QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Regis

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Regis

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QS54/74FCT374T, 2374T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS Interface 8-Bit Registers
DESCRIPTION
QS54/74FCT374T QS54/74FCT2374T
function compatible 74F374 74FCT374 74ABT374 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 374T JEDEC-FCT spec compatible Std., speed grades with 4.5ns 48mA Ind., 32mA Mil. FCT-T 2374T Built-in series resistor outputs reduce reflection other system noise Std., speed grades with 5.2ns 12mA Ind.
QSFCT374T high-speed CMOS TTLcompatible 8-bit buffered registers with buffered common clock buffered output enable control. QSFCT2374T resistor output version useful driving transmission lines reducing system noise. Data stored register rising edge clock. FCT374 noninverting device. high output current drive high capacitance loads. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
FCT2374 Only
MDSL-00017-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT374T, 2374T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs Clock Input Output Enable
Table Function Table
Internal Value
Inputs
Outputs Hi-Z Hi-Z Hi-Z
Function Disable Outputs Load Input Data Enable Outputs Load Input Data Disable Outputs
QUALITY SEMICONDUCTOR, INC.
MDSL-00017-04 DECEMBER 1998
QS54/74FCT374T, 2374T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
Table Power Supply Characteristics
Symbol
Parameter
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs open enabled toggling duty cycle Other inputs VCC(3,4)
0.25
Unit
Quiescent Power Supply Current Supply Current Input HIGH
QCCD
Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00017-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT374T, 2374T Table Electrical Characteristics Over Operating Range
Commercial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCT374) Current Drive (FCT2374 Input Clamp Voltage Output HIGH Voltage Output Voltage (FCT374) Output Voltage (FCT2374 Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.50 0.50 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2374
QUALITY SEMICONDUCTOR, INC.
MDSL-00017-04 DECEMBER 1998
QS54/74FCT374T, 2374T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
2374 Symbol tPHL tPLH tPHL tPLH tPZH tPZL tPZH tPZL tPHZ tPLZ Description(1) Propagation Delay Propagation Delay 2374 Output Enable Time Output Enable Time 2374 Output Disable Time Data Setup Time Data Hold Time Clock Pulse Width HIGH IND(2) MIL(2) IND(2) MIL(2) 12.5 12.5
374A 2374A
374C 2374C
374D
Unit
Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00017-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS Interface 8-Bit Regis

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