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CHECKPOINT TECHOLOGIES, LLC

Checkpoint Technologies develops and manufactures innovative optical failure analysis tools used by semiconductor manufacturers to improve the speed and reliability of integrated circuits. Our products, which range from OEM components to fully-integrated, end-user solutions, reflect our fundamental commitment to maximizing value by adapting technology to meet specific market needs. - Optical failure analysis tools

InfraScan 400TDM, InfraScan ES400, InfraScan LTM, & more.

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Checkpoint-PR-VLP - Checkpoint Technologies Announces Vis-SIL: Visible Laser Probing Of IC’s – 10 Nm Nodes Down To 5 Nm Checkpoint-PR-VLP : Checkpoint Technologies Announces Vis-SIL: Visible Laser Probing Of IC’s – 10 Nm Nodes Down To 5 Nm (PDF)
Checkpoint Announces 125nm Optical Resolution Breakthrough With Visible Light Checkpoint-Resolution-PR-125nm : Checkpoint Announces 125nm Optical Resolution Breakthrough with Visible Light (PDF)
Checkpoint Technologies Announces InfraScan™ ES400C A Complete Optical Debugging And Failure Analysis Tool 130410-Checkpoint-PR-ES400-C-184954831-261 : Checkpoint Technologies Announces InfraScan™ ES400C a Complete Optical Debugging and Failure Analysis Tool (PDF)
121312-InfraScanTDM - Checkpoint Technologies, LLC, Noted Supplier Of Laser Scanning And Photon Emission Microscopy Systems For The Failure Analysis Industry, Announces The Release Of InfraScan(tm) TDM 121312-InfraScanTDM : Checkpoint Technologies, LLC, noted supplier of laser scanning and photon emission microscopy systems for the failure analysis industry, announces the release of InfraScan(tm) TDM (PDF)
Checkpoint Technologies, LLC, Announces The Release Of The InfraScan™ ES400C-LW Checkpoint-InfraScan-ES400C-LW-PR : Checkpoint Technologies, LLC, announces the release of the InfraScan™ ES400C-LW (PDF)
Checkpoint Technologies, LLC Releases First Production 3.3 NA SIL Objective Checkpoint-Technologies-3.3NA-SIL : Checkpoint Technologies, LLC Releases First Production 3.3 NA SIL Objective (PDF)

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