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TA78L005 TA78L005AP TA78L006AP TA78L007AP TA78L075AP TA78L008AP TA78L009AP - Datasheet Archive
TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic , TA78L009AP,TA78L010AP,TA78L012AP,TA78L132AP
TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic , TA78L009AP TA78L009AP,TA78L010AP TA78L010AP,TA78L012AP TA78L012AP,TA78L132AP TA78L132AP TA78L015AP TA78L015AP,TA78L018AP TA78L018AP,TA78L020AP TA78L020AP,TA78L024AP TA78L024AP Three-Terminal Positive Regulators 5 V, 6 V, 7 V, 7.5 V, 8 V, 9 V, 10 V, 12 V, 13.2 V, 15 V, 18 V, 20 V, 24 V Features Suitable for TTL, C2MOS power supply. Internal short-circuit current limiting. Internal thermal overload protection. Maximum output current of 150 mA (Tj = 25°C). Available in the plastic TO-92MOD package. Pin Assignment Marking side 2 3 GND Weight: 0.36 g (Typ.) 1 OUT IN Equivalent Circuit 1 2001-08-08 Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit TA78L005AP TA78L005AP TA78L006AP TA78L006AP TA78L007AP TA78L007AP TA78L075AP TA78L075AP TA78L008AP TA78L008AP 35 TA78L009AP TA78L009AP Input voltage TA78L010AP TA78L010AP VIN V TA78L012AP TA78L012AP TA78L132AP TA78L132AP TA78L015AP TA78L015AP TA78L018AP TA78L018AP 40 TA78L020AP TA78L020AP TA78L024AP TA78L024AP Power dissipation PD 800 mW Operating temperature Topr -30~85 °C Storage temperature Tstg -55~150 °C Junction temperature Tj 150 °C Rth (j-a) 156 °C/W Thermal resistance (Ta = 25°C) 2 2001-08-08 TA78L005AP TA78L005AP Electrical Characteristics (Unless otherwise specified, VIN = 10 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 4.8 5.0 5.2 V 7.0 V VIN 20 V 55 150 8.0 V VIN 20 V 45 100 1.0 mA IOUT 100 mA 11 60 1.0 mA IOUT 40 mA 5.0 30 7.0 V VIN 20 V, Tj = 25°C 1.0 mA IOUT 40 mA 4.75 5.25 1.0 mA IOUT 70 mA Quiescent current Test Condition 4.75 5.25 Tj = 25°C 3.1 6.0 Tj = 125°C 5.5 8.0 V VIN 20 V 1.5 1.0 mA IOUT 40 mA 0.1 40 µVrms 12 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 8.0 V VIN 18 V, Tj = 25°C 41 49 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.6 mV/°C Long term stability Average temperature coefficient of output voltage 3 mA mA 2001-08-08 TA78L006AP TA78L006AP Electrical Characteristics (Unless otherwise specified, VIN = 11 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 5.76 6.0 6.24 V 8.1 V VIN 21 V 50 150 9.0 V VIN 21 V 45 110 1.0 mA IOUT 100 mA 12 70 1.0 mA IOUT 40 mA 5.5 35 8.1 V VIN 21 V, Tj = 25°C 1.0 mA IOUT 40 mA 5.7 6.3 1.0 mA IOUT 70 mA Quiescent current Test Condition 5.7 6.3 Tj = 25°C 3.1 6.0 Tj = 125°C 5.5 9.0 V VIN 20 V 1.5 1.0 mA IOUT 40 mA 0.1 40 µVrms 14 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 9.0 V VIN 19 V, Tj = 25°C 39 47 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.7 mV/°C Long term stability Average temperature coefficient of output voltage 4 mA mA 2001-08-08 TA78L007AP TA78L007AP Electrical Characteristics (Unless otherwise specified, VIN = 12 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 6.72 7.0 7.28 V 9.2 V VIN 22 V 50 160 10 V VIN 22 V 45 115 1.0 mA IOUT 100 mA 13 75 1.0 mA IOUT 40 mA 6.0 40 9.2 V VIN 22 V, Tj = 25°C 1.0 mA IOUT 40 mA 6.65 7.35 1.0 mA IOUT 70 mA Quiescent current Test Condition 6.65 7.35 Tj = 25°C 3.1 6.5 Tj = 125°C 6.0 10 V VIN 22 V 1.5 1.0 mA IOUT 40 mA 0.1 50 µVrms 17 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 10 V VIN 20 V, Tj = 25°C 37 46 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.75 mV/°C Long term stability Average temperature coefficient of output voltage 5 mA mA 2001-08-08 TA78L075AP TA78L075AP Electrical Characteristics (Unless otherwise specified, VIN = 13 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 7.21 7.5 7.79 V 9.8 V VIN 23 V 40 170 10.5 V VIN 23 V 40 120 1.0 mA IOUT 100 mA 14 80 1.0 mA IOUT 40 mA 6.5 40 9.8 V VIN 23 V, Tj = 25°C 1.0 mA IOUT 40 mA 7.125 7.875 1.0 mA IOUT 70 mA Quiescent current Test Condition 7.125 7.875 Tj = 25°C 3.1 6.5 Tj = 125°C 6.0 10.5 V VIN 23 V 1.5 1.0 mA IOUT 40 mA 0.1 60 µVrms 19 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 11 V VIN 21 V, Tj = 25°C 37 