NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: MG1RT >50 >30 0.001 / gate >100 30 0.2 TM1019 CMOS Sea of Gate @ 5v 480 , 0.001 / gate >100 25 0.2 TM1019 CMOS Sea of Gate @ 3v 480 KCells / 90 MHz @ 0.3 uW , 67134E 67134E >50 >30 0.05 >100 7 0.15 TM1019 CMOS FIFO 16Kx9 / 20 ns @ 200 uA 67206E 67206E >50 >30 0.05 >100 7 0.15 TM1019 CMOS SRAM 1Mx1 / 35 ns @ 300 uA 65601E 65601E >50 >30 0.3 >100 3 0.3 TM1019 CMOS SRAM 128Kx8/ 35 ns @ 300 uA ... | Original |
2 pages, |
SCC22900 80C31E 80C32E 80C52E TSC-21020 TSC691E dsp radiation 8 bit uC cmos sram FIFO 512x9 65262E 4kx8 sram 65608E TM1019 DSP 6713 datasheet abstract |
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| Abstract: Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Latch-up 25°C Functional Parametric SEU LET Threshold Cross Section V CC Max Total Dose (TM1019.5) VCC Min /Bit Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m 2) (E.-6 cm2) 5V 128K x 8/30 ns 65608E 65608E 30 30 5 >80 , 5 Table 2. Processor Products Total Dose (TM1019.5) Functional Parametric Device Type ... | Original |
2 pages, |
Radiation Tolerant DSP processor AT60142 AT40KEL 67025E 65608E TM1019 CMOS OR Gates 65609E 67204H 67206H 672061H AT17LV0 10-10DP TM1019 abstract |
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| Abstract: Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Latch-up 25°C Functional Parametric SEU LET Threshold Cross Section VCC Max Total Dose (TM1019.5) VCC Min /Bit Device Type Format/Function/ Speed Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m2) (E.-6 cm2) CMOS SRAM 5V 128K x 8/30 ns , Total Dose (TM1019.5) VCC Min /Device Device Type Format/Function/Speed Part Number ... | Original |
3 pages, |
TM1019 atmel 022 AT60142F AT28C010-12DK AT17LV010 67025E AT697E 65608E 65609E AT60142F/ 67204H 67206H 672061H -10DP AT28C01012DK TM1019 abstract |
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| Abstract: Aerospace Products Radiation Test Result Summary Table 1. Memories, ASIC and FPGA Products Total Dose (TM1019.5) Functional Latch-up 25° C Cross Section VCC Max Parametric SEU LET Threshold VCC Min /Bit Device Type Format/Function/ Speed Part Number (Krads) (Krads) Typical ICCSB (mA) (MeV/mg/c m2) (MeV/mg/c m2) (E.-6 cm2) CMOS SRAM 5V 128K x 8/30 ns , Products Total Dose (TM1019.5) Functional Latch-up 25°C Cross Section VCC Max Parametric ... | Original |
3 pages, |
TM1019 ATMEL 350 atmel 022 AT60142F AT17LV010 67025E 4172G-AERO-06 65608E 65609E AT60142F/ 67204H 67206H 672061H -10DP TM1019 abstract |
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| Abstract: Method 1019 (rev. 7), released February 28, 2006 [5]. Also included in MIL-STD-883G MIL-STD-883G, TM1019.7 is a , characterization defined in MIL-STD-883G MIL-STD-883G, TM1019.7. Per the test method, the product is qualified to 100 krad(Si , outlined in MIL-STD-883 MIL-STD-883, TM1019 [5]. Testing under LDR conditions was not routine, due to the time ... | Original |
4 pages, |
TM1019 JMX046X24 LDR positive 5662-0050101QXA NSC LDR specification of ldr LDR Datasheet LDR resistor LDR SPECIFICATION sensitivity of ldr ldr 3 pin metal package LM136-2 LM136-2 abstract |
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| Abstract: ), released February 28, 2006 [13]. Also included in MIL-STD883G MIL-STD883G, TM1019.7 is a characterization technique to , space versions of the LM111 LM111 and LM119 LM119. The ELDRS characterization defined in MIL-STD-883G MIL-STD-883G, TM1019.7 , WSMR to resume irradiation. Testing time limits were in accordance with MILSTD-883G MILSTD-883G, TM1019.7. IV. , ) qualification as allowed by MIL-STD-883G MIL-STD-883G, TM1019.7. For the HDR legs, electrical testing was completed within ... | Original |
7 pages, |
TM1019 LM119 LM111 LM119xRLQMLV LM 3171 MILSTD-883G MIL-STD-883G sensitivity of ldr LM111 abstract |
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| Abstract: both functionality and parametric, when tested to TM1019 D No rebound effect after annealing D ... | Original |
1 pages, |
TM1019 datasheet abstract |
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| Abstract: per MIL-STD-883 MIL-STD-883 TM1019 Condition B 03 = TID per MIL-STD-883 MIL-STD-883 TM1019 Condition A Drawing Number ... | Original |
8 pages, |
UT54ACS132 TM1019 Aeroflex UT54 UT54ACS132E UT54ACS132E abstract |
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| Abstract: ]. Also included in MIL-STD-883G MIL-STD-883G, TM1019.7 is a characterization technique to determine if a product , version of the LM2941 LM2941 has been put through the ELDRS characterization defined in MIL-STD-883G MIL-STD-883G, TM1019.7. , done under HDR conditions, typically between 50 and 300 rad(Si)/s, as outlined in MIL-STD-883 MIL-STD-883, TM1019 ... | Original |
6 pages, |
TM1019 ceramic LDR LM2941 LM2941WGRLQMLV MIL-PRF38535 ldr resistor ETS500 5962R9166702VYA sensitivity of ldr specification of ldr LDR SPECIFICATION LM2941 abstract |
