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Part : SH1027RV351816SDV Supplier : Smart Cable Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : SH1027RV351816SE Supplier : Smart Cable Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : SH1027RV351816SEV Supplier : Smart Cable Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : SH5127RV351816HD Supplier : Smart Cable Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : NSYTRV352 Supplier : Schneider Electric Manufacturer : Newark element14 Stock : - Best Price : $7.17 Price Each : $11.12
Part : NSYTRV352PE Supplier : Schneider Electric Manufacturer : Newark element14 Stock : - Best Price : $11.90 Price Each : $19.08
Part : RV-35V221MH10-R Supplier : ELNA Manufacturer : Bristol Electronics Stock : 2,000 Best Price : $0.1950 Price Each : $0.75
Part : RV-35V221MH10Z1-R Supplier : ELNA Manufacturer : Bristol Electronics Stock : 850 Best Price : $0.2160 Price Each : $0.6750
Part : RV-35V101MG10-R Supplier : Lelon Manufacturer : Chip One Exchange Stock : 170 Best Price : - Price Each : -
Part : SRV351320 Supplier : - Manufacturer : Chip One Exchange Stock : 20 Best Price : - Price Each : -
Shipping cost not included. Currency conversions are estimated. 

RV-3-5-52/733

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: Active area: 10 |am around metallization pattern. 76.1 mm (3 inches) Crystal pitch to U RV-3-5-52/733 Fig.1 X3A-BFQ268 crystal. LIMITING VALUES In accordance with the Absolute Maximum System -
OCR Scan
BFQ262 BFQ265 BFQ268 RV-3-5-52/733

BFQ34

Abstract: crystal PHILIPS Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In accordance with the
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OCR Scan
BFQ34T BFQ34 BFG35 X3A-BFQ34 crystal PHILIPS SOT172

IEC-134

Abstract: BFR540 wafer 30 000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In
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OCR Scan
BFR540 BFG540 BFG541 X3A-BFR540 IEC134 IEC-134 transistor d 1264

BFG520

Abstract: X3A-BFR520 devices inked out Visual Inspection to U RV-3-5-52/733 LIMITING VALUES In accordance with the Absolute
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OCR Scan
X3A-BFR520 BFR520 BFG520 BFP520 SOT173 SOT-173

BFR91A

Abstract: BFQ22S wafer 20 000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In
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OCR Scan
BFR91A BFQ22S BFR93A X3A-BFR91A BFR91 BFR91 transistor

BFQ262

Abstract: SOT128 wafer 8000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In
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OCR Scan
SOT128 S3T31

BFQ262

Abstract: BFQ265 wafer 8000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In
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OCR Scan

BFR96S

Abstract: BFQ63 inspection to U RV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134).
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OCR Scan
BFR96S BFQ63 BFR106 X3A-BFR96 transistor bfr96 BFR96 35331

SOT173

Abstract: BFG505 devices inked out Visual Inspection to U RV-3-5-52/733 LIMITING VALUES In accordance with the Absolute
-
OCR Scan
BFR505 BFG505 BFP505 X3A-BFR505

BFT92

Abstract: BFQ52 wafer 20 000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES In
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OCR Scan
BFQ51 BFQ52 BFT92 X3A-BFT92

BFY90 PHILIPS

Abstract: BFW92 sot23 000 Faulty devices inked out Visual inspection to U RV-3-5-52/733 LIMITING VALUES in accordance
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OCR Scan
BFW92 BFY90 BFS17 X3A-BFW92 BFY90 PHILIPS BFW92 sot23 philips bfw92
Abstract: to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134). -
OCR Scan
S3R31 X3A-BFR90A BFR90A BFQ53 BFR92A URV-3-5-52/733

BFR134

Abstract: BFG134 Average number of good elements per wafer 5000 Faulty devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134). SYMBOL PARAMETER
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OCR Scan
X3A-BFG134 BFR134 BFQ135 BFG135 BFG134 0D32S0B

crystal PHILIPS

Abstract: BFR90A Faulty devices inked out Visual inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the
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OCR Scan
UBB41S

BFR134

Abstract: BFG134 inspection to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum System (IEC 134).
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OCR Scan
bfg135sot223 SOT37
Abstract: inches) Crystal pitch to URV-3-5-52/733 LIMITING VALUES In accordance with the Absolute Maximum -
OCR Scan
0Q322D X3A-BFQ195 BFG195 BFG197 BFG198

BFQ34

Abstract: BFQ34T number of good elements per wafer 10 000 Faulty devices inked out Visual inspection to URV-3-5-52/733
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OCR Scan
32SD5
Abstract: 20 000 Faulty devices inked out Visual inspection to URV-3-5-52/733 Active area: 10 pm -
OCR Scan
X3A-BFT93 BFQ23 BFQ24 BFT93

BFY90 PHILIPS

Abstract: good elements per wafer 25 000 Faulty devices inked out Visual inspection to URV-3-5-52/733 Fig.1 X3A-BFW92 crystal. LIMITING VALUES In accordance with the Absolute Maximum System
-
OCR Scan
Abstract: out Visual inspection Active area: 10 pm around metallization pattern. to URV-3-5-52/733 -
OCR Scan
X3A-BFQ33 BFQ33C BFG33
Showing first 20 results.