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AXIC

AXIC, Inc. was founded in 1980 as a company to develop surface science equipment for the semiconductor, electronics, and general scientific community. The early stages of the company were involed with determining future equipment requirements for the semiconductor industry which could be filled by a small company with strategic knowledge of surface measurement requirements. - Semiconductor, electronics

Plasma Etch & Deposition, Thin Film Metrology / XRF, & more.

DATASHEET PDF or ZIP
Overview Of Dry Process - PDF 722 KB - ETCH AppNote7-Overview-of-Dry-Process : Overview of Dry Process - PDF 722 KB (PDF)
Photoresist Stripping - PDF 1, 428 KB - ETCH AppNote13-Characteristics-of-Dry-Etching : Photoresist Stripping - PDF 1, 428 KB (PDF)
Electrical Discharges In Vacuum - PDF 375 KB - DEPOSITION AppNote12-Electrical-Discharges-in-Vacuum : Electrical Discharges in Vacuum - PDF 375 KB (PDF)
Plasma Enhanced CVD - PECVD - 1, 065 KB - DEPOSITION AppNote14-Plasma-Enhanced-CVD-PECVD : Plasma Enhanced CVD - PECVD - 1, 065 KB (PDF)
AppNote8-PLasma-Cleaning - Plasma Cleaning - PDF 958 KB AppNote8-PLasma-Cleaning : Plasma Cleaning - PDF 958 KB (PDF)
Plasma And Wettability Of Surfaces - PDF 519 KB AppNote9-Plasma-and-Wettability-of-Surfaces : Plasma and Wettability of Surfaces - PDF 519 KB (PDF)
Photoresist Stripping - PDF 1, 428 KB - PLASMA AppNote10-Photoresist-Stripping : Photoresist Stripping - PDF 1, 428 KB (PDF)
Characteristics Of Dry Etching - PDF 779 KB - PLASMA AppNote13-Characteristics-of-Dry-Etching : Characteristics of Dry Etching - PDF 779 KB (PDF)
Plasma De-process For Failure Analysis - PDF 655 KB AppNote15-Plasma-Deprocess-for-Failure-Analysis : Plasma De-process for Failure Analysis - PDF 655 KB (PDF)
AppNote1-PinPSGandBPSG - P In PSG And BPSG - PDF 1, 012 KB - Applications - Thin Film Metrology AppNote1-PinPSGandBPSG : P in PSG and BPSG - PDF 1, 012 KB (PDF)
Composition Thickness Metal Films - PDF 3, 590 KB - Applications - Thin Film Metrology AppNote2-CompositionThicknessMetalFilms : Composition Thickness Metal Films - PDF 3, 590 KB (PDF)
Composition Thickness With XRF - PDF 1, 893 KB - Applications - Thin Film Metrology AppNote3-CompositionThicknesswithXRF : Composition Thickness with XRF - PDF 1, 893 KB (PDF)
AppNote4-XRFforMagneticFilms - XRF For Magnetic Films - PDF 1, 118 KB - Applications - Thin Film Metrology AppNote4-XRFforMagneticFilms : XRF for Magnetic Films - PDF 1, 118 KB (PDF)
XRF Multilayer Film Thickness - PDF 662 KB - Applications - Thin Film Metrology AppNote5-XRFMultilayerFilmThickness : XRF Multilayer Film Thickness - PDF 662 KB (PDF)
AppNote6-XRFforProcessControl - XRF For Process Control - PDF 956 KB - Applications - Thin Film Metrology AppNote6-XRFforProcessControl : XRF for Process Control - PDF 956 KB (PDF)

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