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Abstract: maximum power savings; voltage regulator in standby ­ Stop2 - Power down of most internal circuits; voltage regulator in standby; RAM maintained in loose regulation ­ Stop3 - All internal circuits powered; voltage regulator in standby with loose regulation ­ Stop4 - All internal circuits powered and full , that are powered from the voltage regulator are turned off. The voltage regulator is in a low-power , Standby Regulator Off Standby Standby On I/O Pins Hi-Z States Held States Held ... Original
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HCS08 code example assembly centrifugal pump data sheet MPXY8300B6T1 SOIC-20 ADRH 1X LFA10 can bootloader MC9S08 134,2 kHz coil antenna 434 MHZ RF transmitter LFB15 LFB12 filter MC9S08 20 pin MPXY8300A6U MPXY8300 MPXY8300 MPXY8300 abstract
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current or maximum output load current) exhibit more degradation with 0 V bias." The devices were Current 2. Negative Supply Current 3. Input Offset Voltage 4. Input Offset Current 5. + Input Bias Current 6. - Input Bias Current 7. Large Signal Voltage Gain 8. Common Mode Rejection Ratio 9. Strobe Current 10. Output Sat Voltage @ 8mA 11. Output Sat Voltage @ 50mA 12. Output Leakage Current ELDRS as defined in the current test method. The following exception should be noted: The input
www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (ELDRS Report_RH1011W_Fabrication Run 10220414.1.pdf)
Linear 04/02/2010 1203.5 Kb ZIP rh1011_radiation_test_data.zip
maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias." The devices were irradiated to Current 2. Negative Supply Current 3. Input Offset Voltage 4. Input Offset Current 5. + Input Bias Current 6. - Input Bias Current 7. Large Signal Voltage Gain 8. Common Mode Rejection Ratio 9. Strobe Current 10. Output Sat Voltage @ 8mA 11. Output Sat Voltage @ 50mA 12. Output Leakage Current
www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (RLAT Report_RH1011W_Fabriacation Run 10220414.1.pdf)
Linear 04/02/2010 1203.5 Kb ZIP rh1011_radiation_test_data.zip
device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with during the course of this work: 1. Positive Supply Current 2. Negative Supply Current 3. Input Offset Voltage 4. Input Offset Current 5. + Input Bias Current 6. - Input Bias Current 7. Large Signal Voltage Gain 8. Common Mode Rejection Ratio 9. Strobe Current 10. Output Sat Voltage @ 8mA 11. Output Sat Voltage @ 50mA 12. Output Leakage Current Appendix C details the measured parameters, test
www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (RLAT Report_RH1011H_Fabriactaion Run WP1075.1.pdf)
Linear 04/02/2010 1203.5 Kb ZIP rh1011_radiation_test_data.zip
. Positive Supply Current 2. Negative Supply Current 3. Input Offset Voltage 4. Input Offset Current 5. + Input Bias Current 6. - Input Bias Current 7. Large Signal Voltage Gain 8. Common Mode Rejection Ratio 9. Strobe Current 10. Output Sat Voltage @ 8mA 11. Output Sat Voltage @ 50mA 12. Output Leakage Current Appendix C details the measured parameters, test conditions, pre in the current test method. 5.0. ELDRS Test Results Using the conditions stated above, the
www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (ELDRS Report_RH1011H_Fabrication Run WP1075.1.pdf)
Linear 04/02/2010 1203.5 Kb ZIP rh1011_radiation_test_data.zip
Sensitivity (ELDRS) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology RH117H RH117H RH117H RH117H Positive Adjustable Regulator Commercial Part Number: RH117H RH117H RH117H RH117H Traceability Information current test method. ELDRS Report 10-121 100815 R1.1 An ISO 9001:2008 and DSCC Certified Company 2 The RH117H-Positive Adjustable Regulator described in this final report was irradiated under 2 maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or