45 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.75 mV/°C Long term stability Average temperature coefficient of output voltage 6 mA mA 2001-08-08 TA78L008AP TA78L008AP Electrical Characteristics (Unless otherwise specified, VIN = 14 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 7.7 8.0 8.3 V 10.5 V VIN 23 V 20 175 11 V VIN 23 V 12 125 1.0 mA IOUT 100 mA 15 80 1.0 mA IOUT 40 mA 7.0 40 10.5 V VIN 23 V, Tj = 25°C 1.0 mA IOUT 40 mA 7.6 8.4 1.0 mA IOUT 70 mA Quiescent current Test Condition 7.6 8.4 Tj = 25°C 3.1 6.5 Tj = 125°C 6.0 11 V VIN 23 V 1.5 1.0 mA IOUT 40 mA 0.1 60 µVrms 20 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 12 V VIN 23 V, Tj = 25°C 37 45 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.8 mV/°C Long term stability Average temperature coefficient of output voltage 7 mA mA 2001-08-08 TA78L009AP TA78L009AP Electrical Characteristics (Unless otherwise specified, VIN = 15 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 8.64 9.0 9.36 V 11.4 V VIN 24 V 80 200 12 V VIN 24 V 20 160 1.0 mA IOUT 100 mA 17 90 1.0 mA IOUT 40 mA 8.0 45 11.4 V VIN 24 V, Tj = 25°C 1.0 mA IOUT 40 mA 8.55 9.45 1.0 mA IOUT 70 mA Quiescent current Test Condition 8.55 9.45 Tj = 25°C 3.2 6.5 Tj = 125°C 6.0 12 V VIN 24 V 1.5 1.0 mA IOUT 40 mA 0.1 65 µVrms 21 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 12 V VIN 24 V, Tj = 25°C 36 44 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.85 mV/°C Long term stability Average temperature coefficient of output voltage 8 mA mA 2001-08-08 TA78L010AP TA78L010AP Electrical Characteristics (Unless otherwise specified, VIN = 16 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 9.6 10 10.4 V 12.5 V VIN 25 V 80 230 13 V VIN 25 V 30 170 1.0 mA IOUT 100 mA 18 90 1.0 mA IOUT 40 mA 8.5 45 12.5 V VIN 25 V, Tj = 25°C 1.0 mA IOUT 40 mA 9.5 10.5 1.0 mA IOUT 70 mA Quiescent current Test Condition 9.5 10.5 Tj = 25°C 3.2 6.5 Tj = 125°C 6.0 13 V VIN 25 V 1.5 1.0 mA IOUT 40 mA 0.1 70 µVrms 22 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 13 V VIN 24 V, Tj = 25°C 36 43 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -0.9 mV/°C Long term stability Average temperature coefficient of output voltage 9 mA mA 2001-08-08 TA78L012AP TA78L012AP Electrical Characteristics (Unless otherwise specified, VIN = 19 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 11.5 12 12.5 V 14.5 V VIN 27 V 120 250 16 V VIN 27 V 100 200 1.0 mA IOUT 100 mA 20 100 1.0 mA IOUT 40 mA 10 50 14.5 V VIN 27 V, Tj = 25°C 1.0 mA IOUT 40 mA 11.4 12.6 1.0 mA IOUT 70 mA Quiescent current Test Condition 11.4 12.6 Tj = 25°C 3.2 6.5 Tj = 125°C 6.0 16 V VIN 27 V 1.5 1.0 mA IOUT 40 mA 0.1 80 µVrms 24 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 15 V VIN 25 V, Tj = 25°C 36 41 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -1.0 mV/°C Long term stability Average temperature coefficient of output voltage 10 mA mA 2001-08-08 TA78L132AP TA78L132AP Electrical Characteristics (Unless otherwise specified, VIN = 21 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 12.67 13.2 13.73 V 16 V VIN 28 V 125 270 17 V VIN 28 V 105 225 1.0 mA IOUT 100 mA 22 120 1.0 mA IOUT 40 mA 11 60 16 V VIN 28 V, Tj = 25°C 1.0 mA IOUT 40 mA 12.54 13.86 1.0 mA IOUT 70 mA Quiescent current Test Condition 12.54 13.86 Tj = 25°C 3.2 6.5 Tj = 125°C 6.0 17 V VIN 28 V 1.5 1.0 mA IOUT 40 mA 0.1 90 µVrms 28 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 17 V VIN 27 V, Tj = 25°C 34 41 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -1.2 mV/°C Long term stability Average temperature coefficient of output voltage 11 mA mA 2001-08-08 TA78L015AP TA78L015AP Electrical Characteristics (Unless otherwise specified, VIN = 23 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 14.4 15 15.6 V 17.5 V VIN 30 V 130 300 20 V VIN 30 V 110 250 1.0 mA IOUT 100 mA 25 150 1.0 mA IOUT 40 mA 12 75 17.5 V VIN 30 V, Tj = 25°C 1.0 mA IOUT 40 mA 14.25 15.75 1.0 mA IOUT 70 mA Quiescent current Test Condition 14.25 15.75 Tj = 25°C 3.3 6.5 Tj = 125°C 6.0 20 V VIN 30 V 1.5 1.0 mA IOUT 40 mA 0.1 90 µVrms 30 