ouput Enable Time, Output Enable Time, 2646 Output Disable Time Clock Delay, Clock Delay, 2646 SBA/SAB Delay, SBA/SAB Delay, 2646 Ind(2) Mil(2) Ind(2) Mil(2)
646A 646C 2646A 2646C 646D 10.5 10.5
Unit
Data Setup Time
tPWH tPWL
Data Hold Time
Clock Pulse Width HIGH
Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00024-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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