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Challenge Innovations

Challenge Innovations was formed by two ex Texas Instruments engineers in 1970. They were involved in designing and installing in-house power semiconductor Testers for production use including some of the very first Thermal Resistance/FBSOA Testers, the first computer controlled power ATE systems and the early bipolar high voltage Testers. - Thermal Resistance/FBSOA Testers

Safety Test Head, Energy Dissipation Testers, Multiplexer, Static Parameters, Dynamic Parameter Tester, & more.

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