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3-State Version 'HC153 High-Current Inverting Outputs Drive LSTTL Load
Top Searches for this datasheetSN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS 3-State Version 'HC153 High-Current Inverting Outputs Drive LSTTL Loads Permit Multiplexing from Lines Line Perform Parallel-to-Serial Conversion Package Options Include Plastic Small-Outline Ceramic Flat Packages, Ceramic Chip Carriers (FK), Standard Plastic Ceramic 300-mil DIPs SN54HC253 PACKAGE SN74HC253 PACKAGE (TOP VIEW) description Each these data selectors/multiplexers contain inverters drivers supply full binary decoding data selection AND-OR gates. Separate output-control inputs provided each 4-line sections. 3-state outputs interface with drive data lines bus-organized systems. With common outputs disabled high-impedance state), impedance single enabled output drives line high logic level. Each output output-enable (OE) input. outputs disabled when their respective high. SN54HC253 PACKAGE (TOP VIEW) internal connection SN54HC253 characterized operation over full military temperature range -55°C 125°C. SN74HC253 characterized operation from -40°C FUNCTION TABLE INPUTS SELECT DATA OUTPUT Select inputs common both sections. Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. Copyright 1997, Texas Instruments Incorporated PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS logic symbol This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. numbers shown packages. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS logic diagram (positive logic) numbers shown packages. POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS absolute maximum ratings over operating free-air temperature range Supply voltage range, -0.5 Input clamp current, VCC) (see Note Output clamp current, VCC) (see Note Continuous output current, VCC) Continuous current through Package thermal impedance, (see Note package 113°C/W package 78°C/W Storage temperature range, Tstg -65°C 150°C Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output voltage ratings exceeded input output current ratings observed. package thermal impedance calculated accordance with JESD except through-hole packages, which trace length zero. recommended operating conditions SN54HC253 Supply voltage High-level input voltage Low-level input voltage Input voltage Output voltage Input transition (rise fall) time Operating free-air temperature 3.15 1.35 1000 SN74HC253 3.15 1.35 1000 UNIT POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS -7.8 3.98 5.48 25°C 1.998 4.499 5.999 0.002 0.001 0.001 0.17 0.15 ±0.1 ±0.01 0.26 0.26 ±100 ±0.5 SN54HC253 ±1000 SN74HC253 3.84 5.34 0.33 0.33 ±1000 UNIT switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure PARAMETER FROM (INPUT) (OUTPUT) Data (Any tdis 25°C SN54HC253 SN74HC253 UNIT POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS switching characteristics over recommended operating free-air temperature range, (unless otherwise noted) (see Figure PARAMETER FROM (INPUT) (OUTPUT) Data (Any 25°C SN54HC253 SN74HC253 UNIT operating characteristics, 25°C PARAMETER Power dissipation capacitance multiplexer TEST CONDITIONS load UNIT POST OFFICE 655303 DALLAS, TEXAS 75265 SN54HC253, SN74HC253 DUAL 4-LINE 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS PARAMETER MEASUREMENT INFORMATION PARAMETER Test Point tPZH tPZL tPHZ tPLZ Open Closed Open Closed Open Closed Open Closed Open Open From Output Under Test (see Note tdis LOAD CIRCUIT Input tPLH In-Phase Output tPHL Out-of-Phase Output tPLH tPHL Output Control (Low-Level Enabling) tPZL Output Waveform (See Note tPZH tPLZ tPHZ VOLTAGE WAVEFORMS PROPAGATION DELAY OUTPUT TRANSITION TIMES Input Output Waveform (See Note VOLTAGE WAVEFORM INPUT RISE FALL TIMES VOLTAGE WAVEFORMS ENABLE DISABLE TIMES 3-STATE OUTPUTS NOTES: includes probe test-fixture capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. Phase relationships between waveforms were chosen arbitrarily. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. tPLZ tPHZ same tdis. tPZL tPZH same ten. tPLH tPHL same tpd. Figure Load Circuit Voltage Waveforms POST OFFICE 655303 DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS INVOLVE POTENTIAL RISKS DEATH, PERSONAL INJURY, SEVERE PROPERTY ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). SEMICONDUCTOR PRODUCTS DESIGNED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. INCLUSION PRODUCTS SUCH APPLICATIONS UNDERSTOOD FULLY CUSTOMER'S RISK. order minimize risks associated with customer's applications, adequate design operating safeguards must provided customer minimize inherent procedural hazards. assumes liability applications assistance customer product design. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. TI's publication information regarding third party's products services does constitute TI's approval, warranty endorsement thereof. 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