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Part : V11-G-2M-PUR-V3-GM Supplier : PEPPERL+FUCHS Manufacturer : Newark element14 Stock : - Best Price : $27.00 Price Each : $34.12
Part : V3-GM-1,5M-PUR-V3-GM Supplier : PEPPERL+FUCHS Manufacturer : Newark element14 Stock : - Best Price : $27.00 Price Each : $34.12
Part : V3-GM-5M-PUR-V3-GM Supplier : PEPPERL+FUCHS Manufacturer : Newark element14 Stock : - Best Price : $34.00 Price Each : $43.22
Part : V31-GM-10M-PUR-V31-GM Supplier : PEPPERL+FUCHS Manufacturer : Newark element14 Stock : - Best Price : $47.00 Price Each : $54.38
Part : V31-WM-2M-PUR-V31-GM Supplier : PEPPERL+FUCHS Manufacturer : Newark element14 Stock : - Best Price : $24.00 Price Each : $31.16
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URV-3-5-52/733

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134). -
OCR Scan
S3R31 X3A-BFR90A BFR90A BFQ53 BFR92A URV-3-5-52/733

BFY90 PHILIPS

Abstract: BFW92 sot23 wafer 25 000 Faulty devices inked out Visual Inspection to URV-3-5-52/733 LIMITING VALUES In
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OCR Scan
X3A-BFW92 BFW92 BFY90 BFS17 BFY90 PHILIPS BFW92 sot23 philips bfw92 53S31

BFG505

Abstract: BFP505 Average number of good elements per wafer 30 000 Faulty devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (I EC 134). SYMBOL PARAMETER
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OCR Scan
X3A-BFR505 BFR505 BFG505 BFP505 SOT173 53T31
Abstract: Faulty devices inked out Visual inspection to URV-3-5-52/733 Active area: 10 pm around -
OCR Scan
X3A-BFQ254 BFQ251 BFQ252 BFQ256

BFR134

Abstract: BFG134 Average number of good elements per wafer 5000 Faulty devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134). SYMBOL PARAMETER
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OCR Scan
X3A-BFG134 BFR134 BFQ135 BFG135 BFG134 0D32S0B

BFQ34

Abstract: BFQ34T number of good elements per wafer 10 000 Faulty devices inked out Visual inspection to URV-3-5-52/733
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OCR Scan
X3A-BFQ34 BFQ34T BFQ34 BFG35 S3T31 32SD5
Abstract: 20 000 Faulty devices inked out Visual inspection to URV-3-5-52/733 Active area: 10 pm -
OCR Scan
X3A-BFT93 BFQ23 BFQ24 BFT93
Abstract: inches) Crystal pitch to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum -
OCR Scan
0Q322D X3A-BFQ195 BFG195 BFG197 BFG198

BFR134

Abstract: BFG134 inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134).
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OCR Scan
bfg135sot223 SOT37
Abstract: inked out Visual inspection Active area: 10 pm around metallization pattern. to URV-3-5-52/733 -
OCR Scan
X3A-BFT92 BFQ51 BFQ52 BFT92
Abstract: out Visual inspection Active area: 10 pm around metallization pattern. to URV-3-5-52/733 -
OCR Scan
X3A-BFR91A BFR91A BFQ22S BFR93A
Abstract: metallization pattern. to URV-3-5-52/733 Fig.1 X3A-BFQ268 crystal. LIMITING VALUES In accordance with -
OCR Scan
BFQ262 BFQ265 BFQ268

BFQ32

Abstract: BFG31 inked out .Visual Inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute
-
OCR Scan
BFQ32S BFQ149 BFG31 X3A-BFQ32 BFQ32

BFQ251

Abstract: BFQ252 devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute
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OCR Scan
QQ3221G

BFY90 PHILIPS

Abstract: good elements per wafer 25 000 Faulty devices inked out Visual inspection to URV-3-5-52/733 Fig.1 X3A-BFW92 crystal. LIMITING VALUES In accordance with the Absolute Maximum System
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OCR Scan
Abstract: out Visual inspection Active area: 10 pm around metallization pattern. to URV-3-5-52/733 -
OCR Scan
X3A-BFQ33 BFQ33C BFG33
Abstract: (flat side). to URV-3-5-52/733 Active area: 10 pm around metallization pattern. Fig -
OCR Scan
S3131

BFR90A

Abstract: BFQ53 devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute
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OCR Scan
crystal PHILIPS
Abstract: Faulty devices inked out Visual inspection to URV-3-5-52/733 Active area: 10 pm around -
OCR Scan
X3A-BFR540 BFR540 BFG540 BFG541

crystal PHILIPS

Abstract: BFR90A Faulty devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the
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OCR Scan
UBB41S
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