NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: Application Note VVC1/VVC2, CMOS VCXO Typical Phase Noise and Jitter Measurements Jitter Results Jitter measurements were performed on a Wavecrest SIA-3300C signal integrity analyzer. The measurements were recorded by testing the devices on an evaluation board with an AC coupled output. The evaluation board was connected to the SIA-3300C with an SMA bullet and 90k samples were taken. The values in the table represent typical values with Vc = Vdd/2. Period Jitter: Period jitter compares the length ... | Original |
6 pages, |
SIA-3300C E5052A SIA-3300C abstract |
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| Abstract: Application Note VCC4, CMOS XO Typical Phase Noise and Jitter Measurements Jitter Results Jitter measurements were performed on a Wavecrest SIA-3300C signal integrity analyzer. The measurements were recorded by testing the devices on an evaluation board with an AC coupled output. The evaluation board was connected to the SIA-3300C with an SMA bullet and 90k samples were taken. The values in the table represent typical values. Period Jitter: Period jitter compares the length of each cycle to the ... | Original |
7 pages, |
vectron xo E5052A VCC4-B3D-100M000 VCC4-B3D VCC4-B3D-66M000 SIA-3300C SIA-3300C abstract |
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| Abstract: measured using Wavecrest SIA3300C, 90K samples, see Application Note for Typical Phase Noise and Jitter , Jitter measured using Wavecrest SIA3300C, 90K samples, see Application Note for Typical Phase Noise and , Wavecrest SIA3300C, 90K samples, see Application Note for Typical Phase Noise and Jitter Performance. The , Wavecrest SIA3300C, 90K samples, see Application Note for Typical Phase Noise and Jitter Performance. The ... | Original |
8 pages, |
vectron xo SIA3300C 125M00 VC-801 transistor TD-100 le VC-801 abstract |
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| Abstract: SIA3300C, 90K samples, see Application Note for Typical Phase Noise and Jitter Performance. The Output is , measured as On Time/Period (Fig 2). Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples , measured as On Time/Period (Fig 2). Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples , measured as On Time/Period (Fig 2). Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples ... | Original |
8 pages, |
VC-801 VC-801 abstract |
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| Abstract: Application Note VS-705 VS-705, 3.3 Volt, LVPECL VCSO Typical Phase Noise and Jitter Measurements Jitter Results Jitter measurements were performed on a Wavecrest SIA-3300C signal integrity analyzer. The measurements were recorded by testing the devices on an evaluation board with an AC coupled output. The evaluation board was connected to the SIA-3300C with an SMA bullet and 90k samples were taken. The values in the table represent typical values. Period Jitter: Period jitter compares the ... | Original |
7 pages, |
e5052 VS-705 SIA-3300C E5052 VS-705 abstract |
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| Abstract: Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples. The Output is Enabled if the Enable , as On Time/Period (Fig 2). Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples. , measured using Wavecrest SIA3300C, 90K samples. The Output is Enabled if the Enable/Disable is left open. ... | Original |
7 pages, |
crystal quartz 29.4912 125M0000 VC-820 VC-820 abstract |
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| Abstract: using Wavecrest SIA3300C, 90K samples. The Output is Enabled if the Enable/Disable is left open. , measured using Wavecrest SIA3300C, 90K samples. The Output is Enabled if the Enable/Disable is left open. , , see Fig 2. Broadband Period Jitter measured using Wavecrest SIA3300C, 90K samples. The Output is ... | Original |
7 pages, |
VC-820 VC-820 abstract |
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| Abstract: E5052 E5052. 6. Measured using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if the Enable , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. ... | Original |
8 pages, |
E5052 VM-702 VM-702 abstract |
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| Abstract: E5052 E5052. 6. Measured using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if the Enable , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. ... | Original |
8 pages, |
vm802 E5052 ir dependent resistor VM-802 VM-802 abstract |
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| Abstract: E5052 E5052. 6. Measured using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if the Enable , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. , using a Wavecrest SIA3300C, 90K samples. 7. Outputs will be Enabled if Enable/Disable is left open. ... | Original |
8 pages, |
E5052 VM-822 VM-822 abstract |
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