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TM1019

Catalog Datasheet MFG & Type PDF Document Tags

65656F

Abstract: TM1019 MG1RT >50 >30 0.001 / gate >100 30 0.2 TM1019 CMOS Sea of Gate @ 5v 480 , 0.001 / gate >100 25 0.2 TM1019 CMOS Sea of Gate @ 3v 480 KCells / 90 MHz @ 0.3 µW , 67134E >50 >30 0.05 >100 7 0.15 TM1019 CMOS FIFO 16Kx9 / 20 ns @ 200 µA 67206E >50 >30 0.05 >100 7 0.15 TM1019 CMOS SRAM 1Mx1 / 35 ns @ 300 µA 65601E >50 >30 0.3 >100 3 0.3 TM1019 CMOS SRAM 128Kx8/ 35 ns @ 300 µA
Temic Semiconductors
Original
80C31E SCC22900 80C32E 80C52E 65262E 65656F DSP 6713 65608E 4kx8 sram TSC-21020 SRAM 4KX8 65162E

UT54ACS14E

Abstract: Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96524 = UT54ACS14E Total Dose: (Note 3 & 4) R = 1E5
Aeroflex Colorado Springs
Original

4172G-AERO-06

Abstract: ATMEL 350 Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Total Dose (TM1019.5) Functional Latch-up 25° C Cross Section VCC Max Parametric SEU LET Threshold VCC Min /Bit Device Type Format/Function/ Speed Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m2) (E.-6 cm2) CMOS SRAM 5V 128K x 8/30 ns , Products Total Dose (TM1019.5) Functional Latch-up 25°C Cross Section VCC Max Parametric
Atmel
Original
65609E 67025E AT17LV010 4172G-AERO-06 ATMEL 350 65609 CROSS ATMEL AT60142F AT60142F/ 67204H 67206H 672061H

AT697E

Abstract: TM1019 Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Latch-up 25°C Functional Parametric SEU LET Threshold Cross Section VCC Max Total Dose (TM1019.5) VCC Min /Bit Device Type Format/Function/ Speed Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m2) (E.-6 cm2) CMOS SRAM 5V 128K , Total Dose (TM1019.5) VCC Min /Device Device Type Format/Function/Speed Part Number
Atmel
Original
AT697E AT28C010-12DK atmel 022 4172F-AERO-06 AT28C01012DK 4172F

ETS500

Abstract: 5962R0923561VZA irradiation. Testing time limits we in accordance ere with MIL-STD-883G, TM1019.7. B. SET Testing SET , ELDRS characterization method in MIL-STD883G, TM1019.7, section 3.13.1.1, the median parametric drift , -883 TM1019. To qualify the product at 100 krad(Si) for low dose rate environments, the part is tested at a , -883. To qualify a part defined as having ELDRS for low dose rate environments, MIL-STD-883 TM1019
National Semiconductor
Original
LM4050WG2 5962R0923561VZA DS16F95QML ETS500 LM4050WG2.5RLQV texas ldr LM4050QML EIA-485/EIA-422A

65609E

Abstract: CMOS OR Gates Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Latch-up 25°C Functional Parametric SEU LET Threshold Cross Section V CC Max Total Dose (TM1019.5) VCC Min /Bit Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m 2) (E.-6 cm2) 5V 128K x 8/30 ns 65608E 30 30 5 >80 , 5 Table 2. Processor Products Total Dose (TM1019.5) Functional Parametric Device Type
Atmel
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AT60142 CMOS OR Gates AT40KEL Radiation Tolerant DSP processor AT17LV0 10-10DP 1600K 4172D

sensitivity of ldr

Abstract: MIL-STD-883G ), released February 28, 2006 [13]. Also included in MIL-STD883G, TM1019.7 is a characterization technique to , space versions of the LM111 and LM119. The ELDRS characterization defined in MIL-STD-883G, TM1019.7 , WSMR to resume irradiation. Testing time limits were in accordance with MILSTD-883G, TM1019.7. IV , ) qualification as allowed by MIL-STD-883G, TM1019.7. For the HDR legs, electrical testing was completed within
National Semiconductor
Original
sensitivity of ldr specification of ldr 3 pins LDR LM119xRLQMLV LM 3171 5962-00524 MIL-PRF-38535
Abstract: Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96551 = UT54ACTS153E Total Dose: (Notes 3 & 4) R = Aeroflex Colorado Springs
Original
Abstract: Flatpack Class Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96519 = UT54ACTS08E Total Dose Aeroflex Colorado Springs
Original