www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (ELDRS Report_RH117H_Fabrication Lot# W10737632 1.pdf)
Linear 09/09/2010 667.74 Kb ZIP eldrs report_rh117h_fabrication lot# w10737632 1.zip
) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology Customer: Linear Adjustable Regulator Commercial Part Number: RH117H RH117H RH117H RH117H Traceability Information: Lot Date Code: 0947A exhibit ELDRS as defined in the current test method. TID Report 10-120 100815 R1.1 An ISO 9001:2008 and RH117H-Positive Adjustable Regulator described in this final report was irradiated under 2 different voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum
www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (RLAT Report_RH117H_Fabrication Lot# W10737632 1.pdf)
Linear 09/09/2010 667.74 Kb ZIP eldrs report_rh117h_fabrication lot# w10737632 1.zip
Sensitivity (ELDRS) Radiation Testing of the RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver for Linear Technology RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver Commercial Part Number: RH1573K RH1573K RH1573K RH1573K DICE. RH1573K RH1573K RH1573K RH1573K DICE is 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 low dropout PNP regulator The following parameters were tested during the course of this work: 1. Input Quiescent Current (A) 2. Reference Voltage (V) 3. Line Regulation (V) 4. Load Regulation (V) 5. FB Pin Bias Current (A
www.datasheetarchive.com/download/92811048-347086ZC/rh1573mj8_radiation_test_data.zip (RH1573MJ8 ELDRS Report 08-125 1p1.pdf)
Linear 10/09/2009 631.57 Kb ZIP rh1573mj8_radiation_test_data.zip
) of the RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver for Linear Technology Customer: Linear PNP Regulator Driver Commercial Part Number: RH1573K RH1573K RH1573K RH1573K DICE. RH1573K RH1573K RH1573K RH1573K DICE is assembled in CERDIP-8 PNP regulator driver described in this final report was tested using two bias conditions, statically The following parameters were tested during the course of this work: 1. Input Quiescent Current (A) 2. Reference Voltage (V) 3. Line Regulation (V) 4. Load Regulation (V) 5. FB Pin Bias Current (A
www.datasheetarchive.com/download/92811048-347086ZC/rh1573mj8_radiation_test_data.zip (RH1573MJ8 RLAT Report 08-126 1p1.pdf)
Linear 10/09/2009 631.57 Kb ZIP rh1573mj8_radiation_test_data.zip
* Library of Switchmode Regulator Controller Chips * Copyright Cadence Design Systems, Inc ; + input of error amp + 3 ; oscillator output + 4 ; + current loop sense + 5 ; - current rextcl1 4 15 6.7meg rextcl2 5 15 6.7meg * stanby current gp 15 DGND table {v(15)} (0 0) (6 5m } ) u99 BUF bufPWR DGND dclk 3 d0_gate io_std x15 7 dclk DPWR DGND gen_clk * current limit section *+- *|* POWER SUPPLY CONTAINING SG1524B SG1524B SG1524B SG1524B *|* *|* THE FOLLOWING LINES CONFIGURE A BUCK REGULATOR AROUND A 1524B 1524B 1524B 1524B
www.datasheetarchive.com/files/spicemodels/misc/swit_reg.lib
Spice Models 01/09/2009 320.85 Kb LIB swit_reg.lib
case some bipolar linear device parameters (e.g. input bias current or maximum output load current The following parameters were tested during the course of this work: 1. Positive Supply Current 2. Negative Supply Current 3. Input Offset Voltage 4. Input Offset Current 5. + Input Bias Current 6. - Input Bias Current 7. Large Signal Voltage Gain 8. Common Mode Rejection Ratio 9. Power Supply not exhibit ELDRS as defined in the current test method. 5.0. TID Test Results Using the
www.datasheetarchive.com/download/20244229-347082ZC/rh108_radiation_test_data.zip (RH108_RLAT_Report_08-130_1p1.pdf)
Linear 03/02/2009 883.6 Kb ZIP rh108_radiation_test_data.zip