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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Register with A


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QS54/74FCT273T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 8-Bit Register with Asynchronous Reset
DESCRIPTION
QS54/74FCT273T
function compatible 74F273 74FCT273 74ABT273 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 273T JEDEC-FCT spec compatible speed grades with 5.2ns 48mA Ind., 32mA Mil.
QSFCT273T high-speed CMOS TTLcompatible 8-bit registers with asynchronous reset input, buffered common clock, buffered output drive. Data stored register rising edge clock. high output current drive high capacitance loads. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
CLOCK
MDSL-00013-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT273T Figure Configurations (All Pins View)
SOIC, QSOP, HQSOP
Table Description
Name Description Data Inputs Data Outputs Clock Input Clear Input
Table Function Table
Internal Value
Inputs
Outputs Function Clear Register Load Input Data Load Input Data
QUALITY SEMICONDUCTOR, INC.
MDSL-00013-04 DECEMBER 1998
QS54/74FCT273T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 13,14, 17,18 SOIC QSOP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
Table Power Supply Characteristics
Symbol
Parameter
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4)
0.25
Unit
Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input
QCCD
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00013-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT273T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Short Circuit Current Input Clamp Voltage Output HIGH Voltage Output Voltage Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., VOUT GND(2,3) Min., -18mA, 25°C(3) Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 0.50 0.50 Unit
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
QUALITY SEMICONDUCTOR, INC.
MDSL-00013-04 DECEMBER 1998
QS54/74FCT273T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
273A Symbol tPHL tPLH tWCP tWCLR tREC Description
273C Unit
IND(2) MIL(2) IND(2) MIL(2) IND(2) MIL(2)
Propagation Delay Data Setup Time Data Hold Time Time Clock Pulse Width HIGH Pulse Width HIGH Recovery Time
Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00013-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

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