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| Abstract: Aerospace Products Radiation Test Result Summary Latch-up 25°C Functional Device Type Format/Function/Speed Parametric Part-number (Krads) (Krads) SEU LET Threshold Cross Section Vcc max. Total Dose (TM1019.5) Vcc min. /Bit Typical Iccsb (mA) (MeV/mg/cm2) (MeV/mg/cm2) (E.-6 cm2) 8-bit MCU ROMLESS/30 ROMLESS/30 MHz 80C32E 80C32E 30 30 15 >100 5 0.4 CMOS SRAM 5V 128Kx8/30ns 65608E 65608E 30 30 5 >100 2 0.2 CMOS SRAM 3.3V 128Kx8 ... | Original |
2 pages, |
TSC21020F TM1019 CMOS OR Gates 80C32E 67025E radiation tolerant DSP Atmel 4172A ROMLESS/30 TM1019 abstract |
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| Abstract: Comprehensive radiation effects test and support MIL-STD Radiation Effects Test Services n Total Ionizing Dose (TID) RLAT (50 to 300 rads/sec) MIL-STD-883 MIL-STD-883 TM 1019, Cond. A n TID ELDRS (10 to 100 mrads/sec) MIL-STD-883 MIL-STD-883 TM 1019, Cond. D, ESA/SCC22900 ESA/SCC22900 n Prompt dose MIL-STD-883 MIL-STD-883 TM 1020 and 1021 n Neutron SEE n Heavy Ion SEE (SEL, SEU and SET) EIA/JESD 57, ASTM F1 192 n Proton: Heavy Ion SEE n Cryogenic FPA testing (25 K) 1 MeV Neutron Gene ... | Original |
1 pages, |
mil-std-883 jesd ion chamber focal plane array MIL-STD-883 MIL-STD-883 abstract |
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| Abstract: MIL-STD Radiation Effects Test Services Device Screening and Element Evaluation Device Preparation for Single Event Effects Testing Quick-Turn Prototype IC Assembly Radiation T esting and Support Comprehensive radiation effects test and support Aeroflex RAD is the only facility in the country to be DSCC certified for radiation testing to both MIL-STD-750 MIL-STD-750 and MIL-STD-883 MIL-STD-883 and own and operate a full suite of radiation and electrical test equipment. Aeroflex RAD operates as an in ... | Original |
4 pages, |
cobalt-60 tic 719 RF 1022 E K 2056 transistor K 2056 IC 2025 MIL-STD-750 MIL-STD-883 MIL-STD-750 abstract |
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| Abstract | Saved from | Date Saved | File Size | Type | Download |
| Over 1.1 million files (1986-2013): html articles, reference designs, gerber files, chemical content, spice models, programs, code, pricing, images, circuits, parametric data, RoHS data, cross references, pcns, military data, and more. Please note that due to their age, these files do not always format correctly in modern browsers. Disclaimer. |
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| Applications Guidance: RH1499MW RH1499MW RH1499MW RH1499MW #447411.1 assembly lot / W19 wafer / W10737593 W10737593 W10737593 W10737593.1 fablot REF: ELDRS report #08-133, RLAT report #08-134, Radiation Assured Devices. Inc. Reference ELDRS and RLAT reports found NO doserate sensitivity per TM1019.7 definition, on samples taken from subject fablot, wafer, and assy lot. Both ELDRS and RLAT samples did, however, fail Output High at 1mA and 2.5mA sourcing load at the single-sided +3V supply condition [ but passed single-sided +5V supply and double www.datasheetarchive.com/download/74773210-347085ZC/rh1499mw radiation test data.zip (Advisory on RH1499 Fab Lot W10737593.1.pdf) |
Linear | 13/10/2009 | 4705.52 Kb | ZIP | rh1499mw radiation test data.zip |
| Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Ambient room temperature for TM 1019.7). Over the past 10 years a number of accelerating techniques have been examined . The latest requirement incorporated in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7 requires that devices that could to meet the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test at biasing conditions. These bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3 www.datasheetarchive.com/download/73894363-347079ZC/rh1034 radiation test data.zip (ELDRS Report_RH1034-1.2_Fabrication Lot WD003263.1.pdf) |
Linear | 10/02/2010 | 418.78 Kb | ZIP | rh1034 radiation test data.zip |
| Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Ambient room temperature for condition MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further performed to meet MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate Mapping of biasing conditions. These bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3 www.datasheetarchive.com/download/73894363-347079ZC/rh1034 radiation test data.zip (RLAT Report_RH1034-1.2_Fabrication Lot WD003263.1.pdf) |
Linear | 10/02/2010 | 418.78 Kb | ZIP | rh1034 radiation test data.zip |
| (Si)/s irradiation (Condition A in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7). Over the past 10 years a number of accelerating in spaceborne applications. The latest requirement incorporated in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7 requires ". While the recently released MIL-STD- 883 TM 1019.7 allows for accelerated testing, the requirements for on the limitations of accelerated testing and to meet the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019 lead-aluminum box. The lead-aluminum box is required under MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.4 that www.datasheetarchive.com/download/47406483-347088ZC/rh27_radiation_test_data.zip (RH27_ELDRS_Report_08-135_1p1.pdf) |
