| The Datasheet Archive - 100 Million Datasheets from 7500 Manufacturers. |
QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Register with A
Top Searches for this datasheetQS54/74FCT273T QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Register with Asynchronous Reset DESCRIPTION QS54/74FCT273T function compatible 74F273 74FCT273 74ABT273 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 273T JEDEC-FCT spec compatible speed grades with 5.2ns 48mA Ind., 32mA Mil. QSFCT273T high-speed CMOS TTLcompatible 8-bit registers with asynchronous reset input, buffered common clock, buffered output drive. Data stored register rising edge clock. high output current drive high capacitance loads. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device. Figure Functional Block Diagram CLOCK MDSL-00013-04 DECEMBER 1998 QUALITY SEMICONDUCTOR, INC. QS54/74FCT273T Figure Configurations (All Pins View) SOIC, QSOP, HQSOP Table Description Name Description Data Inputs Data Outputs Clock Input Clear Input Table Function Table Internal Value Inputs Outputs Function Clear Register Load Input Data Load Input Data QUALITY SEMICONDUCTOR, INC. MDSL-00013-04 DECEMBER 1998 QS54/74FCT273T Table Absolute Maximum Ratings Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures. Table Capacitance(1) 25°C, 1MHz, VOUT Pins(2) 13,14, 17,18 SOIC QSOP Unit Notes: Capacitance characterized tested. reference 20-pin package. Table Power Supply Characteristics Symbol Parameter Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4) 0.25 Unit Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input QCCD Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section. MDSL-00013-04 DECEMBER 1998 QUALITY SEMICONDUCTOR, INC. QS54/74FCT273T Table Electrical Characteristics Over Operating Range Industrial -40°C 85°C, 5.0V Symbol Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Short Circuit Current Input Clamp Voltage Output HIGH Voltage Output Voltage Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., VOUT GND(2,3) Min., -18mA, 25°C(3) Min. Min. -12mA (MIL) -15mA (IND) 32mA (MIL) 48mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 0.50 0.50 Unit Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested. QUALITY SEMICONDUCTOR, INC. MDSL-00013-04 DECEMBER 1998 QS54/74FCT273T Table Switching Characteristics Over Operating Range Industrial -40°C 85°C, 5.0V CLOAD RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10% 273A Symbol tPHL tPLH tWCP tWCLR tREC Description 273C Unit IND(2) MIL(2) IND(2) MIL(2) IND(2) MIL(2) Propagation Delay Data Setup Time Data Hold Time Time Clock Pulse Width HIGH Pulse Width HIGH Recovery Time Notes: Minimums guaranteed tested parameters except This parameter guaranteed design tested. Test Circuit Waveforms. MDSL-00013-04 DECEMBER 1998 QUALITY SEMICONDUCTOR, INC. Other recent searchesTK13A60D - TK13A60D TK13A60D Datasheet TF202C - TF202C TF202C Datasheet MW500-1335 - MW500-1335 MW500-1335 Datasheet MIC23150 - MIC23150 MIC23150 Datasheet MABACT0045 - MABACT0045 MABACT0045 Datasheet FPGA - FPGA FPGA Datasheet Architecture - Architecture Architecture Datasheet White - White White Datasheet Paper - Paper Paper Datasheet CDLE-138-043 - CDLE-138-043 CDLE-138-043 Datasheet 2SD2128 - 2SD2128 2SD2128 Datasheet
Privacy Policy | Disclaimer |