QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Regis
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QS54/74FCT574T, 2574T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 8-Bit Registers
DESCRIPTION
QS54/74FCT574T QS54/74FCT2574T
function compatible 74FCT574 74FCT574T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T JEDEC-FCT spec compatible Std. thru speed grades with 4.5ns 48mA Ind., 32mA Mil. FCT-T 2574 Built-in series resistor outputs reduce reflection other system noise Std. thru speed grades with 5.2ns 12mA Ind.
QSFCT574 QSFCT2574 8-bit highspeed CMOS TTL-compatible buffered registers with three-state outputs that ideal driving high capacitance loads such memory address buses. 2574 devices resistor output versions useful driving transmission lines reducing system noise. 2574 series parts replace series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
(FCT2574 Only)
MDSL-00023-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT574T, 2574T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs Clock Input Output Enable
Table Function Table
Inputs Internal Value Outputs Hi-Z
Function Disable Outputs Enable Outputs Load Input Data
QUALITY SEMICONDUCTOR, INC.
MDSL-00023-04 DECEMBER 1998
QS54/74FCT574T, 2574T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-9, 12-19 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
Table Power Supply Characteristics
Symbol
Parameter
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
0.25
Unit
Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input
QCCD
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00023-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT574T, 2574T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCT574) Current Drive (FCT2574 Input Clamp Voltage Output HIGH Voltage Output Voltage (FCT574) Output Voltage (FCT2574 Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2574
QUALITY SEMICONDUCTOR, INC.
MDSL-00023-04 DECEMBER 1998
QS54/74FCT574T, 2574T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
2574 Symbol tPHL tPLH tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay Output Enable Time Disable Time(2) Data Setup Time Data Hold Time Clock Pulse Width(2) HIGH
574A 2574A
574C 2574C
574D Unit
12.5
Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00023-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
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