Linear | 03/02/2009 | 557.74 Kb | ZIP | rh27_radiation_test_data.zip |
| condition MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further performed to meet MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate Mapping of the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states "The required under MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container www.datasheetarchive.com/download/47406483-347088ZC/rh27_radiation_test_data.zip (RH27_RLAT_Report_08-136_1p2.pdf) |
Linear | 03/02/2009 | 557.74 Kb | ZIP | rh27_radiation_test_data.zip |
| been awarded Laboratory Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5 Irradiation and Test Temperature -300rad(Si)/s irradiation (Condition A in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7). Over the past 10 years a number of margin". While the recently released MIL-STD- 883 TM 1019.7 allows for accelerated testing, the on the limitations of accelerated testing and to meet the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019 opinion, these bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.9.3 Bias and www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (ELDRS Report_RH117H_Fabrication Lot# W10737632 1.pdf) |
Linear | 09/09/2010 | 667.74 Kb | ZIP | eldrs report_rh117h_fabrication lot# w10737632 1.zip |
| been awarded Laboratory Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5 Irradiation and Test Temperature -300rad(Si)/s irradiation (Condition A in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7). Over the past 10 years a number of margin". While the recently released MIL-STD- 883 TM 1019.7 allows for accelerated testing, the on the limitations of accelerated testing and to meet the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019 biasing conditions. These bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3 www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (ELDRS Report_RH1011W_Fabrication Run 10220414.1.pdf) |
Linear | 04/02/2010 | 1203.5 Kb | ZIP | rh1011_radiation_test_data.zip |
| 's dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019 radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described dosimetry for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate Mapping , these bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (RLAT Report_RH117H_Fabrication Lot# W10737632 1.pdf) |
Linear | 09/09/2010 | 667.74 Kb | ZIP | eldrs report_rh117h_fabrication lot# w10737632 1.zip |
| Laboratory Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Ambient room ensure a worst-case test condition MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as this report was performed to meet MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus Assured Devices dosimetry for TM1019 Condition A testing are available in RAD's report to DSCC entitled conditions. These bias circuits satisfy the requirements of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM1019.7 Section 3.9.3 Bias and www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (RLAT Report_RH1011W_Fabriacation Run 10220414.1.pdf) |
Linear | 04/02/2010 | 1203.5 Kb | ZIP | rh1011_radiation_test_data.zip |
| Suitability for MIL-STD-750 MIL-STD-750 MIL-STD-750 MIL-STD-750 TM 1019.5 Irradiation and Test Temperature: Room temperature for irradiation "conventional" room temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7). Over the incorporated in MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7 requires that devices that could potentially exhibit ELDRS "shall be a parameter delta design margin". While the recently released MIL-STD- 883 TM 1019.7 allows for of MIL-STD-883G MIL-STD-883G MIL-STD-883G MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test at 10mrad(Si)/s. 2 www.datasheetarchive.com/download/92811048-347086ZC/rh1573mj8_radiation_test_data.zip (RH1573MJ8 ELDRS Report 08-125 1p1.pdf) |
Linear | 10/09/2009 | 631.57 Kb | ZIP | rh1573mj8_radiation_test_data.zip |
| NTE Electronics Part | Industry Part |
| Part | Similar Part | Notes |
| TM1019 Buy | 09-308049 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | EA33X8352 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | ECG1019 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | HC1000503 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | HC1000603 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | HC100603 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | LD3120 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | SK7756 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | TCG1019 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |
| TM1019 Buy | WEP2136 Buy | This OCR data book cross reference data includes some internal part numbers. Please review the part datasheets for accuracy. |