ldr 3 pin metal package

Abstract: sensitivity of ldr Method 1019 (rev. 7), released February 28, 2006 [5]. Also included in MIL-STD-883G, TM1019.7 is a , characterization defined in MIL-STD-883G, TM1019.7. Per the test method, the product is qualified to 100 krad(Si , outlined in MIL-STD-883, TM1019 [5]. Testing under LDR conditions was not routine, due to the time
National Semiconductor
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ldr 3 pin metal package LDR SPECIFICATION LDR resistor LDR Datasheet 5662-0050101QXA JMX046X24 LM136-2

TM1019

Abstract: Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019
Aeroflex Colorado Springs
Original
UT54ACS02E
Abstract: MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96551 = Aeroflex Colorado Springs
Original

ut54acts541e

Abstract: Flatpack Class Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96595 = UT54ACTS541E Total Dose
Aeroflex Colorado Springs
Original

Aeroflex UT54

Abstract: MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96519 =
Aeroflex Colorado Springs
Original
Aeroflex UT54
Abstract: MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96514 = Aeroflex Colorado Springs
Original
Abstract: MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96519 = Aeroflex Colorado Springs
Original

HP83000

Abstract: Nitto 9850 20 (3) 0.1 SCC22900 >70 0.001/gate >100 15 (3) 0.1 TM1019 >200 >150 , ) 0.15 TM1019 MG2RTP >350 >350 0.001/gate >100 20 (3) 0.15 SCC22900 MG2RTP >>350 >>350 0.001/gate >100 15 (3) 0.15 TM1019 MG2RTP >>350 >>350 0.001/gate >100 15 (3) 0.15 SCC22900 TM1019 Note (3): A totally SEU free library is
Temic Semiconductors
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HP83000 Nitto 9850 0.7 um CMOS process parameters JEDEC20 G226 Nitto MP8000 BP70602

UT54ACS14E

Abstract: Aeroflex UT54 Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96524 = UT54ACS14E Total Dose: (Note 3 & 4) R = 1E5
Aeroflex Colorado Springs
Original

Aeroflex UT54

Abstract: TM1019 per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number
Aeroflex Colorado Springs
Original
UT54ACS132 1E6 MARKING UT54ACS132E
Abstract: Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Aeroflex Colorado Springs
Original
UT54ACS109E

TRANSISTOR B737

Abstract: MD80C31 irradiation. Testing time limits we in accordance ere with MIL-STD-883G, TM1019.7. B. SET Testing SET , ELDRS characterization method in MIL-STD883G, TM1019.7, section 3.13.1.1, the median parametric drift , -883. To qualify a part defined as having ELDRS for low dose rate environments, MIL-STD-883 TM1019 , -883 TM1019. To qualify the product at 100 krad(Si) for low dose rate environments, the part is tested at a
Temic Semiconductors
Original
TRANSISTOR B737 MD80C31 smd TRANSISTOR code marking 8K 67202FV PGA300 marking code RAD SMD Transistor npn TM2010 SCC9000

mil-std-883

Abstract: sec 719 ), released February 28, 2006 [13]. Also included in MIL-STD883G, TM1019.7 is a characterization technique to , space versions of the LM111 and LM119. The ELDRS characterization defined in MIL-STD-883G, TM1019 , WSMR to resume irradiation. Testing time limits were in accordance with MILSTD-883G, TM1019.7. IV , ) qualification as allowed by MIL-STD-883G, TM1019.7. For the HDR legs, electrical testing was completed within
Aeroflex RAD
Original
sec 719 focal plane array ion chamber jesd MilSTD-883 ESA/SCC22900

specification of ldr

Abstract: LDR SPECIFICATION Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019
National Semiconductor
Original
LM2941 LM2941WGRLQMLV 5962R9166702VYA LDR internal diagram LM2941 AN MIL-PRF38535
Abstract: Flatpack Class Designator: Q = QML Class Q V = QML Class V Device Type: 02 = TID per MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 TM1019 Condition A Drawing Number: 96595 = UT54ACTS541E Total Dose Aeroflex Colorado Springs
Original
UT54ACS165E
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