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Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, film-thickness measurement instruments. - film-thickness measurement instruments.
Single-Spot Measurements, Microscopic-Spot Measurements, Automated Mapping Systems, Inline Monitoring, & more.
|DATASHEET||PDF or ZIP|
|05-4-Vertical Scanning.pptx - Vertical-scanning Interferometry - Surface Roughness||05-4-Vertical Scanning.pptx : vertical-scanning interferometry (PDF)|
|Phase-shifting Interferometry - Surface Roughness||Phase-Shifting-Interferometry.nb : phase-shifting interferometry (PDF)|
|Here's How. - Support Developing A New Application (Trying To Measure A New Material Or Has Your Film Stack Changed?)||Filmetrics Troubleshooting Guide - Power Cycling E7s : Here's how. (PDF)|
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