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 18.5 V VIN 28.5 V, Tj = 25°C 34 40 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -1.3 mV/°C Long term stability Average temperature coefficient of output voltage 12 mA mA 2001-08-08 TA78L018AP TA78L018AP Electrical Characteristics (Unless otherwise specified, VIN = 27 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 17.3 18 18.7 V 21.4 V VIN 33 V 32 325 22 V VIN 33 V 27 275 1.0 mA IOUT 100 mA 30 170 1.0 mA IOUT 40 mA 15 75 21.4 V VIN 33 V, Tj = 25°C 1.0 mA IOUT 40 mA 17.1 18.9 1.0 mA IOUT 70 mA Quiescent current Test Condition 17.1 18.9 Tj = 25°C 3.3 6.5 Tj = 125°C 6.0 22 V VIN 33 V 1.5 1.0 mA IOUT 40 mA 0.1 150 µVrms 45 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 23 V VIN 33 V, Tj = 25°C 32 38 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -1.5 mV/°C Long term stability Average temperature coefficient of output voltage 13 mA mA 2001-08-08 TA78L020AP TA78L020AP Electrical Characteristics (Unless otherwise specified, VIN = 29 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 19.2 20 20.8 V 23.5 V VIN 35 V 33 330 24 V VIN 35 V 28 285 1.0 mA IOUT 100 mA 33 180 1.0 mA IOUT 40 mA 17 90 23.5 V VIN 35 V, Tj = 25°C 1.0 mA IOUT 40 mA 19.0 21.0 1.0 mA IOUT 70 mA Quiescent current Test Condition 19.0 21.0 Tj = 25°C 3.3 6.5 Tj = 125°C 6.0 24 V VIN 35 V 1.5 1.0 mA IOUT 40 mA 0.1 170 µVrms 49 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 25 V VIN 35 V, Tj = 25°C 31 37 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -1.7 mV/°C Long term stability Average temperature coefficient of output voltage 14 mA mA 2001-08-08 TA78L024AP TA78L024AP Electrical Characteristics (Unless otherwise specified, VIN = 33 V, IOUT = 40 mA, CIN = 0.33 µF, COUT = 0.1 µF, 0°C Tj 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Min Typ. Max Unit 23 24 25 V 27.5 V VIN 38 V 35 350 28 V VIN 38 V 30 300 1.0 mA IOUT 100 mA 40 200 1.0 mA IOUT 40 mA 20 100 27.5 V VIN 38 V, Tj = 25°C 1.0 mA IOUT 40 mA 22.8 25.2 1.0 mA IOUT 70 mA Quiescent current Test Condition 22.8 25.2 Tj = 25°C 3.5 6.5 Tj = 125°C 6.0 28 V VIN 38 V 1.5 1.0 mA IOUT 40 mA 0.1 200 µVrms 56 mV/kh mV mV V IB 1 Quiescent current change IB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz f 100 kHz VOUT/t 1 Ripple rejection R.R. 3 f = 120 Hz, 29 V VIN 39 V, Tj = 25°C 31 35 dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA 1.7 V TCVO 1 IOUT = 5 mA -2.0 mV/°C Long term stability Average temperature coefficient of output voltage 15 mA mA 2001-08-08 Test Circuit 1/Standard Application Test Circuit 2 VNO Test Circuit 3 R.R. 16 2001-08-08 17 2001-08-08 18 2001-08-08 Precautions for Use If high voltage in excess of output voltage (typ. value) of IC is applied to its output terminal, IC may be destroyed. In this case, connect a Zener diode between the output terminal and GND to prevent application of excessive voltage. In particular, in such a current boosting circuit as shown in Application Circuit Example (2), if input voltage is suddenly applied by stages and furthermore, load is light, excessive voltage may be applied transiently to the output terminal of IC. In such a case as this, it may become necessary to increase capacity of output capacitor as appropriate, use a smaller R1 (a resistor for bypassing IC bias current) or gradually rise input voltage in addition to use of a Zener diode as mentioned above. Application Circuits (1) Standard Application (2) A. Current Boost Voltage Regulator B. Short-Circuit Protection (3) Current Regulator 19 2001-08-08 (4) Voltage Boost Regulator (5) Negative Regulator (6) Positive and Negative Regulator 20 2001-08-08 Package Dimensions 21 2001-08-08 RESTRICTIONS ON PRODUCT USE 000707EBA 000707EBA · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. · The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. · The products described in this document are subject to the foreign exchange and foreign trade laws. · The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. · The information contained herein is subject to change without notice. 22 2001-08-08